Polycrystalline metal and magnetic thin films-2000 : symposium held April 25-27, 2000, San Francisco, California, U.S.A. </titleInfo> <name type="personal"> <namePart>Clemens, Bruce M</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>Materials Research Society</publisher> <dateIssued/> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>1 v. ; 24 cm</extent> </physicalDescription> <subject> </subject> <classification authority="udc">MRS</classification> <abstract/> <note>Includes bibliographical references</note> <identifier type="isbn">9781558995239</identifier> <recordInfo> <recordCreationDate>2001-08-09 23:49:35 +0900</recordCreationDate> <recordChangeDate>2025-12-03 16:34:40 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/39794</recordIdentifier> </recordInfo> <titleInfo> <title>Si front-end processing - physics and technology of dopant-defect interactions II : symposium held April 24-27, 2000, San Francisco, California, U.S.A. </titleInfo> <name type="personal"> <namePart>Agarwal, Aditya</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>Materials Research Society</publisher> <dateIssued/> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>1 v. ; 24 cm</extent> </physicalDescription> <subject> </subject> <classification authority="udc">MRS</classification> <abstract/> <note>Includes bibliographical references and indexes</note> <identifier type="isbn">9781558995185</identifier> <recordInfo> <recordCreationDate>2001-08-09 23:30:35 +0900</recordCreationDate> <recordChangeDate>2025-12-03 16:34:39 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/43269</recordIdentifier> </recordInfo> <titleInfo> <title>Magnetic materials, structures and processing for information storage: symposium held April 24-27, 2000, San Francisco, California, U.S.A. </titleInfo> <name type="personal"> <namePart>Daniels, Brian J.</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>Nolan, Tom P.</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>Seigler, Michael A.</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>Wang, Shan X.</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>Murray, Christopher B.</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>Materials Research Society</publisher> <dateIssued/> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>1 v. (unpaged) ; 24 cm</extent> </physicalDescription> <subject> </subject> <classification authority="udc">MRS</classification> <abstract/> <note>Includes bibliographical references and indexes</note> <identifier type="isbn">9781558995222</identifier> <recordInfo> <recordCreationDate>2001-06-12 01:49:51 +0900</recordCreationDate> <recordChangeDate>2025-12-03 16:34:39 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/40440</recordIdentifier> </recordInfo> <titleInfo> <title>Laser-solid interactions for materials processing : symposium held April 25-27, 2000, San Francisco, California, U.S.A. </titleInfo> <name type="personal"> <namePart>Kumar, D.</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>Materials Research Society</publisher> <dateIssued/> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>1 v. (various pagings) ; 24 cm</extent> </physicalDescription> <subject> </subject> <classification authority="udc">MRS</classification> <abstract/> <note>Includes bibliographical references and indexes</note> <identifier type="isbn">9781558995253</identifier> <recordInfo> <recordCreationDate>2001-06-12 01:29:41 +0900</recordCreationDate> <recordChangeDate>2025-12-03 16:34:40 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/39524</recordIdentifier> </recordInfo> <titleInfo> <title>Gate stack and silicide issues in silicon processing : symposium held April 25-27, 2000, San Francisco, California, U.S.A. </titleInfo> <name type="personal"> <namePart>Clevenger, L. A.</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>Materials Research Society</publisher> <dateIssued/> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>1 v. (various pagings) ; 24 cm</extent> </physicalDescription> <subject> </subject> <classification authority="udc">MRS</classification> <abstract/> <note>Includes bibliographical references and indexes</note> <identifier type="isbn">9781558995192</identifier> <recordInfo> <recordCreationDate>2001-06-12 00:40:16 +0900</recordCreationDate> <recordChangeDate>2025-12-03 16:34:39 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/39523</recordIdentifier> </recordInfo> <titleInfo> <title>Thermoelectric materials 2000 : the next generation materials for small-scale refrigeration and power generation applications : symposium held April 24-27, 2000, San Francisco, California, U.S.A </titleInfo> <name type="personal"> <namePart>Tritt, Terry M.</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>Nolas, George S.</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>Mahan, Gerald D.</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>Mandrus, David</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>Kanatzidis, Mercouri G.</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>Materials Research Society</publisher> <dateIssued/> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>1 v. (unpaged) ; 24 cm</extent> </physicalDescription> <subject> </subject> <classification authority="udc">MRS</classification> <abstract/> <note>Includes bibliographical references and index</note> <identifier type="isbn">9781558995345</identifier> <recordInfo> <recordCreationDate>2001-06-06 20:38:38 +0900</recordCreationDate> <recordChangeDate>2025-12-03 16:34:40 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/39530</recordIdentifier> </recordInfo> <titleInfo> <title>Nondestructive methods for materials characterization : symposium held November 29-30, 1999, Boston, Massachusetts, U.S.A. </titleInfo> <name type="personal"> <namePart>Baaklini, George Y.</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>Materials Research Society. Meeting</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>Materials Research Society</publisher> <dateIssued/> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>xiii, 322 p. ; 24 cm</extent> </physicalDescription> <subject> </subject> <classification authority="udc">MRS</classification> <abstract/> <note>Includes bibliographical references and indexes</note> <identifier type="isbn">9781558994997</identifier> <recordInfo> <recordCreationDate>2001-06-01 02:23:55 +0900</recordCreationDate> <recordChangeDate>2025-12-03 16:34:37 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/39520</recordIdentifier> </recordInfo> <titleInfo> <title>Optical microstructural characterization of semiconductors : sympoisum held November 29-30, 1999, Boston, Massachusetts, U.S.A. </titleInfo> <name type="personal"> <namePart>Ünlü, M. Selim</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>Symposium on Optical Microstructural Characterization of Semiconductors</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>Materials Research Society</publisher> <dateIssued/> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>xi, 333 p. ; 24 cm</extent> </physicalDescription> <subject> </subject> <classification authority="udc">MRS</classification> <abstract/> <note>Symposium P, "Optical Microstructural Characterization of Semiconductors," at the 1999 MRS Fall Meeting in Boston, Massachusetts//Includes bibliographical references and index</note> <identifier type="isbn">9781558994966</identifier> <recordInfo> <recordCreationDate>2001-05-31 23:21:56 +0900</recordCreationDate> <recordChangeDate>2025-12-03 16:34:37 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/43243</recordIdentifier> </recordInfo> <titleInfo> <title>Solid freeform and additive fabrication--2000 : symposium held April 24-26, 2000, San Francisco, California, U.S.A. </titleInfo> <name type="personal"> <namePart>Dimos, Duane</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>Danforth, Stephen C.</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>Prinz, Fritz B.</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>Materials Research Society</publisher> <dateIssued/> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>ix, 220 p. ; 24 cm</extent> </physicalDescription> <subject> </subject> <classification authority="udc">MRS</classification> <abstract/> <note>Includes bibliographical references</note> <identifier type="isbn">9781558995338</identifier> <recordInfo> <recordCreationDate>2001-03-26 22:57:15 +0900</recordCreationDate> <recordChangeDate>2025-12-03 16:34:40 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/39373</recordIdentifier> </recordInfo> <titleInfo> <title>Materials science of microelectromechanical systems (MEMS) devices II : symposium held November 29-December 1, 1999, Boston, Massachusetts, U.S.A. Materials science of microelectromechanical systems (MEMS) devices 2 P. de Boer, Maarten creator text Materials Research Society unknown eng
volume
xiii, 314 p. ; 24 cm MRS Includes bibliographical references and indexes 9781558995130 2001-03-26 22:51:36 +0900 2025-12-03 16:34:39 +0900 https://library.nims.go.jp/manifestations/39372