{"total_count":935,"results":[{"id":36891,"original_title":"Diffushion and Defect Data Pt.B Vol.17-18","title_alternative":null,"title_transcription":"Diffushion and Defect Data Pt.B Vol.17-18","title_alternative_transcription":null,"pub_date":"1991-01-01","statement_of_responsibility":null,"creators":[{"full_name":"K.Sangwal"}],"contributors":[],"publishers":[{"full_name":"Sci-Tech Publications"}],"publication_place":null,"extent":"405p; 25cm","dimensions":null,"identifiers":[],"subjects":[],"classfifications":[{"classification_type":"udc","term":"548.526"}],"access_address":null,"items":[{"item_identifier":"215792","shelf":"Journal Archives 8"}],"created_at":"1999-05-19T08:49:47.000+09:00","updated_at":"2025-12-15T09:52:43.596+09:00"},{"id":36889,"original_title":"Diffushion and Defect Data Solid State Data Pt.B Vol.13-14","title_alternative":null,"title_transcription":"Diffushion and Defect Data Solid State Data Pt.B Vol.13-14","title_alternative_transcription":null,"pub_date":"1990-01-01","statement_of_responsibility":null,"creators":[{"full_name":"Jan.Przyluski"}],"contributors":[],"publishers":[{"full_name":"Sci-Tech Publications"}],"publication_place":null,"extent":"388p; 24cm","dimensions":null,"identifiers":[],"subjects":[],"classfifications":[{"classification_type":"udc","term":"548.526"}],"access_address":null,"items":[{"item_identifier":"215790","shelf":"Journal Archives 8"}],"created_at":"1999-05-19T08:49:45.000+09:00","updated_at":"2025-12-15T09:52:40.335+09:00"},{"id":36884,"original_title":"Non linear phenomena in materials science","title_alternative":null,"title_transcription":"Diffusion and Defect Date B Vol.3-4  ","title_alternative_transcription":null,"pub_date":"1988","statement_of_responsibility":"editors, L.P. Kubin, G. Martin","creators":[{"full_name":"International C.N.R.S. Meeting"},{"full_name":"Kubin, L."},{"full_name":"Martin, G."}],"contributors":[],"publishers":[{"full_name":"Sci-Tech Publications"}],"publication_place":null,"extent":"1 v. ; 25 cm","dimensions":null,"identifiers":[],"subjects":[],"classfifications":[{"classification_type":"udc","term":"548.526"}],"access_address":null,"items":[{"item_identifier":"215786","shelf":"Journal Archives 8"}],"created_at":"1999-05-19T08:49:42.000+09:00","updated_at":"2025-12-15T09:52:40.539+09:00"},{"id":36885,"original_title":"Ion implantation in semiconductors","title_alternative":"Solid state phenomena","title_transcription":"Diffusion and Defect Date B Vol.1-2  ","title_alternative_transcription":null,"pub_date":"1988","statement_of_responsibility":"D. Stievenard, J.C. Bourgoin","creators":[{"full_name":"Stievenard, D."},{"full_name":"Bourgoin, J. C."}],"contributors":[],"publishers":[{"full_name":"Sci-Tech Publications"}],"publication_place":null,"extent":"v, 473 p. ; 25 cm","dimensions":null,"identifiers":[],"subjects":[],"classfifications":[{"classification_type":"udc","term":"548.526"}],"access_address":null,"items":[{"item_identifier":"215787","shelf":"Journal Archives 8"}],"created_at":"1999-05-19T08:49:42.000+09:00","updated_at":"2025-12-15T09:52:40.434+09:00"},{"id":36872,"original_title":"The application of electron microscopy to materials science : proceedings of an International Workshop, held in China, Gauonzhou, August 1988","title_alternative":"Solid state phenomena","title_transcription":"Diffushion and Defect Data B Vol.5  ","title_alternative_transcription":null,"pub_date":"1989","statement_of_responsibility":"editor, K.H. Kuo ; sponsored by The Chinese Academy of Sciences, The International Centre for Theoretical Physics(Trieste)","creators":[{"full_name":"Kuo, K. H."