{"total_count":1,"results":[{"id":41386,"original_title":"Materials reliability in microelectronics VIII : symposium held April 13-16, 1998, San Francisco, California, U.S.A.","title_alternative":null,"title_transcription":"  ","title_alternative_transcription":null,"pub_date":"1998","statement_of_responsibility":"editors, John C. Bravman ... [et al.]","creators":[{"full_name":"Bravman, AJohm C."}],"contributors":[],"publishers":[{"full_name":"Materials Research Society"}],"publication_place":null,"extent":"xi, 365 p. ; 24 cm","dimensions":null,"identifiers":[{"identifier_type":"isbn","body":"9781558994225"},{"identifier_type":"issn","body":"02729172"}],"subjects":[],"classfifications":[{"classification_type":"udc","term":"MRS"}],"access_address":null,"items":[{"item_identifier":"218008","shelf":"Journal Archives 60"}],"created_at":"1999-06-21T23:30:40.000+09:00","updated_at":"2025-12-03T16:34:30.739+09:00"}]}