{"total_count":893,"results":[{"id":5190,"original_title":"Uranium-series geochemistry","title_alternative":null,"title_transcription":"Reviews in Mineralogy \u0026 Geochemistry Uranium-Series Geochemistry ","title_alternative_transcription":null,"pub_date":"2003","statement_of_responsibility":"B. Bourdon, G. M. Henderson, C. C. Lundstrom \u0026 S. P.Turner, Editors","creators":[{"full_name":"Bourdon, B."},{"full_name":"Henderson, G. M."},{"full_name":"Lundstrom, C. C."},{"full_name":"Turner, S.P."}],"contributors":[],"publishers":[{"full_name":"Mineralogical Society of America"}],"publication_place":null,"extent":"xx, 656 p. ; 23 cm","dimensions":null,"identifiers":[],"subjects":[],"classfifications":[{"classification_type":"udc","term":"549"}],"access_address":null,"items":[{"item_identifier":"522977","shelf":"Books 18"}],"created_at":"2003-04-14T22:43:20.000+09:00","updated_at":"2025-12-15T09:40:22.364+09:00"},{"id":5189,"original_title":"Beryllium : Mineralogy, Petrology, and Geochemistry","title_alternative":null,"title_transcription":"Reviews in Mineralogy \u0026 Geochemistry Beryllium Mineralogy,Petrology,and Geochemistry ","title_alternative_transcription":null,"pub_date":"2002","statement_of_responsibility":"editor. Edwards S. Grew","creators":[{"full_name":"Grew, Edwards S."}],"contributors":[],"publishers":[{"full_name":"Mineralogical Society of America"}],"publication_place":null,"extent":"xii, 691 p. ; 23 cm","dimensions":null,"identifiers":[],"subjects":[],"classfifications":[{"classification_type":"udc","term":"549"}],"access_address":null,"items":[{"item_identifier":"522971","shelf":"Books 18"}],"created_at":"2003-02-10T20:36:43.000+09:00","updated_at":"2025-12-15T09:40:23.719+09:00"},{"id":5586,"original_title":"Applications of Synchrotron Radiation in Low-Temperature Geochemistry and Environmental Science","title_alternative":null,"title_transcription":"Reviews in Mineralogy\u0026Geochemistry Applications of Synchrotron Radiation in Low-Temperature Geochemistry and Environmental Science ","title_alternative_transcription":null,"pub_date":"2002","statement_of_responsibility":"P. A. Fenter, M. L. Rivers, N. C. Sturchio, S. R. Sutton, Eds.","creators":[{"full_name":"Fenter, P. A."},{"full_name":"Rivers, M. L."},{"full_name":"Sturchio, N. C."},{"full_name":"Sutton, S. R."}],"contributors":[],"publishers":[{"full_name":"Mineralogical Society of America"}],"publication_place":null,"extent":"579 p. ; 23 cm","dimensions":null,"identifiers":[],"subjects":[],"classfifications":[{"classification_type":"udc","term":"549"}],"access_address":null,"items":[{"item_identifier":"522967","shelf":"Books 18"}],"created_at":"2002-12-26T22:39:49.000+09:00","updated_at":"2025-12-15T09:40:22.263+09:00"},{"id":41281,"original_title":"Defect Interaction and Clustering in Semiconductors  Vols.85-86","title_alternative":null,"title_transcription":"  ","title_alternative_transcription":null,"pub_date":"2002-01-01","statement_of_responsibility":null,"creators":[{"full_name":"Editor: S. Pizzini"}],"contributors":[],"publishers":[{"full_name":"Scitec Publications Ltd"}],"publication_place":null,"extent":"413p; 25cm","dimensions":null,"identifiers":[{"identifier_type":"isbn","body":"9783908450658"},{"identifier_type":"issn","body":"10120394"}],"subjects":[],"classfifications":[{"classification_type":"udc","term":"548.526"}],"access_address":null,"items":[{"item_identifier":"219336","shelf":"Journal Archives 8"}],"created_at":"2002-12-13T02:03:34.000+09:00","updated_at":"2025-12-15T09:52:45.563+09:00"},{"id":42821,"original_title":"Thin films : stresses and mechanical properties IX : symposium held November 26-30, 2001, Boston, Massachusetts, U.S.A.","title_alternative":"Thin films : stresses and mechanical properties 9","title_transcription":"  ","title_alternative_transcription":null,"pub_date":"2002","statement_of_responsibility":"editors, Cengiz S. Ozkan ... [et al.]","creators":[{"full_name":"Ozkan, Cengiz S."},{"full_name":"Freund, L. Ben"},{"full_name":"Cammarata, Robert C."},{"full_name":"Gao, Huajian"}],"contributors":[],"publishers":[{"full_name":"Materials Research Society"}],"publication_place":null,"extent":"xv, 511 p. ; 24 cm","dimensions":null,"identifiers":[{"identifier_type":"isbn","body":"9781558996311"},{"identifier_type":"issn","body":"10704612"}],"subjects":[],"classfifications":[{"classification_type":"udc","term":"MRS"}],"access_address":null,"items":[{"item_identifier":"219259","shelf":"Journal Archives 60"}],"created_at":"2002-08-21T23:44:21.000+09:00","updated_at":"2025-12-03T16:34:46.219+09:00"},{"id":40952,"original_title":"Thermoelectric materials 2001--research and applications : symposium held November 26-29, 2001, Boston, Massachusetts, U.S.A","title_alternative":null,"title_transcription":"  ","title_alternative_transcription":null,"pub_date":"2002","statement_of_responsibility":"editors, George S. Nolas, David C. Johnson, David G. Mandrus","creators":[{"full_name":"Materials Research Society"},{"full_name":"Nolas, George S."