{"total_count":1,"results":[{"id":65822,"original_title":"シリコン結晶欠陥の基礎物性とその評価法","title_alternative":"Basic properties of defects in silicon and their characterizing technologies","title_transcription":"シリコン ケッショウ ケッカン ノ キソ ブッセイ ト ソノ ヒョウカホウ","title_alternative_transcription":null,"pub_date":"1997-05","statement_of_responsibility":"上浦洋一著","creators":[{"full_name":"上浦, 洋一"}],"contributors":[],"publishers":[{"full_name":"リアライズ社"}],"publication_place":null,"extent":"6,192,10p ; 30cm","dimensions":null,"identifiers":[{"identifier_type":"isbn","body":"9784947655974"}],"subjects":[],"classfifications":[{"classification_type":"udc","term":"621.382"}],"access_address":null,"items":[{"item_identifier":"529620","shelf":"単行書22"}],"created_at":"2002-02-19T01:43:40.000+09:00","updated_at":"2025-12-15T09:44:18.760+09:00"}]}