<?xml version="1.0" encoding="UTF-8"?>
<modsCollection xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns="http://www.loc.gov/mods/v3">
<titleInfo>
  <title>Microscopy and Microanalysis</title>
</titleInfo>
<titleInfo type="alternative">
  <title></title>
</titleInfo>
<name type="personal">
  <namePart>Microscopy Society of America</namePart>
  <role>
    <roleTerm type="text" authority="marcrelator">creator</roleTerm>
  </role>
</name>
<name type="personal">
  <namePart>Microbeam Analysis Society</namePart>
  <role>
    <roleTerm type="text" authority="marcrelator">creator</roleTerm>
  </role>
</name>
<name type="personal">
  <namePart>Microscopical Society of Canada</namePart>
  <role>
    <roleTerm type="text" authority="marcrelator">creator</roleTerm>
  </role>
</name>
<name type="personal">
  <namePart>Mexican Microscopy Society</namePart>
  <role>
    <roleTerm type="text" authority="marcrelator">creator</roleTerm>
  </role>
</name>
<name type="personal">
  <namePart>Brazilian Society for Microscopy and Microanalysis</namePart>
  <role>
    <roleTerm type="text" authority="marcrelator">creator</roleTerm>
  </role>
</name>
<typeOfResource>text</typeOfResource>
<originInfo>
  <publisher>Springer-Verlag</publisher>
  <dateIssued/>
  <frequency>unknown</frequency>
</originInfo>
<language>
  <languageTerm authority="iso639-2b" type="code">eng</languageTerm>
</language>
<physicalDescription>
  <form authority="marcform">volume</form>
  <extent></extent>
</physicalDescription>
<subject>
</subject>
<abstract/>
<note>【配架場所】並木 集密書庫29
</note>
<recordInfo>
  <recordCreationDate>2019-03-21 02:33:07 +0900</recordCreationDate>
  <recordChangeDate>2026-05-18 10:17:42 +0900</recordChangeDate>
  <recordIdentifier>https://library.nims.go.jp/manifestations/123439</recordIdentifier>
</recordInfo>
<titleInfo>
  <title>Introduction to analytical electron microscopy</title>
</titleInfo>
<titleInfo type="alternative">
  <title/>
</titleInfo>
<name type="personal">
  <namePart>Hren, John J.</namePart>
  <role>
    <roleTerm type="text" authority="marcrelator">creator</roleTerm>
  </role>
</name>
<name type="personal">
  <namePart>Goldstein, Joseph</namePart>
  <role>
    <roleTerm type="text" authority="marcrelator">creator</roleTerm>
  </role>
</name>
<name type="personal">
  <namePart>Joy, David C.</namePart>
  <role>
    <roleTerm type="text" authority="marcrelator">creator</roleTerm>
  </role>
</name>
<name type="personal">
  <namePart>Electron Microscopy Society of America</namePart>
  <role>
    <roleTerm type="text" authority="marcrelator">creator</roleTerm>
  </role>
</name>
<name type="personal">
  <namePart>Microbeam Analysis Society. Conference</namePart>
  <role>
    <roleTerm type="text" authority="marcrelator">creator</roleTerm>
  </role>
</name>
<typeOfResource>text</typeOfResource>
<originInfo>
  <publisher>Plenum Press</publisher>
  <dateIssued/>
  <frequency>unknown</frequency>
</originInfo>
<language>
  <languageTerm authority="iso639-2b" type="code">eng</languageTerm>
</language>
<physicalDescription>
  <form authority="marcform">volume</form>
  <extent>xv, 601 p. ; 27 cm</extent>
</physicalDescription>
<subject>
</subject>
<classification authority="udc">537.533.3</classification>
<abstract/>
<note>"Proceedings of a workshop on analytical electron microscopy, held in San Antonio, Texas, August 13-14, 1979, as part of the joint meeting of the Electron Microscopy Society of America and the Microbeam Analysis Society."//Includes bibliographies and index</note>
<identifier type="isbn">9780306402807</identifier>
<recordInfo>
  <recordCreationDate>2000-12-26 03:14:01 +0900</recordCreationDate>
  <recordChangeDate>2025-12-15 09:30:14 +0900</recordChangeDate>
  <recordIdentifier>https://library.nims.go.jp/manifestations/45752</recordIdentifier>
</recordInfo>
<titleInfo>
  <title>Physical aspects of electron microscopy and microbeam analysis</title>
</titleInfo>
<titleInfo type="alternative">
  <title/>
</titleInfo>
<name type="personal">
  <namePart>Siegel, Benjamin M.</namePart>
  <role>
    <roleTerm type="text" authority="marcrelator">creator</roleTerm>
  </role>
</name>
<name type="personal">
  <namePart>Electron Microscopy Society of America</namePart>
  <role>
    <roleTerm type="text" authority="marcrelator">creator</roleTerm>
  </role>
</name>
<name type="personal">
  <namePart>Beaman, Donald Robert</namePart>
  <role>
    <roleTerm type="text" authority="marcrelator">creator</roleTerm>
  </role>
</name>
<name type="personal">
  <namePart>Microbeam Analysis Society</namePart>
  <role>
    <roleTerm type="text" authority="marcrelator">creator</roleTerm>
  </role>
</name>
<name type="personal">
  <namePart>edited by Benjamin M. Siegel, Donald R. Beaman</namePart>
</name>
<typeOfResource>text</typeOfResource>
<originInfo>
  <publisher>Wiley</publisher>
  <dateIssued/>
  <frequency>unknown</frequency>
</originInfo>
<language>
  <languageTerm authority="iso639-2b" type="code">eng</languageTerm>
</language>
<physicalDescription>
  <form authority="marcform">volume</form>
  <extent>xiii, 474 p. ; 26 cm</extent>
</physicalDescription>
<subject>
</subject>
<classification authority="udc">621.385.833</classification>
<abstract/>
<note>Expanded versions of papers presented at the joint meetings of the Electron Microscopy Society of America and the Microbeam Analysis Society, held in New Orleans, Aug. 14-17, 1973//"A Wiley biomedical-health publication."//Includes bibliographical references and index</note>
<identifier type="isbn">9780471790204</identifier>
<recordInfo>
  <recordCreationDate>1901-01-01 09:00:00 +0900</recordCreationDate>
  <recordChangeDate>2025-12-15 09:44:29 +0900</recordChangeDate>
  <recordIdentifier>https://library.nims.go.jp/manifestations/77060</recordIdentifier>
</recordInfo>
</modsCollection>
