{"total_count":1,"results":[{"id":39311,"original_title":"Materials reliability in microelectronics VII : symposium held April 8-12, 1997, San Francisco, California, U.S.A.","title_alternative":null,"title_transcription":"  ","title_alternative_transcription":null,"pub_date":"1997","statement_of_responsibility":"editors, J. Joseph Clement ... [et al.]","creators":[{"full_name":"Clement, J. Joseph"}],"contributors":[],"publishers":[{"full_name":"Materials Research Society"}],"publication_place":null,"extent":"xv, 457 p. ; 24 cm","dimensions":null,"identifiers":[{"identifier_type":"isbn","body":"9781558993778"}],"subjects":[],"classfifications":[{"classification_type":"udc","term":"MRS"}],"access_address":null,"items":[{"item_identifier":"217605","shelf":"Journal Archives 60"}],"created_at":"1901-12-31T09:00:00.000+09:00","updated_at":"2025-12-03T16:34:25.806+09:00"}]}