{"total_count":58,"results":[{"id":41285,"original_title":"Local Lattice Rotations and Dislinations in Microstructures of Distorted Crystalline Materials  Vol. 87","title_alternative":null,"title_transcription":"  ","title_alternative_transcription":null,"pub_date":"2002-01-01","statement_of_responsibility":null,"creators":[{"full_name":"Editor: P. Klimanek, A.E. Romanov, M. Seefeldt"}],"contributors":[],"publishers":[{"full_name":"Scitec Publications Ltd"}],"publication_place":null,"extent":"310p; 25cm","dimensions":null,"identifiers":[{"identifier_type":"isbn","body":"9783908450689"},{"identifier_type":"issn","body":"10120394"}],"subjects":[],"classfifications":[{"classification_type":"udc","term":"548.526"}],"access_address":null,"items":[{"item_identifier":"219337","shelf":"Journal Archives 8"}],"created_at":"2002-12-13T02:15:29.000+09:00","updated_at":"2025-12-15T09:52:45.759+09:00"},{"id":41281,"original_title":"Defect Interaction and Clustering in Semiconductors  Vols.85-86","title_alternative":null,"title_transcription":"  ","title_alternative_transcription":null,"pub_date":"2002-01-01","statement_of_responsibility":null,"creators":[{"full_name":"Editor: S. Pizzini"}],"contributors":[],"publishers":[{"full_name":"Scitec Publications Ltd"}],"publication_place":null,"extent":"413p; 25cm","dimensions":null,"identifiers":[{"identifier_type":"isbn","body":"9783908450658"},{"identifier_type":"issn","body":"10120394"}],"subjects":[],"classfifications":[{"classification_type":"udc","term":"548.526"}],"access_address":null,"items":[{"item_identifier":"219336","shelf":"Journal Archives 8"}],"created_at":"2002-12-13T02:03:34.000+09:00","updated_at":"2025-12-15T09:52:45.563+09:00"},{"id":40005,"original_title":"Polycrystalline semiconductors VI : materials, technologies, and large area electronics : proceedings of the sixth International Conference, Saint Malo, September 3-7, 2000","title_alternative":null,"title_transcription":"  ","title_alternative_transcription":null,"pub_date":"2001","statement_of_responsibility":null,"creators":[{"full_name":"International Conference on Polycrystalline Semiconductors"},{"full_name":"Bonnaud, O"}],"contributors":[],"publishers":[{"full_name":"Scitec Publications"}],"publication_place":null,"extent":"xiv, 459 p. ; 25 cm","dimensions":null,"identifiers":[{"identifier_type":"isbn","body":"9783908450634"},{"identifier_type":"issn","body":"10120394"}],"subjects":[],"classfifications":[{"classification_type":"udc","term":"548.526"}],"access_address":null,"items":[{"item_identifier":"218998","shelf":"Journal Archives 8"}],"created_at":"2001-09-29T00:27:29.000+09:00","updated_at":"2025-12-15T09:52:46.090+09:00"},{"id":68963,"original_title":"Proceedings of DIMAT 2000 : the fifth International Conference on Diffusion in Materials, Paris, France, July 17-21, 2000","title_alternative":"Diffusion in materials","title_transcription":"  ","title_alternative_transcription":null,"pub_date":"2001","statement_of_responsibility":"editors, Y. Limoge and J.L. Bocquet","creators":[{"full_name":"International Conference on Diffusion in Materials"},{"full_name":"Limoge, Y. (Yves)"},{"full_name":"Bocquet, J. L. (Jean-Louis)"}],"contributors":[],"publishers":[{"full_name":"Scitec Publications"}],"publication_place":null,"extent":"p.897-1833 ; 25 cm","dimensions":null,"identifiers":[{"identifier_type":"isbn","body":"9783908450603"},{"identifier_type":"issn","body":"10120386"}],"subjects":[],"classfifications":[{"classification_type":"udc","term":"548.526"}],"access_address":null,"items":[{"item_identifier":"218907","shelf":"Journal Archives 8"}],"created_at":"2001-07-20T00:59:50.000+09:00","updated_at":"2025-12-15T09:52:37.551+09:00"},{"id":39567,"original_title":"Beam Injection Assessment of Microstructures in Semiconductors BIAMS 2000: Proceedings of the 6th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors held in Fukuoka, Japan, November 12-16, 2000  Vols. 78-79","title_alternative":null,"title_transcription":"  ","title_alternative_transcription":null,"pub_date":"2001-01-01","statement_of_responsibility":null,"creators":[{"full_name":"Editors: Hajime Tomokage, Takashi Sekiguchi"}],"contributors":[],"publishers":[{"full_name":"Scitec Publications Ltd"}],"publication_place":null,"extent":"441p; 25cm","dimensions":null,"identifiers":[{"identifier_type":"isbn","body":"9783908450610"},{"identifier_type":"issn","body":"10120394"}],"subjects":[],"classfifications":[{"classification_type":"udc","term":"548.526"}],"access_address":null,"items":[{"item_identifier":"218799","shelf":"Journal Archives 8"}],"created_at":"2001-06-06T23:11:26.000+09:00","updated_at":"2025-12-15T09:52:45.657+09:00"},{"id":42809,"original_title":"Ultra clean processing of silicon surfaces 2000 : proceedings of the Fifth International Symposium on Ultra Clean Processing of Silicon Surfaces (UCPSS 2000), held in Ostend, Belgium, September 18-20, 