{"total_count":101,"results":[{"id":37551,"original_title":"Handbook on the physics and chemistry of rare earths","title_alternative":null,"title_transcription":"  ","title_alternative_transcription":null,"pub_date":"1997","statement_of_responsibility":"editors, Karl A. Gschneidner, Jr., LeRoy Eyring","creators":[{"full_name":"Gschneidner, Karl A."},{"full_name":"Eyring, LeRoy"}],"contributors":[],"publishers":[{"full_name":"North-Holland"},{"full_name":"Sole distributors for the USA and Canada, Elsevier Science"}],"publication_place":null,"extent":"1 v. ; 24-25 cm","dimensions":null,"identifiers":[{"identifier_type":"isbn","body":"9780444826077"}],"subjects":[],"classfifications":[{"classification_type":"udc","term":"546.65"}],"access_address":null,"items":[{"item_identifier":"217514","shelf":"Stack 6"}],"created_at":"1999-05-19T08:59:49.000+09:00","updated_at":"2025-12-23T15:17:11.212+09:00"},{"id":72285,"original_title":"Advances in X-ray analysis","title_alternative":null,"title_transcription":"  ","title_alternative_transcription":null,"pub_date":"1994","statement_of_responsibility":"edited by John V. Gilfrich ... [et al.] ; sponsored by University of Denver Department of Engineering and International Centre for Diffraction Data","creators":[{"full_name":"Conference on Application of X-ray Analysis"},{"full_name":"Denver Research Institute"},{"full_name":"JCPDS-International Centre for Diffraction Data"},{"full_name":"Gilfrich, John V."}],"contributors":[],"publishers":[{"full_name":"Plenum"}],"publication_place":null,"extent":"1 v. ; 26 cm","dimensions":null,"identifiers":[{"identifier_type":"isbn","body":"9780306449017"}],"subjects":[],"classfifications":[{"classification_type":"udc","term":"539"}],"access_address":null,"items":[{"item_identifier":"216891","shelf":"Books 10"}],"created_at":"1999-05-19T08:58:27.000+09:00","updated_at":"2025-12-15T09:31:18.308+09:00"},{"id":72286,"original_title":"Advances in X-ray analysis","title_alternative":null,"title_transcription":"  ","title_alternative_transcription":null,"pub_date":"1993","statement_of_responsibility":"edited by John V. Gilfrich ... [et al.] ; sponsored by University of Denver Department of Engineering and International Centre for Diffraction Data","creators":[{"full_name":"Conference on Application of X-ray Analysis"},{"full_name":"Denver Research Institute"},{"full_name":"JCPDS-International Centre for Diffraction Data"},{"full_name":"Gilfrich, John V."}],"contributors":[],"publishers":[{"full_name":"Plenum"}],"publication_place":null,"extent":"1 v. ; 26 cm","dimensions":null,"identifiers":[{"identifier_type":"isbn","body":"9780306445712"}],"subjects":[],"classfifications":[{"classification_type":"udc","term":"539"}],"access_address":null,"items":[{"item_identifier":"216890","shelf":"Books 10"}],"created_at":"1999-05-19T08:58:26.000+09:00","updated_at":"2025-12-15T09:31:17.690+09:00"},{"id":72293,"original_title":"Advances in X-ray analysis","title_alternative":null,"title_transcription":"  ","title_alternative_transcription":null,"pub_date":"1992","statement_of_responsibility":"edited by Charles S. Barrett ...[et al.] ; sponsored by University of Denver Department of Engineering and JCPDS-International Centre for Diffraction Data","creators":[{"full_name":"Conference on Application of X-ray Analysis"},{"full_name":"Denver Research Institute"},{"full_name":"JCPDS-International Centre for Diffraction Data"},{"full_name":"Barrett, C. S. (Charles Sanborn)"}],"contributors":[],"publishers":[{"full_name":"Plenum"}],"publication_place":null,"extent":"1 v. ; 26 cm","dimensions":null,"identifiers":[{"identifier_type":"isbn","body":"9780306442490"}],"subjects":[],"classfifications":[{"classification_type":"udc","term":"539"}],"access_address":null,"items":[{"item_identifier":"216889","shelf":"Books 10"}],"created_at":"1999-05-19T08:58:25.000+09:00","updated_at":"2025-12-15T09:31:17.566+09:00"},{"id":72294,"original_title":"Advances in X-ray analysis","title_alternative":null,"title_transcription":"  ","title_alternative_transcription":null,"pub_date":"1992","statement_of_responsibility":"edited by Charles S. Barrett ...[et al.] ; sponsored by University of Denver Department of Engineering and JCPDS-International Centre for Diffraction Data","creators":[{"full_name":"Conference on Application of X-ray Analysis"},{"full_name":"Denver Research Institute"},{"full_name":"JCPDS-International Centre for Diffraction Data"},{"full_name":"Barrett, C. S. (Charles Sanborn)"}],"contributors":[],"publishers":[{"full_name":"Plenum"}],"publication_place":null,"extent":"1 v. ; 26 cm","dimensions":null,"identifiers":[{"identifier_type":"isbn","body":"9780306442490"}],"subjects":[],"classfifications":[{"classification_type":"udc","term":"539"}],"access_address":null,"items":[{"item_identifier":"216888","shelf":"Books 10"}],"created_at":"1999-05-19T08:58:23.000+09:00","updated_at":"2025-12-15T09:31:18.415+09:00"},{"id":37455,"original_title":"Advances in X-ray analysis","title_alternative":null,"title_transcription":"  ","title_alternative_transcription":null,"pub_date":"1991","statement_of_responsibility":"edited by Charles S. Barrett ...