Beam Injection Assessment of Microstructures in Semiconductors: Biams 2000 Hajime,Tomokage creator Takashi,Sekiguchi. creator text 2000-01-01 00:00:00 +0900 unknown eng
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ⅷ,441 p. ; 24 cm 621.38 9783908450610 2021-03-09 15:06:29 +0900 2025-12-15 09:44:14 +0900 https://library.nims.go.jp/manifestations/124417 Beam Injection Assessment of Microstructures in Semiconductors BIAMS 2000: Proceedings of the 6th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors held in Fukuoka, Japan, November 12-16, 2000 Vols. 78-79 </titleInfo> <name type="personal"> <namePart>Editors: Hajime Tomokage, Takashi Sekiguchi</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>Scitec Publications Ltd</publisher> <dateIssued>2001-01-01 00:00:00 +0900</dateIssued> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>441p; 25cm</extent> </physicalDescription> <subject> </subject> <classification authority="udc">548.526</classification> <abstract/> <note/> <identifier type="isbn">9783908450610</identifier> <recordInfo> <recordCreationDate>2001-06-06 23:11:26 +0900</recordCreationDate> <recordChangeDate>2025-12-15 09:52:45 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/39567</recordIdentifier> </recordInfo> </modsCollection>