Metallurgical Thermochemistry. -4th ed.- </titleInfo> <name type="personal"> <namePart>O. Kubaschewski, E.LL. Evans, C.B. Alcock</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>Pergamon Press</publisher> <dateIssued>1967-01-01 00:00:00 +0900</dateIssued> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>495p; 22cm</extent> </physicalDescription> <subject> </subject> <classification authority="udc">541.6</classification> <abstract/> <note/> <recordInfo> <recordCreationDate>2000-12-26 03:00:43 +0900</recordCreationDate> <recordChangeDate>2025-12-15 09:34:59 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/49251</recordIdentifier> </recordInfo> <titleInfo> <title>Diffraction : coherence in optics </titleInfo> <name type="personal"> <namePart>Françon, M. (Maurice)</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>Jeffrey, Barbara</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>Sanders, J. H.</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>Pergamon Press</publisher> <dateIssued/> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>ix, 139 p. ; 20 cm</extent> </physicalDescription> <subject> </subject> <classification authority="udc">535.4</classification> <abstract/> <note>Bibliography: p. 135-137</note> <recordInfo> <recordCreationDate>2000-12-26 03:00:16 +0900</recordCreationDate> <recordChangeDate>2025-12-15 09:28:54 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/487</recordIdentifier> </recordInfo> <titleInfo> <title>High pressure chemistry </titleInfo> <name type="personal"> <namePart>Bradley, R. S. (Rupert Stevenson)</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>Munro, D. C. (Duncan Cottrel)</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>Pergamon Press</publisher> <dateIssued/> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>vii, 186 p. ; 20 cm</extent> </physicalDescription> <subject> </subject> <classification authority="udc">53.09</classification> <abstract/> <note>Includes bibliographies</note> <recordInfo> <recordCreationDate>2000-12-26 03:00:13 +0900</recordCreationDate> <recordChangeDate>2025-12-15 09:27:09 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/77947</recordIdentifier> </recordInfo> <titleInfo> <title>Thermal conduction in semiconductors </titleInfo> <name type="personal"> <namePart>Drabble, J. R.</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>Goldsmid, H. J.</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>Pergamon Press</publisher> <dateIssued/> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>ix, 235 p. ; 24 cm</extent> </physicalDescription> <subject> </subject> <classification authority="udc">539</classification> <abstract/> <note>Includes bibliographical references (p. 225-228) and indexes</note> <recordInfo> <recordCreationDate>2000-12-26 03:00:11 +0900</recordCreationDate> <recordChangeDate>2025-12-15 09:31:25 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/663</recordIdentifier> </recordInfo> <titleInfo> <title>Electrical properties of semiconductor surfaces </titleInfo> <name type="personal"> <namePart>Frankl, Daniel R.</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>Pergamon Press</publisher> <dateIssued/> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>xv, 310 p. ; 23 cm</extent> </physicalDescription> <subject> </subject> <classification authority="udc">537.3</classification> <abstract/> <note>Bibliography: p. 291-303</note> <recordInfo> <recordCreationDate>2000-12-26 02:59:24 +0900</recordCreationDate> <recordChangeDate>2025-12-15 09:29:38 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/562</recordIdentifier> </recordInfo> <titleInfo> <title>Trace analysis of semiconductor materials </titleInfo> <name type="personal"> <namePart>Cali, J. Paul</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>Pergamon Press</publisher> <dateIssued/> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>ix, 282 p. ; 24 cm</extent> </physicalDescription> <subject> </subject> <classification authority="udc">543.4</classification> <abstract/> <note>Includes bibliographies</note> <recordInfo> <recordCreationDate>2000-12-26 02:59:20 +0900</recordCreationDate> <recordChangeDate>2025-12-15 09:36:08 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/552</recordIdentifier> </recordInfo> <titleInfo> <title>Crystal growth : proceedings of an International Conference on Crystal Growth, Boston, 20-24 June 1966 </titleInfo> <name type="personal"> <namePart>International Conference on Crystal Growth</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>Peiser, H. Steffen (Herbert Steffen)</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>Air Force Cambridge Research Laboratories (U.S.)</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>International Union of Pure and Applied Physics. Commission on the Solid State</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>Symposium Publications Division, Pergamon Press</publisher> <dateIssued/> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>xix, 856 p. ; 26 cm</extent> </physicalDescription> <subject> </subject> <classification authority="udc">548.5</classification> <abstract/> <note>Sponsored by the Air Force Cambridge Research Laboratories and the Solid State Commission of the International Union of Pure and Applied Physics//Includes bibliographies</note> <recordInfo> <recordCreationDate>2000-12-26 02:59:20 +0900</recordCreationDate> <recordChangeDate>2025-12-15 09:39:46 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/553</recordIdentifier> </recordInfo> <titleInfo> <title>Progress in metal physics </titleInfo> <name type="personal"> <namePart>Chalmers, Bruce</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>Pergamon Press</publisher> <dateIssued/> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>1 v. ; 26 cm</extent> </physicalDescription> <subject> </subject> <classification authority="udc">546.3</classification> <abstract/> <note>Vol. 7-8 edited by Bruce Chalmers and R. King//Vol. 1-2 published by Butterworths Scientific Publications</note> <recordInfo> <recordCreationDate>2000-12-26 02:59:12 +0900</recordCreationDate> <recordChangeDate>2025-12-15 09:38:51 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/535</recordIdentifier> </recordInfo> <titleInfo> <title>Oscillometry and conductometry Oszcillometria és konduktometria Pungor, E. (Ernő) creator text Pergamon Press unknown eng
volume
xvi, 239 p. ; 23 cm 543.4 Bibliography: p. 212-223 2000-12-26 02:59:06 +0900 2025-12-15 09:36:19 +0900 https://library.nims.go.jp/manifestations/523 Supplemental tables of molecular orbital calculations Supplemental tables of molecular orbital calculations with a Dictionary of π-electron calculations Streitwieser, Andrew creator Brauman, J. I. (John I.) creator text Pergamon Press unknown eng
volume
1 v. ; 31 cm (083)539.19 The Dictionary of π-electron calculations has also been issued separately 2000-12-26 02:57:55 +0900 2025-12-15 09:23:32 +0900 https://library.nims.go.jp/manifestations/359