{"total_count":1,"results":[{"id":41282,"original_title":"Gettering and Defect Engineering in Semiconductor Technology GADEST 2001 : Proceedings of the 9th International Autumn Meeting on Gettering and Defect Engineering in Semiconductor Technology, S. Tecla, Italy September 30-October 3, 2001  Vols. 82-84","title_alternative":null,"title_transcription":"  ","title_alternative_transcription":null,"pub_date":"2002-01-01","statement_of_responsibility":null,"creators":[{"full_name":"Editor: V. Raineri, F. Priolo, M. Kittler and H. Richter"}],"contributors":[],"publishers":[{"full_name":"Scitec Publications Ltd"}],"publication_place":null,"extent":"823p; 25cm","dimensions":null,"identifiers":[{"identifier_type":"isbn","body":"9783908450641"},{"identifier_type":"issn","body":"10120394"}],"subjects":[],"classfifications":[{"classification_type":"udc","term":"548.526"}],"access_address":null,"items":[{"item_identifier":"219032","shelf":"集密書庫8"}],"created_at":"1901-01-01T09:00:00.000+09:00","updated_at":"2025-12-15T09:52:46.203+09:00"}]}