{"total_count":59,"results":[{"id":36763,"original_title":"Diffusion and Defect Data Pt． A ； Defect and Diffusion Forum Vol．103-105 ： Defects in Semiconductors 1 NCDS -1 Proceedings of The 1st National Conference on Defects in Semiconductors， held in St． Petersburg， Russia， April 26-30，1992  Vol．103-105","title_alternative":null,"title_transcription":"  ","title_alternative_transcription":null,"pub_date":"1993-01-01","statement_of_responsibility":null,"creators":[{"full_name":"Nickolay T． Bagraev [editor]"}],"contributors":[],"publishers":[{"full_name":"Scitec Publications"}],"publication_place":null,"extent":null,"dimensions":null,"identifiers":[{"identifier_type":"isbn","body":"9780878496662"}],"subjects":[],"classfifications":[{"classification_type":"udc","term":"548.526"}],"access_address":null,"items":[{"item_identifier":"213170","shelf":"集密書庫8"}],"created_at":"1999-05-19T08:48:17.000+09:00","updated_at":"2025-12-15T09:52:32.878+09:00"},{"id":36764,"original_title":"Dx centers-donors in AlGaAs and related compounds","title_alternative":null,"title_transcription":"  ","title_alternative_transcription":null,"pub_date":"1994","statement_of_responsibility":"edited by Elias Muñoz Merino","creators":[{"full_name":"Merino, Elias Muñoz"}],"contributors":[],"publishers":[{"full_name":"Scitec Publications"}],"publication_place":null,"extent":"178 p. ; 25 cm","dimensions":null,"identifiers":[{"identifier_type":"isbn","body":"9783908450030"}],"subjects":[],"classfifications":[{"classification_type":"udc","term":"548.526"}],"access_address":null,"items":[{"item_identifier":"213172","shelf":"集密書庫8"}],"created_at":"1999-05-19T08:48:17.000+09:00","updated_at":"2025-12-15T09:52:32.467+09:00"},{"id":38208,"original_title":"Contemporary Studies in Condensed Matter Physics : Proceedings of The Symposium on Condensed Matter Physics ( SFKM'97 ), Kladovo, Yugoslavia, 29 Sept.-1 Oct. 1997  Vol.61-62","title_alternative":null,"title_transcription":"  ","title_alternative_transcription":null,"pub_date":"1998-01-01","statement_of_responsibility":null,"creators":[{"full_name":"editors, Milorad Davidovic, Zoran Ikonic"}],"contributors":[],"publishers":[{"full_name":"Scitec Publications"}],"publication_place":null,"extent":"370p; 25cm","dimensions":null,"identifiers":[{"identifier_type":"isbn","body":"9783908450344"}],"subjects":[],"classfifications":[{"classification_type":"udc","term":"548.526"}],"access_address":null,"items":[{"item_identifier":"217873","shelf":"集密書庫8"}],"created_at":"1999-05-18T20:12:00.000+09:00","updated_at":"2025-12-15T09:52:44.387+09:00"},{"id":37602,"original_title":"Gettering and deffect engineering in semiconductor technology : GADEST '93 : proceedings of the 5th International Autumn Meeting held in Chossewitz, near Frankfurt(Oder), Germany, October 09-14, 1993","title_alternative":null,"title_transcription":"Diffusion \u0026 Defect Data pt.B 32-33  ","title_alternative_transcription":null,"pub_date":"1993","statement_of_responsibility":"editors, H.G. Grimmeiss, M. Kittler and H. Richter","creators":[{"full_name":"International Autumn Meeting, Gettering and Defect Engineering in Semiconductor Technology"},{"full_name":"Grimmeiss, H. G."},{"full_name":"Kittler, M."},{"full_name":"Richter, H."}],"contributors":[],"publishers":[{"full_name":"SciTec Publications"}],"publication_place":null,"extent":"xvii, 630 p. ; 25 cm","dimensions":null,"identifiers":[],"subjects":[],"classfifications":[{"classification_type":"udc","term":"548.526"}],"access_address":null,"items":[{"item_identifier":"216431","shelf":"集密書庫8"}],"created_at":"1901-12-31T09:00:00.000+09:00","updated_at":"2025-12-15T09:52:43.887+09:00"},{"id":37605,"original_title":"Diffusion and Defect Data Pt.A Defect and Diffusion Forum Vol.152  Vol.152 with Annual Index","title_alternative":null,"title_transcription":"  ","title_alternative_transcription":null,"pub_date":null,"statement_of_responsibility":null,"creators":[],"contributors":[],"publishers":[{"full_name":"Scitec Publications"}],"publication_place":null,"extent":"264p; 