{"total_count":8946,"results":[{"id":66475,"original_title":"Mass transport in oxides : proceedings of a symposium held at Gaithersburg, Maryland, October 22-25, 1967","title_alternative":null,"title_transcription":"  ","title_alternative_transcription":null,"pub_date":"1968","statement_of_responsibility":"edited by J. B. Wachtman and A. D. Franklin","creators":[{"full_name":"Wachtman, J. B."},{"full_name":"Franklin, Alan D."}],"contributors":[{"full_name":"edited by J.B．Wachtman，Jr., A.D．Franklin:Sponsored by Advanced Research Projects Agency and National Bureau of Standards"}],"publishers":[{"full_name":"National Bureau of Standards"}],"publication_place":null,"extent":"viii, 217 p. ; 27 cm","dimensions":null,"identifiers":[],"subjects":[],"classfifications":[{"classification_type":"udc","term":"539.219.3"}],"access_address":null,"items":[{"item_identifier":"217435","shelf":"単行書11"}],"created_at":"1901-01-01T09:00:00.000+09:00","updated_at":"2025-12-15T09:33:00.923+09:00"},{"id":66332,"original_title":"Atom probe field ion microscopy","title_alternative":null,"title_transcription":"  ","title_alternative_transcription":null,"pub_date":"1996","statement_of_responsibility":"M.K. Miller ... [et al.]","creators":[{"full_name":"Miller, M. K. (Michael Kenneth)"}],"contributors":[],"publishers":[{"full_name":"Clarendon Press"}],"publication_place":null,"extent":"xi, 509 p. ; 24 cm","dimensions":null,"identifiers":[{"identifier_type":"isbn","body":"9780198513872"}],"subjects":[],"classfifications":[{"classification_type":"udc","term":"539.24"}],"access_address":null,"items":[{"item_identifier":"217040","shelf":"単行書11"}],"created_at":"1901-01-01T09:00:00.000+09:00","updated_at":"2025-12-15T09:33:12.637+09:00"},{"id":66333,"original_title":"Electron correlations in molecules and solids","title_alternative":null,"title_transcription":"  ","title_alternative_transcription":null,"pub_date":"1993","statement_of_responsibility":"Peter Fulde","creators":[{"full_name":"Fulde, Peter"}],"contributors":[],"publishers":[{"full_name":"Springer-Verlag"}],"publication_place":null,"extent":"xiv, 422 p. ; 24 cm","dimensions":null,"identifiers":[{"identifier_type":"isbn","body":"9783540563761"}],"subjects":[],"classfifications":[{"classification_type":"udc","term":"537.8"}],"access_address":null,"items":[{"item_identifier":"213156","shelf":"単行書9"}],"created_at":"1901-01-01T09:00:00.000+09:00","updated_at":"2025-12-15T09:30:42.176+09:00"},{"id":66349,"original_title":"Technology of electrodeposition : mechanical and physical properties of electrodeposits and factors affecting their control, thickness distribution, fundamental plating theory, surface-active materials, alternating current, alloy plating","title_alternative":null,"title_transcription":"  ","title_alternative_transcription":null,"pub_date":"1961","statement_of_responsibility":"by A.T. Vagramyan and Z.A. Solov'eva ; translated from the Russian by A. Behr","creators":[{"full_name":"Vagramian, A.T."},{"full_name":"Solov'eva, Z.A."}],"contributors":[],"publishers":[{"full_name":"R. Draper"}],"publication_place":null,"extent":"xiii, 398 p. ; 23 cm","dimensions":null,"identifiers":[],"subjects":[],"classfifications":[{"classification_type":"udc","term":"621.35"}],"access_address":null,"items":[{"item_identifier":"204256","shelf":"単行書22"}],"created_at":"1901-01-01T09:00:00.000+09:00","updated_at":"2025-12-15T09:43:54.623+09:00"},{"id":66118,"original_title":"Elements of materials science : an introductory text for engineering students","title_alternative":null,"title_transcription":"  ","title_alternative_transcription":null,"pub_date":"1964","statement_of_responsibility":"by Lawrence H. Van Vlack","creators":[{"full_name":"Van Vlack, Lawrence H."