{"total_count":1,"results":[{"id":125781,"original_title":"Atomic Scale Characterization and First-Principles Studies of Si?N? Interfaces","title_alternative":"","title_transcription":"","title_alternative_transcription":"","pub_date":"2011","statement_of_responsibility":"Weronika Walkosz","creators":[],"contributors":[],"publishers":[{"full_name":"Springer New York"}],"publication_place":null,"extent":null,"dimensions":null,"identifiers":[],"subjects":[],"classfifications":[],"access_address":"https://link.springer.com/openurl?genre=book\u0026isbn=978-1-4419-7817-2","items":[],"created_at":"2023-03-16T17:57:33.773+09:00","updated_at":"2023-07-14T13:20:34.538+09:00"}]}