}],"contributors":[],"publishers":[{"full_name":"Trans tech Publications"},{"full_name":"Sci-Tech Publications"}],"publication_place":null,"extent":"209 p. ; 25 cm","dimensions":null,"identifiers":[],"subjects":[],"classfifications":[{"classification_type":"udc","term":"548.526"}],"access_address":null,"items":[{"item_identifier":"215785","shelf":"Journal Archives 8"}],"created_at":"1999-05-19T08:49:30.000+09:00","updated_at":"2025-12-15T09:52:40.872+09:00"},{"id":36870,"original_title":"Gettering and deffect engineering in the semiconductor technology : GADEST '89 : proceedings of the 3rd International Autumn Meeting held in Garzau, German Democratic Republic, October 8-13, 1989","title_alternative":null,"title_transcription":"Diffushion and Defect Data Solid State Date B Vol.6 \u0026 7  ","title_alternative_transcription":null,"pub_date":"1989","statement_of_responsibility":"edited by M. Kittler","creators":[{"full_name":"International Autumn Meeting, Gettering and Defect Engineering in Semiconductor Technology"},{"full_name":"Kittler, M."}],"contributors":[],"publishers":[{"full_name":"Sci-Tech Publications"}],"publication_place":null,"extent":"xi, 607 p. ; 25 cm","dimensions":null,"identifiers":[],"subjects":[],"classfifications":[{"classification_type":"udc","term":"548.526"}],"access_address":null,"items":[{"item_identifier":"215783","shelf":"Journal Archives 8"}],"created_at":"1999-05-19T08:49:27.000+09:00","updated_at":"2025-12-15T09:52:40.643+09:00"},{"id":36824,"original_title":"Diffusion and Defect Data Pt．A Vol．113-114","title_alternative":null,"title_transcription":"Diffusion and Defect Data Pt．A Vol．113-114","title_alternative_transcription":null,"pub_date":"1994-01-01","statement_of_responsibility":null,"creators":[],"contributors":[],"publishers":[{"full_name":"Scitec Publications Ltd"}],"publication_place":null,"extent":"301p; 24cm","dimensions":null,"identifiers":[],"subjects":[],"classfifications":[{"classification_type":"udc","term":"548.526"}],"access_address":null,"items":[{"item_identifier":"213215","shelf":"Journal Archives 8"}],"created_at":"1999-05-19T08:49:18.000+09:00","updated_at":"2025-12-15T09:52:32.571+09:00"},{"id":36823,"original_title":"Diffusion and Defect Data Pt．A Vol．111-112","title_alternative":null,"title_transcription":"Diffusion and Defect Data Pt．A Vol．111-112","title_alternative_transcription":null,"pub_date":"1994-01-01","statement_of_responsibility":null,"creators":[],"contributors":[],"publishers":[{"full_name":"Scitec Publications Ltd"}],"publication_place":null,"extent":"347p; 24cm","dimensions":null,"identifiers":[],"subjects":[],"classfifications":[{"classification_type":"udc","term":"548.526"}],"access_address":null,"items":[{"item_identifier":"213214","shelf":"Journal Archives 8"}],"created_at":"1999-05-19T08:49:16.000+09:00","updated_at":"2025-12-15T09:52:33.082+09:00"},{"id":36818,"original_title":"Effects of radiation on substructure and mechanical properties of metals and alloys : a symposium presented at the seventy-fifth annual meeting, American Society for Testing and Materials","title_alternative":null,"title_transcription":"  ","title_alternative_transcription":null,"pub_date":"1973","statement_of_responsibility":null,"creators":[{"full_name":"Symposium on Effects of Radiation on Substructure and Mechanical Properties of Metals and Alloys"},{"full_name":"ASTM Committee E-10 on Radioisotopes and Radiation Effects"}],"contributors":[],"publishers":[{"full_name":"American Society for Testing and Materials"}],"publication_place":null,"extent":"544 p. ; 24 cm","dimensions":null,"identifiers":[],"subjects":[],"classfifications":[{"classification_type":"udc","term":"STP"}],"access_address":null,"items":[{"item_identifier":"215760","shelf":"Stack 12"}],"created_at":"1999-05-19T08:49:12.000+09:00","updated_at":"2025-12-23T15:15:00.335+09:00"},{"id":36814,"original_title":"Diffusion and Defect Date Vol.23 Nonmetals","title_alternative":null,"title_transcription":"Diffusion and Defect Date Vol.23 Nonmetals","title_alternative_transcription":null,"pub_date":"1980-01-01","statement_of_responsibility":null,"creators":[],"contributors":[],"publishers":[{"full_name":"Publications"}],"publication_place":null,"extent":"236p; 25cm","dimensions":null,"identifiers":[],"subjects":[],"classfifications":[{"classification_type":"udc","term":"548.526"}],"access_address":null,"items":[{"item_identifier":"215748","shelf":"Journal Archives 8"}],"created_at":"1999-05-19T08:49:10.000+09:00","updated_at":"2025-12-15T09:52:27.471+09:00"}]}