{"total_count":941,"results":[{"id":37595,"original_title":"Total-reflection X-ray fluorescence analysis","title_alternative":null,"title_transcription":"  ","title_alternative_transcription":null,"pub_date":"1997","statement_of_responsibility":"Reinhold Klockenkämper","creators":[{"full_name":"Klockenkämper, R."}],"contributors":[],"publishers":[{"full_name":"Wiley"}],"publication_place":null,"extent":"xvii, 245 p. ; 24 cm","dimensions":null,"identifiers":[{"identifier_type":"isbn","body":"9780471305248"}],"subjects":[],"classfifications":[],"access_address":null,"items":[{"item_identifier":"217569","shelf":"Books 13"}],"created_at":"1901-12-31T09:00:00.000+09:00","updated_at":"2025-12-15T09:35:33.204+09:00"},{"id":37602,"original_title":"Gettering and deffect engineering in semiconductor technology : GADEST '93 : proceedings of the 5th International Autumn Meeting held in Chossewitz, near Frankfurt(Oder), Germany, October 09-14, 1993","title_alternative":null,"title_transcription":"Diffusion \u0026 Defect Data pt.B 32-33  ","title_alternative_transcription":null,"pub_date":"1993","statement_of_responsibility":"editors, H.G. Grimmeiss, M. Kittler and H. Richter","creators":[{"full_name":"International Autumn Meeting, Gettering and Defect Engineering in Semiconductor Technology"},{"full_name":"Grimmeiss, H. G."},{"full_name":"Kittler, M."},{"full_name":"Richter, H."}],"contributors":[],"publishers":[{"full_name":"SciTec Publications"}],"publication_place":null,"extent":"xvii, 630 p. ; 25 cm","dimensions":null,"identifiers":[],"subjects":[],"classfifications":[{"classification_type":"udc","term":"548.526"}],"access_address":null,"items":[{"item_identifier":"216431","shelf":"Journal Archives 8"}],"created_at":"1901-12-31T09:00:00.000+09:00","updated_at":"2025-12-15T09:52:43.887+09:00"},{"id":37603,"original_title":"Standardization of fretting fatigue test methods and equipment","title_alternative":"Fretting fatigue test methods and equipment","title_transcription":"  ","title_alternative_transcription":null,"pub_date":"1992","statement_of_responsibility":"M. Helmi Attia and R.B. Waterhouse, editors","creators":[{"full_name":"Attia, M. Helmi (Mahmoud Helmi)"},{"full_name":"Waterhouse, R. B. (Robert Barry)"}],"contributors":[],"publishers":[{"full_name":"ASTM"}],"publication_place":null,"extent":"281 p. ; 24 cm","dimensions":null,"identifiers":[{"identifier_type":"isbn","body":"9780803114487"}],"subjects":[],"classfifications":[{"classification_type":"udc","term":"STP"}],"access_address":null,"items":[{"item_identifier":"216434","shelf":"Stack 12"}],"created_at":"1901-12-31T09:00:00.000+09:00","updated_at":"2025-12-23T15:16:07.707+09:00"},{"id":37605,"original_title":"Diffusion and Defect Data Pt.A Defect and Diffusion Forum Vol.152  Vol.152 with Annual Index","title_alternative":null,"title_transcription":"  ","title_alternative_transcription":null,"pub_date":null,"statement_of_responsibility":null,"creators":[],"contributors":[],"publishers":[{"full_name":"Scitec Publications"}],"publication_place":null,"extent":"264p; 25cm","dimensions":null,"identifiers":[],"subjects":[],"classfifications":[{"classification_type":"udc","term":"548.526"}],"access_address":null,"items":[{"item_identifier":"217593","shelf":"Journal Archives 8"}],"created_at":"1901-12-31T09:00:00.000+09:00","updated_at":"2025-12-15T09:52:36.462+09:00"},{"id":77054,"original_title":"Physics and applications of the Josephson effect","title_alternative":null,"title_transcription":"  ","title_alternative_transcription":null,"pub_date":"1982","statement_of_responsibility":"Antonio Barone, Gianfranco Paternò","creators":[{"full_name":"Barone, Antonio"},{"full_name":"Paternò, Gianfranco"}],"contributors":[],"publishers":[{"full_name":"John Wiley \u0026 Sons"}],"publication_place":null,"extent":"xvii, 529 p. ; 24 cm","dimensions":null,"identifiers":[{"identifier_type":"isbn","body":"9780471014690"}],"subjects":[],"classfifications":[],"access_address":null,"items":[{"item_identifier":"200992","shelf":"Books 9"}],"created_at":"1901-12-31T09:00:00.000+09:00","updated_at":"2025-12-15T09:29:45.260+09:00"},{"id":69212,"original_title":"Quantitative microbeam analysis : Proceedings of the Fortieth Scottish Universities Summer School in Physics, Dundee, August 1992","title_alternative":null,"title_transcription":"  ","title_alternative_transcription":null,"pub_date":"1993","statement_of_responsibility":"edited by A. G. Fitzgerald ... [et al.]","creators":[{"full_name":"Scottish Universities' Summer School in Physics"},{"full_name":"Fitzgerald, A. G."