{"total_count":4308,"results":[{"id":41635,"original_title":"Principles of quantitative X-ray fluorescence analysis","title_alternative":null,"title_transcription":"  ","title_alternative_transcription":null,"pub_date":"1982","statement_of_responsibility":"R. Tertian, F. Claisse","creators":[{"full_name":"Tertian, R."},{"full_name":"Claisse, F. (Fernand)"}],"contributors":[],"publishers":[{"full_name":"Heyden"}],"publication_place":null,"extent":"xviii, 385 p. ; 24cm","dimensions":null,"identifiers":[{"identifier_type":"isbn","body":"9780855017095"}],"subjects":[],"classfifications":[{"classification_type":"udc","term":"543.42"}],"access_address":null,"items":[{"item_identifier":"208817","shelf":"単行書14"}],"created_at":"1901-01-01T09:00:00.000+09:00","updated_at":"2025-12-15T09:36:24.414+09:00"},{"id":41643,"original_title":"Modelling of material behavior and design","title_alternative":null,"title_transcription":"  ","title_alternative_transcription":null,"pub_date":"1990","statement_of_responsibility":"edited by J.D. Embury and A.W. Thompson","creators":[{"full_name":"Embury, J. D."},{"full_name":"Thompson, A. W."}],"contributors":[{"full_name":"edited by J.D. Embury, A.W. Thompson"}],"publishers":[{"full_name":"Minerals, Metals \u0026 Materials Society"}],"publication_place":null,"extent":"xii, 271 p. ; 24 cm","dimensions":null,"identifiers":[{"identifier_type":"isbn","body":"9780873391214"}],"subjects":[],"classfifications":[{"classification_type":"udc","term":"539.3"}],"access_address":null,"items":[{"item_identifier":"210332","shelf":"単行書12"}],"created_at":"1901-01-01T09:00:00.000+09:00","updated_at":"2025-12-15T09:33:19.415+09:00"},{"id":42077,"original_title":"Electron beam x-ray microanalysis","title_alternative":null,"title_transcription":"  ","title_alternative_transcription":null,"pub_date":"1981","statement_of_responsibility":"Kurt F.J. Heinrich","creators":[{"full_name":"Heinrich, Kurt F. J."}],"contributors":[],"publishers":[{"full_name":"Van Nostrand Reinhold Co."}],"publication_place":null,"extent":"xxiii, 578 p., [4] leaves of plates ; 24 cm","dimensions":null,"identifiers":[{"identifier_type":"isbn","body":"9780442232863"}],"subjects":[],"classfifications":[{"classification_type":"udc","term":"621.38"}],"access_address":null,"items":[{"item_identifier":"204277","shelf":"単行書22"}],"created_at":"1901-01-01T09:00:00.000+09:00","updated_at":"2025-12-15T09:44:09.393+09:00"},{"id":42082,"original_title":"Vacancies and interstitials in metals : proceedings of the International Conference held at Jülich, Germany, 23-28 September 1968","title_alternative":null,"title_transcription":"  ","title_alternative_transcription":null,"pub_date":"1970","statement_of_responsibility":"editors: A. Seeger ... [et al.]","creators":[{"full_name":"International Conference on Vacancies and Interstitials in Metals"},{"full_name":"Seeger, Alfred"}],"contributors":[],"publishers":[{"full_name":"North Holland"},{"full_name":"Sole distributors for the Western Hemisphere, Wiley Interscience Division, John Wiley"}],"publication_place":null,"extent":"xi, 1073 p. ; 25 cm","dimensions":null,"identifiers":[{"identifier_type":"isbn","body":"9780720401547"}],"subjects":[],"classfifications":[{"classification_type":"udc","term":"669.09"}],"access_address":null,"items":[{"item_identifier":"205477","shelf":"単行書26"}],"created_at":"1901-01-01T09:00:00.000+09:00","updated_at":"2025-04-21T15:27:01.441+09:00"},{"id":42083,"original_title":"Scanning electron microscopy 1968 : proceedings of the Symposium on the Scanning Electron Microscope -- the instrument and its applications, held at IIT Research Institute, Chicago, Illnois, USA, April 30-May 1, 1968","title_alternative":null,"title_transcription":"  ","title_alternative_transcription":null,"pub_date":"1968","statement_of_responsibility":null,"creators":[{"full_name":"Scanning Electron Microscope Symposium"},{"full_name":"IIT Research Institute"}],"contributors":[{"full_name":"edited by Om Johari"}],"publishers":[{"full_name":"IIT Research Institute"}],"publication_place":null,"extent":"viii, 185 p. ; 29 