{"total_count":2,"results":[{"id":45752,"original_title":"Introduction to analytical electron microscopy","title_alternative":null,"title_transcription":"  ","title_alternative_transcription":null,"pub_date":"1979","statement_of_responsibility":"edited by John J. Hren, Joseph I. Goldstein, and David C. Joy","creators":[{"full_name":"Hren, John J."},{"full_name":"Goldstein, Joseph"},{"full_name":"Joy, David C."},{"full_name":"Electron Microscopy Society of America"},{"full_name":"Microbeam Analysis Society. Conference"}],"contributors":[],"publishers":[{"full_name":"Plenum Press"}],"publication_place":null,"extent":"xv, 601 p. ; 27 cm","dimensions":null,"identifiers":[{"identifier_type":"isbn","body":"9780306402807"}],"subjects":[],"classfifications":[{"classification_type":"udc","term":"537.533.3"}],"access_address":null,"items":[{"item_identifier":"524741","shelf":"単行書9"}],"created_at":"2000-12-26T03:14:01.000+09:00","updated_at":"2025-12-15T09:30:14.671+09:00"},{"id":77060,"original_title":"Physical aspects of electron microscopy and microbeam analysis","title_alternative":null,"title_transcription":"  ","title_alternative_transcription":null,"pub_date":"1975","statement_of_responsibility":"edited by Benjamin M. Siegel and D. R. Beaman","creators":[{"full_name":"Siegel, Benjamin M."},{"full_name":"Electron Microscopy Society of America"},{"full_name":"Beaman, Donald Robert"},{"full_name":"Microbeam Analysis Society"}],"contributors":[{"full_name":"edited by Benjamin M. Siegel, Donald R. Beaman"}],"publishers":[{"full_name":"Wiley"}],"publication_place":null,"extent":"xiii, 474 p. ; 26 cm","dimensions":null,"identifiers":[{"identifier_type":"isbn","body":"9780471790204"}],"subjects":[],"classfifications":[{"classification_type":"udc","term":"621.385.833"}],"access_address":null,"items":[{"item_identifier":"205664","shelf":"単行書22"}],"created_at":"1901-01-01T09:00:00.000+09:00","updated_at":"2025-12-15T09:44:29.701+09:00"}]}