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<note>Includes index//1978, April 17-21, Los Angeles, California//1978-1 : an international review of advances in instrumentation, techniques, theory and physical applications of the scannig electron microscope / ed. by Om Johari ..t.p.//1979, pt 1 - pt 3 : "an international review of advances in techniques and applications of the scanning electron microscope"--T.p.</note>
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<note>pt. 1. Concepts//pt. 2. Implementation//Includes bibliographical references</note>
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