},{"full_name":"Johnson, David C."},{"full_name":"Mandrus, David G."},{"full_name":"Materials Research Society. Meeting"}],"contributors":[],"publishers":[{"full_name":"Materials Research Society"}],"publication_place":null,"extent":"xiv, 468 p. ; 24 cm","dimensions":null,"identifiers":[{"identifier_type":"isbn","body":"9781558996274"}],"subjects":[],"classfifications":[{"classification_type":"udc","term":"MRS"}],"access_address":null,"items":[{"item_identifier":"219258","shelf":"Journal Archives 60"}],"created_at":"2002-08-10T00:04:32.000+09:00","updated_at":"2025-12-03T16:34:45.851+09:00"},{"id":40847,"original_title":"Materials science of microelectromechanical systems (MEMS) devices IV : symposium held November 25-28, 2001, Boston, Massachusetts, U.S.A.","title_alternative":"Materials science of microelectromechanical systems (MEMS) devices 4//Materials science of microelectromechanical systems (MEMS) devices four","title_transcription":"  ","title_alternative_transcription":null,"pub_date":"2002","statement_of_responsibility":"editors, Arturo A. Ayón ... [et al.]","creators":[{"full_name":"Materials Research Society"},{"full_name":"Ayón, Arturo A."},{"full_name":"Buchheit, Thomas E."},{"full_name":"Kahn, Harold"},{"full_name":"Spearing, S. Mark"}],"contributors":[],"publishers":[{"full_name":"Materials Research Society"}],"publication_place":null,"extent":"xi, 318 p. ; 24 cm","dimensions":null,"identifiers":[{"identifier_type":"isbn","body":"9781558996236"}],"subjects":[],"classfifications":[{"classification_type":"udc","term":"MRS"}],"access_address":null,"items":[{"item_identifier":"219241","shelf":"Journal Archives 60"}],"created_at":"2002-08-01T01:22:37.000+09:00","updated_at":"2025-12-03T16:34:45.391+09:00"},{"id":5568,"original_title":"Neutron scattering with a triple-axis spectrometer : basic techniques","title_alternative":null,"title_transcription":"Neutron Scattering with a Triple-Axis Spectrometer Basic Techniques  ","title_alternative_transcription":null,"pub_date":"2002","statement_of_responsibility":"Gen Shirane, Stephen M. Shapiro, and John M. Tranquada","creators":[{"full_name":"Shirane, G. (Gen)"},{"full_name":"Shapiro, S. M. (Stephen M.)"},{"full_name":"Tranquada, John M."}],"contributors":[],"publishers":[{"full_name":"Cambridge University Press"}],"publication_place":null,"extent":"x, 273 p. ; 25 cm","dimensions":null,"identifiers":[],"subjects":[],"classfifications":[{"classification_type":"udc","term":"543.466"}],"access_address":null,"items":[{"item_identifier":"522936","shelf":"Books 14"}],"created_at":"2002-06-18T01:18:08.000+09:00","updated_at":"2025-12-15T09:36:26.096+09:00"},{"id":40568,"original_title":"Phase transitions and critical phenomena","title_alternative":null,"title_transcription":"  ","title_alternative_transcription":null,"pub_date":"2001","statement_of_responsibility":"edited by C. Domb and J.L. Lebowitz","creators":[{"full_name":"Domb, Cyril"},{"full_name":"Lebowitz, Joel Louis"}],"contributors":[{"full_name":"edited by C. Domb, J.L. Lebowitz"}],"publishers":[{"full_name":"Academic Press"}],"publication_place":null,"extent":"1 v. ; 24 cm","dimensions":null,"identifiers":[{"identifier_type":"isbn","body":"9780122203206"}],"subjects":[],"classfifications":[{"classification_type":"udc","term":"536.71"}],"access_address":null,"items":[{"item_identifier":"219177","shelf":"Books 8"}],"created_at":"2002-05-24T20:45:02.000+09:00","updated_at":"2025-12-15T09:29:29.020+09:00"},{"id":40270,"original_title":"Si front-end processing -- physics and technology of dopant-defect interactions III : symposium held April 17-19, 2001, San Francisco, California, U.S.A.","title_alternative":null,"title_transcription":"  ","title_alternative_transcription":null,"pub_date":"2001","statement_of_responsibility":"editors, Erin C. Jones ... [et al.]","creators":[{"full_name":"Jones, Erin C."},{"full_name":"Jones, Kevin S."},{"full_name":"Giles, Martin D."},{"full_name":"Stolk, Peter"},{"full_name":"Matsuo, Jiro"}],"contributors":[],"publishers":[{"full_name":"Materials Research Society"}],"publication_place":null,"extent":"1 v. ; 24 cm","dimensions":null,"identifiers":[{"identifier_type":"isbn","body":"9781558996052"}],"subjects":[],"classfifications":[{"classification_type":"udc","term":"MRS"}],"access_address":null,"items":[{"item_identifier":"219169","shelf":"Journal Archives 60"}],"created_at":"2002-05-02T19:56:01.000+09:00","updated_at":"2025-12-03T16:34:44.356+09:00"}]}