25cm","dimensions":null,"identifiers":[],"subjects":[],"classfifications":[{"classification_type":"udc","term":"548.526"}],"access_address":null,"items":[{"item_identifier":"217593","shelf":"集密書庫8"}],"created_at":"1901-12-31T09:00:00.000+09:00","updated_at":"2025-12-15T09:52:36.462+09:00"},{"id":39531,"original_title":"Beam injection assessment of defects in semiconductors : proceedings of the 5th workshop on beam injection assessment of defects in semiconductors held in Parkhotel Schloss Wulkow near Berlin, Germany, August 30-September 3, 1998","title_alternative":null,"title_transcription":"  ","title_alternative_transcription":null,"pub_date":"1998","statement_of_responsibility":"editors. M. Kittler, O. Breitenstein, A. Endros and W. Schroter","creators":[{"full_name":"Kittler, M."},{"full_name":"Breitenstein, O."}],"contributors":[],"publishers":[{"full_name":"Scitec Publications Ltd."}],"publication_place":null,"extent":"xiv, 537 p. ; 25 cm","dimensions":null,"identifiers":[{"identifier_type":"isbn","body":"9783908450399"},{"identifier_type":"issn","body":"10120394"}],"subjects":[],"classfifications":[{"classification_type":"udc","term":"548.526"}],"access_address":null,"items":[{"item_identifier":"217984","shelf":"集密書庫8"}],"created_at":"1901-12-31T09:00:00.000+09:00","updated_at":"2025-12-15T09:52:44.699+09:00"},{"id":37783,"original_title":"Diffusion and Defect Data Part A Defect and Diffusion Foum Vol. 109-110  Vol．109-110","title_alternative":null,"title_transcription":"  ","title_alternative_transcription":null,"pub_date":null,"statement_of_responsibility":null,"creators":[{"full_name":"Scitec Publications"}],"contributors":[],"publishers":[{"full_name":"Scitec Publications"}],"publication_place":null,"extent":"315p; 25cm","dimensions":null,"identifiers":[],"subjects":[],"classfifications":[{"classification_type":"udc","term":"548.526"}],"access_address":null,"items":[{"item_identifier":"213173","shelf":"集密書庫8"}],"created_at":"1901-01-01T09:00:00.000+09:00","updated_at":"2025-12-15T09:52:33.419+09:00"},{"id":37784,"original_title":"Diffusion and Defect Data Pt. A ： Defect and Diffusion forum Vol.106-107  Vol．106-107","title_alternative":null,"title_transcription":"  ","title_alternative_transcription":null,"pub_date":null,"statement_of_responsibility":null,"creators":[{"full_name":"Scitec Publications"}],"contributors":[],"publishers":[{"full_name":"Scitec Publications"}],"publication_place":null,"extent":"305p; 25cm","dimensions":null,"identifiers":[],"subjects":[],"classfifications":[{"classification_type":"udc","term":"548.526"}],"access_address":null,"items":[{"item_identifier":"213171","shelf":"集密書庫8"}],"created_at":"1901-01-01T09:00:00.000+09:00","updated_at":"2025-12-15T09:52:33.525+09:00"},{"id":37785,"original_title":"Diffusion and Defect Data Part A Defect and Diffusion Forum Vol.101-102  Vol.101-102","title_alternative":null,"title_transcription":"  ","title_alternative_transcription":null,"pub_date":null,"statement_of_responsibility":null,"creators":[{"full_name":"Scitec Publications"}],"contributors":[],"publishers":[{"full_name":"Scitec Publications"}],"publication_place":null,"extent":"311p; 25cm","dimensions":null,"identifiers":[],"subjects":[],"classfifications":[{"classification_type":"udc","term":"548.526"}],"access_address":null,"items":[{"item_identifier":"213169","shelf":"集密書庫8"}],"created_at":"1901-01-01T09:00:00.000+09:00","updated_at":"2025-12-15T09:52:31.738+09:00"},{"id":38140,"original_title":"Diffusion and Defect Data Pt.A Defect and Diffusion Forum Vol.150-151  Vol.150-151","title_alternative":null,"title_transcription":"  ","title_alternative_transcription":null,"pub_date":null,"statement_of_responsibility":null,"creators":[{"full_name":"J. Cibert [et al. editors]"}],"contributors":[],"publishers":[{"full_name":"Scitec Publications"}],"publication_place":null,"extent":"358p; 25cm","dimensions":null,"identifiers":[],"subjects":[],"classfifications":[{"classification_type":"udc","term":"548.526"}],"access_address":null,"items":[{"item_identifier":"217536","shelf":"集密書庫8"}],"created_at":"1901-01-01T09:00:00.000+09:00","updated_at":"2025-12-15T09:52:34.860+09:00"}]}