2000","title_alternative":null,"title_transcription":"  ","title_alternative_transcription":null,"pub_date":"2001","statement_of_responsibility":"editors, Marc Heyns, Paul Mertens and Marc Meuris","creators":[{"full_name":"International Symposium on Ultra Clean Processing of Silicon Surfaces (UCPSS)"},{"full_name":"Heyns, Marc"},{"full_name":"Mertens, Paul"},{"full_name":"Meuris, Marc"}],"contributors":[],"publishers":[{"full_name":"Scitec Publications"}],"publication_place":null,"extent":"xiii, 321 p. ; 25 cm","dimensions":null,"identifiers":[{"identifier_type":"isbn","body":"9783908450573"},{"identifier_type":"issn","body":"10120394"}],"subjects":[],"classfifications":[{"classification_type":"udc","term":"548.526"}],"access_address":null,"items":[{"item_identifier":"218743","shelf":"Journal Archives 8"}],"created_at":"2000-12-26T19:03:04.000+09:00","updated_at":"2025-12-15T09:52:45.976+09:00"},{"id":43122,"original_title":"Diffusion and reactions : proceedings of the 2nd International Conference, held in Zakopane, Poland, Sept. 14-18, 1999","title_alternative":null,"title_transcription":"  ","title_alternative_transcription":null,"pub_date":"2000","statement_of_responsibility":"editor: M. Danielewski","creators":[{"full_name":"International Conference on Diffusion and Reactions"},{"full_name":"Danielewski, M."}],"contributors":[],"publishers":[{"full_name":"Scitec Publications"}],"publication_place":null,"extent":"ix, 264 p. ; 25 cm","dimensions":null,"identifiers":[{"identifier_type":"isbn","body":"9783908450511"},{"identifier_type":"issn","body":"10120394"}],"subjects":[],"classfifications":[{"classification_type":"udc","term":"548.526"}],"access_address":null,"items":[{"item_identifier":"218393","shelf":"Journal Archives 8"}],"created_at":"2000-06-15T23:09:11.000+09:00","updated_at":"2025-12-15T09:52:44.017+09:00"},{"id":43120,"original_title":"Special Defects in Semiconducting Materials  Vol.71","title_alternative":null,"title_transcription":"  ","title_alternative_transcription":null,"pub_date":"2000-01-01","statement_of_responsibility":null,"creators":[{"full_name":"Editor: R. P. Agarwala"}],"contributors":[],"publishers":[{"full_name":"Scitec Publications Ltd"}],"publication_place":null,"extent":"270p; 25cm","dimensions":null,"identifiers":[{"identifier_type":"isbn","body":"9783908450443"},{"identifier_type":"issn","body":"10120394"}],"subjects":[],"classfifications":[{"classification_type":"udc","term":"548.526"}],"access_address":null,"items":[{"item_identifier":"218373","shelf":"Journal Archives 8"}],"created_at":"2000-05-26T01:37:47.000+09:00","updated_at":"2025-12-15T09:52:45.440+09:00"},{"id":38246,"original_title":"Gettering and deffect engineering in semiconductor technology : GADEST '99 : proceedings of the 8th International Autumn Meeting : Höör, Schweden, September 25-28 1999","title_alternative":null,"title_transcription":"  ","title_alternative_transcription":null,"pub_date":"1999","statement_of_responsibility":"editors, H.G. Grimmeiss, L.Ask, M.Kleverman, M.Kittler and H.Richter","creators":[{"full_name":"International Autumn Meeting, Gettering and Defect Engineering in Semiconductor Technology"},{"full_name":"Grimmeiss, H.G."},{"full_name":"Ask, L."},{"full_name":"Kleverman, M."},{"full_name":"Kittler, M."},{"full_name":"Richter, H."}],"contributors":[],"publishers":[{"full_name":"Scitec Publications"}],"publication_place":null,"extent":"610 p. ; 25 cm","dimensions":null,"identifiers":[{"identifier_type":"isbn","body":"9783908450474"},{"identifier_type":"issn","body":"10120394"}],"subjects":[],"classfifications":[{"classification_type":"udc","term":"548.526"}],"access_address":null,"items":[{"item_identifier":"218112","shelf":"Journal Archives 8"}],"created_at":"1999-10-05T00:46:07.000+09:00","updated_at":"2025-12-15T09:52:44.484+09:00"},{"id":35354,"original_title":"Polycrystalline semiconductors V : bulk materials, thin films and devices : proceedings of the Fifth International Conference, held in Schwäbisch Gmünd, Germany, September 13-18, 1998","title_alternative":null,"title_transcription":"  ","title_alternative_transcription":null,"pub_date":"1999","statement_of_responsibility":"editors, J. H. Werner, H. P. Strunk, H. W. Schock","creators":[{"full_name":"International Conference on Polycrystalline Semiconductors"},{"full_name":"Werner, J. H. (Jürgen Heinz)"},{"full_name":"Strunk, H. P. (Horst Paul)"},{"full_name":"Schock, H. W."}],"contributors":[],"publishers":[{"full_name":"Scitec Publications"}],"publication_place":null,"extent":"xvi, 597 p. ; 25 cm","dimensions":null,"identifiers":[{"identifier_type":"isbn","body":"9783908450436"},{"identifier_type":"issn","body":"10120394"}],"subjects":[],"classfifications":[{"classification_type":"udc","term":"548.526"}],"access_address":null,"items":[{"item_identifier":"218036","shelf":"Journal Archives 8"}],"created_at":"1999-06-04T23:52:40.000+09:00","updated_at":"2025-12-15T09:52:44.260+09:00"}]}