{"total_count":1,"results":[{"id":34839,"original_title":"Polarization analysis and applications to device technology : International Symposium on Polarization Analysis and Applications to Device Technology : 12-14 June, 1996, Yokahama, Japan","title_alternative":null,"title_transcription":"  ","title_alternative_transcription":null,"pub_date":"1996","statement_of_responsibility":"Toru Yoshizawa, Hideshi Yokota, editors ; sponsored by SPIE Japan Chapter ... [et al.] ; published by SPIE--The International Society for Optical Engineering","creators":[{"full_name":"International Symposium on Polarization Analysis and Applications to Device Technology"},{"full_name":"Yoshizawa, Tōru"},{"full_name":"Yokota, Hideshi"},{"full_name":"Society of Photo-optical Instrumentation Engineers. Japan Chapter"},{"full_name":"Society of Photo-optical Instrumentation Engineers"}],"contributors":[],"publishers":[{"full_name":"SPIE"}],"publication_place":null,"extent":"xiii, 350 p. ; 28 cm","dimensions":null,"identifiers":[{"identifier_type":"isbn","body":"9780819422712"}],"subjects":[],"classfifications":[{"classification_type":"udc","term":"535.5"}],"access_address":null,"items":[{"item_identifier":"211081","shelf":"単行書8"}],"created_at":"2008-09-04T01:47:34.000+09:00","updated_at":"2025-12-15T09:28:53.953+09:00"}]}