Quantitative microscopy DeHoff, Robert T. creator Rhines, Frederick Nims creator University of Florida creator text McGraw-Hill unknown eng
volume
x, 422 p ; 23 cm 535.8 "Papers presented at a symposium ... held at the University of Florida in February of 1961"//Includes bibliographies 2000-12-26 03:08:58 +0900 2025-12-15 09:28:59 +0900 https://library.nims.go.jp/manifestations/76251 Ion implantation </titleInfo> <name type="personal"> <namePart>International Conference on Ion Implantation in Semiconductors</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>Eisen, Fred H.</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>Chadderton, Lewis T.</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>Gordon and Breach Science Publishers</publisher> <dateIssued/> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>xii, 464 p. ; 27 cm</extent> </physicalDescription> <subject> </subject> <classification authority="udc">539.2</classification> <abstract/> <note>1st International Conference on Ion Implantation in Semiconductors held in Thousand Oaks, California, May 4-9th, 1970//Includes bibliographical references</note> <identifier type="isbn">9780677150000</identifier> <recordInfo> <recordCreationDate>2000-12-26 03:08:42 +0900</recordCreationDate> <recordChangeDate>2025-12-15 09:32:19 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/1654</recordIdentifier> </recordInfo> <titleInfo> <title>Proceedings of the Sixth International Conference on X-ray optics and microanalysis </titleInfo> <name type="personal"> <namePart>International Congress on X-ray Optics and Microanalysis</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>Shinoda, G.</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>高良, 和武</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>市ノ川, 竹男</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>Tokyo Press</publisher> <dateIssued/> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>xi, 908 p. ; 26 cm</extent> </physicalDescription> <subject> </subject> <classification authority="udc">548.7</classification> <abstract/> <note>Includes bibliographies//The Conference held at Osaka, September 5-10, 1971</note> <recordInfo> <recordCreationDate>2000-12-26 03:08:40 +0900</recordCreationDate> <recordChangeDate>2025-12-15 09:40:06 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/1650</recordIdentifier> </recordInfo> <titleInfo> <title>Electron diffraction </titleInfo> <name type="personal"> <namePart>Rymer, T. 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