}],"contributors":[],"publishers":[{"full_name":"Addison-Wesley Pub. Co"}],"publication_place":null,"extent":"xv, 445 p. ; 25 cm","dimensions":null,"identifiers":[],"subjects":[],"classfifications":[],"access_address":null,"items":[{"item_identifier":"205829","shelf":"単行書26"}],"created_at":"1901-01-01T09:00:00.000+09:00","updated_at":"2025-12-15T09:48:52.321+09:00"},{"id":66129,"original_title":"Electron diffraction, 1927-1977 : invited and contributed papers from the International Conference on Electron Diffraction held in London, 19-21 September 1977","title_alternative":null,"title_transcription":"  ","title_alternative_transcription":null,"pub_date":"1978","statement_of_responsibility":"edited by P. J. Dobson, J. B. Pendry, and C. J. Humphreys","creators":[{"full_name":"International Conference on Electron Diffraction"},{"full_name":"Dobson, P. J."},{"full_name":"Pendry, J. B."},{"full_name":"Humphreys, Jimmy C."}],"contributors":[{"full_name":"edited by P.J. Dobson, J.B. Pendry, C.J. Humphreys"}],"publishers":[{"full_name":"Institute of Physics"}],"publication_place":null,"extent":"xi, 442 p. ; 24 cm","dimensions":null,"identifiers":[{"identifier_type":"isbn","body":"9780854981328"}],"subjects":[],"classfifications":[{"classification_type":"udc","term":"548"}],"access_address":null,"items":[{"item_identifier":"209620","shelf":"単行書17"}],"created_at":"1901-01-01T09:00:00.000+09:00","updated_at":"2025-04-21T11:36:10.505+09:00"},{"id":66317,"original_title":"Intermediate voltage microscopy and its application to materials science","title_alternative":null,"title_transcription":"  ","title_alternative_transcription":null,"pub_date":"1987","statement_of_responsibility":"editor, Krishna Rajan","creators":[{"full_name":"Rajan, Krishna"}],"contributors":[],"publishers":[{"full_name":"Electron Optics Pub. Co."}],"publication_place":null,"extent":"143 p. ; 28 cm","dimensions":null,"identifiers":[],"subjects":[],"classfifications":[{"classification_type":"udc","term":"620.187"}],"access_address":null,"items":[{"item_identifier":"215623","shelf":"単行書20"}],"created_at":"1901-01-01T09:00:00.000+09:00","updated_at":"2025-12-15T09:41:41.969+09:00"},{"id":66416,"original_title":"Intermetallic semiconducting films","title_alternative":null,"title_transcription":"  ","title_alternative_transcription":null,"pub_date":"1970","statement_of_responsibility":"[by] H.H.Wieder","creators":[{"full_name":"Wieder, H. H."}],"contributors":[],"publishers":[{"full_name":"Pergamon Press"}],"publication_place":null,"extent":"x, 361 p. ; 24 cm","dimensions":null,"identifiers":[],"subjects":[],"classfifications":[{"classification_type":"udc","term":"621.31"}],"access_address":null,"items":[{"item_identifier":"204609","shelf":"単行書22"}],"created_at":"1901-01-01T09:00:00.000+09:00","updated_at":"2026-03-25T09:34:01.399+09:00"},{"id":66031,"original_title":"The measurement of grain boundary geometry","title_alternative":null,"title_transcription":"  ","title_alternative_transcription":null,"pub_date":"1993","statement_of_responsibility":"V. Randle","creators":[{"full_name":"Randle, V. (Valerie)"}],"contributors":[],"publishers":[{"full_name":"Institute of Physics Publishing"}],"publication_place":null,"extent":"xi, 169 p. ; 24 cm","dimensions":null,"identifiers":[{"identifier_type":"isbn","body":"9780750302357"}],"subjects":[],"classfifications":[{"classification_type":"udc","term":"548.2"}],"access_address":null,"items":[{"item_identifier":"216405","shelf":"単行書17"}],"created_at":"1901-01-01T09:00:00.000+09:00","updated_at":"2025-12-15T09:39:30.363+09:00"},{"id":66041,"original_title":"Silicon front-end junction formation : physics and technology : symposium held April 13-15, 2004, San Francisco, California, U.S.A.","title_alternative":null,"title_transcription":"  ","title_alternative_transcription":null,"pub_date":"2004","statement_of_responsibility":"editors, Peter Pichler ... [et al.]","creators":[{"full_name":"Pichler, Peter"}],"contributors":[],"publishers":[{"full_name":"Materials Research Society"}],"publication_place":null,"extent":"xvi, 494 p. ; 24 cm","dimensions":null,"identifiers":[{"identifier_type":"isbn","body":"9781558997608"}],"subjects":[],"classfifications":[{"classification_type":"udc","term":"MRS"}],"access_address":null,"items":[{"item_identifier":"219665","shelf":"集密書庫60"}],"created_at":"1901-01-01T09:00:00.000+09:00","updated_at":"2025-12-03T16:34:58.382+09:00"}]}