{"total_count":3,"results":[{"id":128272,"original_title":"M?ssbauer Spectroscopy","title_alternative":"","title_transcription":"","title_alternative_transcription":"","pub_date":"2013","statement_of_responsibility":"Yutaka Yoshida, Guido Langouche","creators":[],"contributors":[],"publishers":[{"full_name":"Springer Berlin Heidelberg"}],"publication_place":null,"extent":null,"dimensions":null,"identifiers":[],"subjects":[],"classfifications":[],"access_address":"https://link.springer.com/openurl?genre=book\u0026isbn=978-3-642-32220-4","items":[],"created_at":"2023-03-16T18:28:23.215+09:00","updated_at":"2023-07-14T13:34:02.276+09:00"},{"id":127474,"original_title":"ICAME 2011","title_alternative":"","title_transcription":"","title_alternative_transcription":"","pub_date":"2013","statement_of_responsibility":"Yutaka Yoshida","creators":[],"contributors":[],"publishers":[{"full_name":"Springer Netherlands"}],"publication_place":null,"extent":null,"dimensions":null,"identifiers":[],"subjects":[],"classfifications":[],"access_address":"https://link.springer.com/openurl?genre=book\u0026isbn=978-94-007-4762-3","items":[],"created_at":"2023-03-16T18:18:23.179+09:00","updated_at":"2023-07-14T13:29:43.907+09:00"},{"id":126427,"original_title":"Defects and Impurities in Silicon Materials","title_alternative":"","title_transcription":"","title_alternative_transcription":"","pub_date":"2015","statement_of_responsibility":"Yutaka Yoshida, Guido Langouche","creators":[],"contributors":[],"publishers":[{"full_name":"Springer Japan"}],"publication_place":null,"extent":null,"dimensions":null,"identifiers":[],"subjects":[],"classfifications":[],"access_address":"https://link.springer.com/openurl?genre=book\u0026isbn=978-4-431-55800-2","items":[],"created_at":"2023-03-16T18:05:31.029+09:00","updated_at":"2023-07-14T13:23:59.421+09:00"}]}