{"total_count":2,"results":[{"id":124417,"original_title":"Beam Injection Assessment of Microstructures in Semiconductors: Biams 2000","title_alternative":"","title_transcription":"","title_alternative_transcription":"","pub_date":"2000-01-01","statement_of_responsibility":"edited by Hajime Tomokage,Takashi Sekiguchi","creators":[{"full_name":"Hajime,Tomokage"},{"full_name":"Takashi,Sekiguchi."}],"contributors":[],"publishers":[],"publication_place":null,"extent":"ⅷ,441 p. ; 24 cm","dimensions":null,"identifiers":[{"identifier_type":"isbn","body":"9783908450610"}],"subjects":[],"classfifications":[{"classification_type":"udc","term":"621.38"}],"access_address":null,"items":[{"item_identifier":"602155","shelf":"単行書22"}],"created_at":"2021-03-09T15:06:29.942+09:00","updated_at":"2025-12-15T09:44:14.934+09:00"},{"id":39567,"original_title":"Beam Injection Assessment of Microstructures in Semiconductors BIAMS 2000: Proceedings of the 6th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors held in Fukuoka, Japan, November 12-16, 2000  Vols. 78-79","title_alternative":null,"title_transcription":"  ","title_alternative_transcription":null,"pub_date":"2001-01-01","statement_of_responsibility":null,"creators":[{"full_name":"Editors: Hajime Tomokage, Takashi Sekiguchi"}],"contributors":[],"publishers":[{"full_name":"Scitec Publications Ltd"}],"publication_place":null,"extent":"441p; 25cm","dimensions":null,"identifiers":[{"identifier_type":"isbn","body":"9783908450610"},{"identifier_type":"issn","body":"10120394"}],"subjects":[],"classfifications":[{"classification_type":"udc","term":"548.526"}],"access_address":null,"items":[{"item_identifier":"218799","shelf":"集密書庫8"}],"created_at":"2001-06-06T23:11:26.000+09:00","updated_at":"2025-12-15T09:52:45.657+09:00"}]}