{"total_count":1,"results":[{"id":37525,"original_title":"Gettering and deffect engineering in semiconductor technology : GADEST '95 : proceedings of the 6th International Autumn Meeting, held in Parkhotel Schloß Wulkow, near Berlin, Germany, September 02-07, 1995","title_alternative":null,"title_transcription":"Diffusion and Defect Data Pt.B Solid State Phenomena Vol.44-48  ","title_alternative_transcription":null,"pub_date":"1995","statement_of_responsibility":"editors, H. Richter, M. Kittler and C. Claeys","creators":[{"full_name":"International Autumn Meeting, Gettering and Defect Engineering in Semiconductor Technology"},{"full_name":"Richter, Hans"},{"full_name":"Kittler, Martin"},{"full_name":"Claeys, Cor"}],"contributors":[],"publishers":[{"full_name":"SciTec Publications"}],"publication_place":null,"extent":"xv, 621 p. ; 25 cm","dimensions":null,"identifiers":[],"subjects":[],"classfifications":[{"classification_type":"udc","term":"548.526"}],"access_address":null,"items":[{"item_identifier":"216961","shelf":"集密書庫8"}],"created_at":"1999-05-19T08:59:19.000+09:00","updated_at":"2025-12-15T09:52:41.840+09:00"}]}