}],"contributors":[],"publishers":[{"full_name":"Scottish Universities Summer School in Physics"},{"full_name":"Institute of Physics Publishing"}],"publication_place":null,"extent":"xiv, 478 p. ; 24 cm","dimensions":null,"identifiers":[{"identifier_type":"isbn","body":"9780750302562"}],"subjects":[],"classfifications":[{"classification_type":"udc","term":"669"}],"access_address":null,"items":[{"item_identifier":"216437","shelf":"Books 25"}],"created_at":"1901-12-31T09:00:00.000+09:00","updated_at":"2025-12-15T09:47:57.220+09:00"},{"id":72539,"original_title":"Inclusions belonging to the systems MgO-SiO2-Al2O3, CaO-SiO2-Al2O3 and related oxide systems. Sulphide inclusions","title_alternative":null,"title_transcription":"  ","title_alternative_transcription":null,"pub_date":"1966","statement_of_responsibility":"Rorand Kiessling, Nils Lange","creators":[{"full_name":"Kiessling, Roland"},{"full_name":"Lange, Nils"}],"contributors":[],"publishers":[{"full_name":"Iron and Steel Institute"}],"publication_place":null,"extent":"162 p. ; 23 cm","dimensions":null,"identifiers":[],"subjects":[],"classfifications":[{"classification_type":"udc","term":"669.2"}],"access_address":null,"items":[{"item_identifier":"204143","shelf":"Books 27"}],"created_at":"1901-12-31T09:00:00.000+09:00","updated_at":"2026-03-19T13:23:01.766+09:00"},{"id":72540,"original_title":"The origin and behaviour of inclusions and theirinfluence on the properties of steels","title_alternative":null,"title_transcription":"  ","title_alternative_transcription":null,"pub_date":"1968","statement_of_responsibility":"Rorand Kiessling","creators":[{"full_name":"Kiessling, Roland"}],"contributors":[],"publishers":[{"full_name":"Iron and Steel Institute"}],"publication_place":null,"extent":"118 p. ; 23 cm","dimensions":null,"identifiers":[],"subjects":[],"classfifications":[{"classification_type":"udc","term":"669.2"}],"access_address":null,"items":[{"item_identifier":"205518","shelf":"Books 27"}],"created_at":"1901-12-31T09:00:00.000+09:00","updated_at":"2026-03-19T13:22:41.113+09:00"},{"id":65941,"original_title":"Transmission electron microscopy of materials","title_alternative":null,"title_transcription":"  ","title_alternative_transcription":null,"pub_date":"1979","statement_of_responsibility":"Gareth Thomas, Michael J. Goringe","creators":[{"full_name":"Thomas, Gareth"},{"full_name":"Goringe, M. J."}],"contributors":[],"publishers":[{"full_name":"Wiley"}],"publication_place":null,"extent":"xiv, 388 p. ; 23 cm","dimensions":null,"identifiers":[{"identifier_type":"isbn","body":"9780471122449"}],"subjects":[],"classfifications":[{"classification_type":"udc","term":"548"}],"access_address":null,"items":[{"item_identifier":"216391","shelf":"Books 17"}],"created_at":"1901-12-31T09:00:00.000+09:00","updated_at":"2025-12-15T09:39:23.912+09:00"},{"id":37680,"original_title":"Diffusion and Defect Data Pt.A Defect and Diffusion Forum Vol.131-132  Vol.131-132","title_alternative":null,"title_transcription":"Diffusion and Defect Data Pt.A Defect and Diffusion Forum Vol.131-132","title_alternative_transcription":null,"pub_date":"1996-01-01","statement_of_responsibility":null,"creators":[{"full_name":"D.L.Beke I.A.Szabo"}],"contributors":[],"publishers":[{"full_name":"Scitec Publications"}],"publication_place":null,"extent":"456p; 25cm","dimensions":null,"identifiers":[],"subjects":[],"classfifications":[{"classification_type":"udc","term":"548.526"}],"access_address":null,"items":[{"item_identifier":"217016","shelf":"Journal Archives 8"}],"created_at":"1901-01-01T09:00:00.000+09:00","updated_at":"2025-12-15T09:52:34.651+09:00"}]}