cm","dimensions":null,"identifiers":[],"subjects":[],"classfifications":[{"classification_type":"udc","term":"621.385.833"}],"access_address":null,"items":[{"item_identifier":"205651","shelf":"単行書22"}],"created_at":"1901-01-01T09:00:00.000+09:00","updated_at":"2025-12-15T09:44:27.486+09:00"},{"id":42092,"original_title":"Cohesion and structure of surfaces","title_alternative":null,"title_transcription":"  ","title_alternative_transcription":null,"pub_date":"1995","statement_of_responsibility":"contributors, K. Binder ... [et al.]","creators":[{"full_name":"Binder, K. (Kurt)"}],"contributors":[],"publishers":[{"full_name":"North-Holland"}],"publication_place":null,"extent":"viii, 390 p. ; 23 cm","dimensions":null,"identifiers":[{"identifier_type":"isbn","body":"9780444898296"}],"subjects":[],"classfifications":[{"classification_type":"udc","term":"548"}],"access_address":null,"items":[{"item_identifier":"216916","shelf":"単行書17"}],"created_at":"1901-01-01T09:00:00.000+09:00","updated_at":"2025-04-21T11:32:00.786+09:00"},{"id":42093,"original_title":"Diffraction physics","title_alternative":null,"title_transcription":"  ","title_alternative_transcription":null,"pub_date":"1984","statement_of_responsibility":"John M. Cowley","creators":[{"full_name":"Cowley, J. M. (John Maxwell)"}],"contributors":[],"publishers":[{"full_name":"North-Holland"},{"full_name":"Sole distributors for the U.S.A. and Canada, Elsevier Science Pub."}],"publication_place":null,"extent":"xiv, 430 p. ; 23 cm","dimensions":null,"identifiers":[{"identifier_type":"isbn","body":"9780444869258"}],"subjects":[],"classfifications":[{"classification_type":"udc","term":"621.039"}],"access_address":null,"items":[{"item_identifier":"216512","shelf":"単行書20"}],"created_at":"1901-01-01T09:00:00.000+09:00","updated_at":"2025-12-15T09:41:38.763+09:00"},{"id":42099,"original_title":"Investigation of rates and mechanisms of reactions","title_alternative":null,"title_transcription":"  ","title_alternative_transcription":null,"pub_date":"1953","statement_of_responsibility":"editors, S. L. Friess, and A. Weissberger","creators":[{"full_name":"Friess, S. L."},{"full_name":"Weissberger, Arnold"}],"contributors":[],"publishers":[{"full_name":"Interscience"}],"publication_place":null,"extent":"xxiii, 760 p. ; 24 cm","dimensions":null,"identifiers":[],"subjects":[],"classfifications":[{"classification_type":"udc","term":"547"}],"access_address":null,"items":[{"item_identifier":"209605","shelf":"単行書17"}],"created_at":"1901-01-01T09:00:00.000+09:00","updated_at":"2025-12-15T09:39:01.970+09:00"},{"id":42100,"original_title":"Distillation","title_alternative":null,"title_transcription":"  ","title_alternative_transcription":null,"pub_date":"1951","statement_of_responsibility":"contributors, Arthur and Elizabeth Rose ... [et al.]","creators":[{"full_name":"Rose, Arthur"},{"full_name":"Rose, Elizabeth"}],"contributors":[],"publishers":[{"full_name":"Interscience"}],"publication_place":null,"extent":"xxvii, 668 p. ; 24 cm","dimensions":null,"identifiers":[],"subjects":[],"classfifications":[{"classification_type":"udc","term":"547"}],"access_address":null,"items":[{"item_identifier":"209603","shelf":"単行書17"}],"created_at":"1901-01-01T09:00:00.000+09:00","updated_at":"2025-04-21T11:36:11.951+09:00"},{"id":42101,"original_title":"Micro and semimicro methods","title_alternative":null,"title_transcription":"  ","title_alternative_transcription":null,"pub_date":"1954","statement_of_responsibility":"Nicholas D. Cheronis ; with contributions by A.R. Ronzio and T.S. Ma","creators":[{"full_name":"Cheronis, Nicholas Dimitrius"},{"full_name":"Weissberger, Arnold"},{"full_name":"Ronzio, A. R."},{"full_name":"Ma, T. S."}],"contributors":[],"publishers":[{"full_name":"Interscience"}],"publication_place":null,"extent":"xxiii, 628 p. ; 24 cm","dimensions":null,"identifiers":[],"subjects":[],"classfifications":[{"classification_type":"udc","term":"547"}],"access_address":null,"items":[{"item_identifier":"209604","shelf":"単行書17"}],"created_at":"1901-01-01T09:00:00.000+09:00","updated_at":"2025-12-15T09:39:01.857+09:00"}]}