{"total_count":951,"results":[{"id":37605,"original_title":"Diffusion and Defect Data Pt.A Defect and Diffusion Forum Vol.152  Vol.152 with Annual Index","title_alternative":null,"title_transcription":"  ","title_alternative_transcription":null,"pub_date":null,"statement_of_responsibility":null,"creators":[],"contributors":[],"publishers":[{"full_name":"Scitec Publications"}],"publication_place":null,"extent":"264p; 25cm","dimensions":null,"identifiers":[],"subjects":[],"classfifications":[{"classification_type":"udc","term":"548.526"}],"access_address":null,"items":[{"item_identifier":"217593","shelf":"Journal Archives 8"}],"created_at":"1901-12-31T09:00:00.000+09:00","updated_at":"2025-12-15T09:52:36.462+09:00"},{"id":39676,"original_title":"Computerization and networking of materials databases","title_alternative":null,"title_transcription":"  ","title_alternative_transcription":null,"pub_date":"1997","statement_of_responsibility":"Satoshi Nishijima and Shuichi Iwata, editors","creators":[{"full_name":"Nishijima, Satoshi"},{"full_name":"Iwata, Shuichi"}],"contributors":[],"publishers":[{"full_name":"ASTM"}],"publication_place":null,"extent":"1 v. ; 24 cm","dimensions":null,"identifiers":[{"identifier_type":"isbn","body":"9780803124196"}],"subjects":[],"classfifications":[{"classification_type":"udc","term":"STP"}],"access_address":null,"items":[{"item_identifier":"217483","shelf":"Stack 12"}],"created_at":"1901-12-31T09:00:00.000+09:00","updated_at":"2025-12-23T15:16:12.629+09:00"},{"id":39514,"original_title":"Fatigue and fracture in steel bridges : case studies","title_alternative":null,"title_transcription":"  ","title_alternative_transcription":null,"pub_date":"1984","statement_of_responsibility":"John W. Fisher","creators":[{"full_name":"Fisher, John W."}],"contributors":[],"publishers":[{"full_name":"Wiley"}],"publication_place":null,"extent":"xix, 315 p. ; 24 cm","dimensions":null,"identifiers":[{"identifier_type":"isbn","body":"9780471804697"}],"subjects":[],"classfifications":[{"classification_type":"udc","term":"620.17"}],"access_address":null,"items":[{"item_identifier":"210612","shelf":"Books 20"}],"created_at":"1901-12-31T09:00:00.000+09:00","updated_at":"2025-04-21T11:34:57.769+09:00"},{"id":39531,"original_title":"Beam injection assessment of defects in semiconductors : proceedings of the 5th workshop on beam injection assessment of defects in semiconductors held in Parkhotel Schloss Wulkow near Berlin, Germany, August 30-September 3, 1998","title_alternative":null,"title_transcription":"  ","title_alternative_transcription":null,"pub_date":"1998","statement_of_responsibility":"editors. M. Kittler, O. Breitenstein, A. Endros and W. Schroter","creators":[{"full_name":"Kittler, M."},{"full_name":"Breitenstein, O."}],"contributors":[],"publishers":[{"full_name":"Scitec Publications Ltd."}],"publication_place":null,"extent":"xiv, 537 p. ; 25 cm","dimensions":null,"identifiers":[{"identifier_type":"isbn","body":"9783908450399"},{"identifier_type":"issn","body":"10120394"}],"subjects":[],"classfifications":[{"classification_type":"udc","term":"548.526"}],"access_address":null,"items":[{"item_identifier":"217984","shelf":"Journal Archives 8"}],"created_at":"1901-12-31T09:00:00.000+09:00","updated_at":"2025-12-15T09:52:44.699+09:00"},{"id":39231,"original_title":"High pressure experimental methods","title_alternative":null,"title_transcription":"  ","title_alternative_transcription":null,"pub_date":"1996","statement_of_responsibility":"M.I. Eremets","creators":[{"full_name":"Eremets, M. I."}],"contributors":[],"publishers":[{"full_name":"Oxford University"}],"publication_place":null,"extent":"xv, 390 p. ; 25 cm","dimensions":null,"identifiers":[{"identifier_type":"isbn","body":"9780198562696"}],"subjects":[],"classfifications":[{"classification_type":"udc","term":"539.893"}],"access_address":null,"items":[{"item_identifier":"216954","shelf":"Books 12"}],"created_at":"1901-12-31T09:00:00.000+09:00","updated_at":"2026-03-05T15:50:52.273+09:00"},{"id":39262,"original_title":"Laboratory corrosion tests and standards : a symposium by ASTM Committee G-1 on Corrosion of Metals, Bal Harbour, FL, 14-16 Nov. 1983","title_alternative":"Proceedings of the Symposium on Laboratory Corrosion Tests and Standards","title_transcription":"  ","title_alternative_transcription":null,"pub_date":"1985","statement_of_responsibility":"Gardner S. Haynes and Robert Baboian, editors","creators":[{"full_name":"Haynes, Gardner S."