[et al.] ; sponsored by University of Denver Department of Engineering and JCPDS-International Centre for Diffraction Data","creators":[{"full_name":"Conference on Application of X-ray Analysis"},{"full_name":"Denver Research Institute"},{"full_name":"JCPDS-International Centre for Diffraction Data"},{"full_name":"Barrett, C. S. (Charles Sanborn)"}],"contributors":[],"publishers":[{"full_name":"Plenum"}],"publication_place":null,"extent":"1 v. ; 26 cm","dimensions":null,"identifiers":[{"identifier_type":"isbn","body":"9780306440038"}],"subjects":[],"classfifications":[{"classification_type":"udc","term":"539"}],"access_address":null,"items":[{"item_identifier":"216887","shelf":"Books 10"}],"created_at":"1999-05-19T08:58:22.000+09:00","updated_at":"2025-12-15T09:31:18.766+09:00"},{"id":37468,"original_title":"Advances in X-ray analysis","title_alternative":null,"title_transcription":"  ","title_alternative_transcription":null,"pub_date":"1990","statement_of_responsibility":"edited by Charles S. Barrett ...[et al.] ; sponsored by University of Denver Department of Engineering and JCPDS-International Centre for Diffraction Data","creators":[{"full_name":"Conference on Application of X-ray Analysis"},{"full_name":"Denver Research Institute"},{"full_name":"JCPDS-International Centre for Diffraction Data"},{"full_name":"Barrett, C. S. (Charles Sanborn)"}],"contributors":[],"publishers":[{"full_name":"Plenum"}],"publication_place":null,"extent":"1 v. ; 26 cm","dimensions":null,"identifiers":[{"identifier_type":"isbn","body":"9780306436154"}],"subjects":[],"classfifications":[{"classification_type":"udc","term":"539"}],"access_address":null,"items":[{"item_identifier":"216886","shelf":"Books 10"}],"created_at":"1999-05-19T08:58:17.000+09:00","updated_at":"2025-12-15T09:31:17.798+09:00"},{"id":32826,"original_title":"Advances in Cryogenic Engineering Materials Vol.32  Vol.32","title_alternative":null,"title_transcription":"  ","title_alternative_transcription":null,"pub_date":"1986","statement_of_responsibility":null,"creators":[{"full_name":"edited by R.P. Reed, A.F. Clark"}],"contributors":[{"full_name":"edited by R.P. Reed, A.F. Clark"}],"publishers":[{"full_name":"Plenum Press"}],"publication_place":null,"extent":"1120p; 26cm","dimensions":null,"identifiers":[{"identifier_type":"isbn","body":"9780306422928"}],"subjects":[],"classfifications":[{"classification_type":"udc","term":"536.4"}],"access_address":null,"items":[{"item_identifier":"215268","shelf":"Journal Archives"}],"created_at":"1999-05-19T08:54:02.000+09:00","updated_at":"2025-12-23T15:17:53.042+09:00"},{"id":72281,"original_title":"Advances in X-ray analysis","title_alternative":null,"title_transcription":"  ","title_alternative_transcription":null,"pub_date":"1989","statement_of_responsibility":"edited by Charles S. Barrett ...[et al.] ; sponsored by University of Denver Department of Engineering and JCPDS-International Centre for Diffraction Data","creators":[{"full_name":"Conference on Application of X-ray Analysis"},{"full_name":"Denver Research Institute"},{"full_name":"JCPDS-International Centre for Diffraction Data"},{"full_name":"Barrett, C. S. (Charles Sanborn)"}],"contributors":[],"publishers":[{"full_name":"Plenum"}],"publication_place":null,"extent":"1 v. ; 26 cm","dimensions":null,"identifiers":[{"identifier_type":"isbn","body":"9780306432361"}],"subjects":[],"classfifications":[{"classification_type":"udc","term":"539"}],"access_address":null,"items":[{"item_identifier":"215889","shelf":"Books 10"}],"created_at":"1999-05-19T08:51:04.000+09:00","updated_at":"2025-12-15T09:31:17.916+09:00"},{"id":37477,"original_title":"Advances in X-ray analysis","title_alternative":null,"title_transcription":"  ","title_alternative_transcription":null,"pub_date":"1988","statement_of_responsibility":"edited by Charles S. Barrett ...[et al.] ; sponsored by University of Denver Department of Engineering and JCPDS-International Centre for Diffraction Data","creators":[{"full_name":"Conference on Application of X-ray Analysis"},{"full_name":"Denver Research Institute"},{"full_name":"JCPDS-International Centre for Diffraction Data"},{"full_name":"Barrett, C. S. (Charles Sanborn)"}],"contributors":[],"publishers":[{"full_name":"Plenum"}],"publication_place":null,"extent":"1 v. ; 26 cm","dimensions":null,"identifiers":[{"identifier_type":"isbn","body":"9780306429323"}],"subjects":[],"classfifications":[{"classification_type":"udc","term":"539"}],"access_address":null,"items":[{"item_identifier":"215888","shelf":"Books 10"}],"created_at":"1999-05-19T08:51:03.000+09:00","updated_at":"2025-12-15T09:31:15.631+09:00"}]}