},{"full_name":"Baboian, Robert"},{"full_name":"Symposium on Laboratory Corrosion Tests and Standards"},{"full_name":"American Society for Testing and Materials"}],"contributors":[],"publishers":[{"full_name":"ASTM"}],"publication_place":null,"extent":"603 p. ; 24 cm","dimensions":null,"identifiers":[{"identifier_type":"isbn","body":"9780803104433"}],"subjects":[],"classfifications":[{"classification_type":"udc","term":"STP"}],"access_address":null,"items":[{"item_identifier":"207773","shelf":"Stack 12"}],"created_at":"1901-12-31T09:00:00.000+09:00","updated_at":"2025-12-23T15:15:06.820+09:00"},{"id":39263,"original_title":"Galvanic corrosion","title_alternative":null,"title_transcription":"  ","title_alternative_transcription":null,"pub_date":"1988","statement_of_responsibility":"Harvey P. Hack, editor","creators":[{"full_name":"Hack, Harvey P."},{"full_name":"American Society for Testing and Materials. Committee G-1 on Corrosion of Metals"}],"contributors":[],"publishers":[{"full_name":"ASTM"}],"publication_place":null,"extent":"358 p. ; 24 cm","dimensions":null,"identifiers":[{"identifier_type":"isbn","body":"9780803109810"}],"subjects":[],"classfifications":[{"classification_type":"udc","term":"STP"}],"access_address":null,"items":[{"item_identifier":"216580","shelf":"Stack 12"}],"created_at":"1901-12-31T09:00:00.000+09:00","updated_at":"2025-12-23T15:17:15.757+09:00"},{"id":39445,"original_title":"Table of isotopes","title_alternative":null,"title_transcription":"  ","title_alternative_transcription":null,"pub_date":"1996","statement_of_responsibility":"Richard B. Firestone ; Virginia S. Shirley, editor ; assistant editors, Coral M. Baglin, S.Y. Frank Chu, and Jean Zipkin","creators":[{"full_name":"Firestone, Richard B."},{"full_name":"Shirley, Virginia S."}],"contributors":[],"publishers":[{"full_name":"John Wiley"}],"publication_place":null,"extent":"1 v. ; 29 cm","dimensions":null,"identifiers":[{"identifier_type":"isbn","body":"9780471149170"}],"subjects":[],"classfifications":[{"classification_type":"udc","term":"621.039"}],"access_address":null,"items":[{"item_identifier":"216971","shelf":"Stack 8"}],"created_at":"1901-12-31T09:00:00.000+09:00","updated_at":"2025-12-23T15:17:15.871+09:00"},{"id":39470,"original_title":"Diffusion phenomena in thin films and microelectronic materials","title_alternative":null,"title_transcription":"  ","title_alternative_transcription":null,"pub_date":"1988","statement_of_responsibility":"edited by Devendra Gupta and Paul S. Ho","creators":[{"full_name":"Gupta, Devendra"},{"full_name":"Ho, P. S."}],"contributors":[{"full_name":"edited by Devendra Gupta, Paul S. Ho"}],"publishers":[{"full_name":"Noyes Publications"}],"publication_place":null,"extent":"xvi, 588 p. ; 24 cm","dimensions":null,"identifiers":[{"identifier_type":"isbn","body":"9780815511670"}],"subjects":[],"classfifications":[{"classification_type":"udc","term":"538.975"}],"access_address":null,"items":[{"item_identifier":"216403","shelf":"Books 10"}],"created_at":"1901-12-31T09:00:00.000+09:00","updated_at":"2025-12-15T09:31:10.278+09:00"},{"id":39387,"original_title":"A scientific guide to surface mount technology","title_alternative":null,"title_transcription":"  ","title_alternative_transcription":null,"pub_date":"1988","statement_of_responsibility":null,"creators":[{"full_name":"Lea, Colin"}],"contributors":[],"publishers":[{"full_name":"Electrochemical Publications"}],"publication_place":null,"extent":"xvi, 569p ; 24 cm","dimensions":null,"identifiers":[{"identifier_type":"isbn","body":"9780901150226"}],"subjects":[],"classfifications":[],"access_address":null,"items":[{"item_identifier":"208663","shelf":"Books 23"}],"created_at":"1901-12-31T09:00:00.000+09:00","updated_at":"2025-12-15T09:45:10.831+09:00"}]}