<?xml version="1.0" encoding="UTF-8"?>
<modsCollection xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns="http://www.loc.gov/mods/v3">
<titleInfo>
  <title>Kinetic and Electrodynamic Phenomena in Classical and Quantum Semiconductor Superlattices</title>
</titleInfo>
<titleInfo type="alternative">
  <title/>
</titleInfo>
<name type="personal">
  <namePart>Bass.F.G. Bulgakor.A.A.'</namePart>
  <role>
    <roleTerm type="text" authority="marcrelator">creator</roleTerm>
  </role>
</name>
<typeOfResource>text</typeOfResource>
<originInfo>
  <publisher>Nova Science</publisher>
  <dateIssued>1997-01-01 00:00:00 +0900</dateIssued>
  <frequency>unknown</frequency>
</originInfo>
<language>
  <languageTerm authority="iso639-2b" type="code">eng</languageTerm>
</language>
<physicalDescription>
  <form authority="marcform">volume</form>
  <extent>498p; 24cm</extent>
</physicalDescription>
<subject>
</subject>
<classification authority="udc">537.31</classification>
<abstract/>
<note/>
<recordInfo>
  <recordCreationDate>2000-12-26 03:17:30 +0900</recordCreationDate>
  <recordChangeDate>2025-12-15 09:29:45 +0900</recordChangeDate>
  <recordIdentifier>https://library.nims.go.jp/manifestations/2558</recordIdentifier>
</recordInfo>
<titleInfo>
  <title>Space-group symmetry</title>
</titleInfo>
<titleInfo type="alternative">
  <title></title>
</titleInfo>
<name type="personal">
  <namePart>Hahn, Theo</namePart>
  <role>
    <roleTerm type="text" authority="marcrelator">creator</roleTerm>
  </role>
</name>
<name type="corporate">
  <namePart>International Union of Crystallography</namePart>
  <role>
    <roleTerm type="text" authority="marcrelator">creator</roleTerm>
  </role>
</name>
<typeOfResource>text</typeOfResource>
<originInfo>
  <publisher>Published for the International Union of Crystallography by Kluwer Academic Pub</publisher>
  <dateIssued/>
  <frequency>unknown</frequency>
</originInfo>
<language>
  <languageTerm authority="iso639-2b" type="code">eng</languageTerm>
</language>
<physicalDescription>
  <form authority="marcform">volume</form>
  <extent>vi, 154 p. ; 31 cm</extent>
</physicalDescription>
<subject>
</subject>
<classification authority="udc">548.7</classification>
<abstract/>
<note>Includes index</note>
<identifier type="isbn">9780792342526</identifier>
<recordInfo>
  <recordCreationDate>2000-12-26 03:17:27 +0900</recordCreationDate>
  <recordChangeDate>2025-12-15 09:39:59 +0900</recordChangeDate>
  <recordIdentifier>https://library.nims.go.jp/manifestations/68970</recordIdentifier>
</recordInfo>
<titleInfo>
  <title>Surface preparation and microscopy of materials</title>
</titleInfo>
<titleInfo type="alternative">
  <title/>
</titleInfo>
<name type="personal">
  <namePart>Bousfield, Brian</namePart>
  <role>
    <roleTerm type="text" authority="marcrelator">creator</roleTerm>
  </role>
</name>
<typeOfResource>text</typeOfResource>
<originInfo>
  <publisher>Wiley</publisher>
  <dateIssued/>
  <frequency>unknown</frequency>
</originInfo>
<language>
  <languageTerm authority="iso639-2b" type="code">eng</languageTerm>
</language>
<physicalDescription>
  <form authority="marcform">volume</form>
  <extent>xiv , 345 p., 24 p. of plates ; 26 cm</extent>
</physicalDescription>
<subject>
</subject>
<classification authority="udc">621.385</classification>
<abstract/>
<note>Includes bibliographical references and index</note>
<identifier type="isbn">9780471931812</identifier>
<recordInfo>
  <recordCreationDate>2000-12-26 03:17:26 +0900</recordCreationDate>
  <recordChangeDate>2025-12-15 09:44:21 +0900</recordChangeDate>
  <recordIdentifier>https://library.nims.go.jp/manifestations/2555</recordIdentifier>
</recordInfo>
<titleInfo>
  <title>Electron microscopy : principles and fundamentals</title>
</titleInfo>
<titleInfo type="alternative">
  <title/>
</titleInfo>
<name type="personal">
  <namePart>Amelinckx, Severin</namePart>
  <role>
    <roleTerm type="text" authority="marcrelator">creator</roleTerm>
  </role>
</name>
<name type="personal">
  <namePart>edited by S. Amelinckx, D.van Dyck, J.van Landuyt, G.van Tendeloo</namePart>
</name>
<typeOfResource>text</typeOfResource>
<originInfo>
  <publisher>VCH</publisher>
  <dateIssued/>
  <frequency>unknown</frequency>
</originInfo>
<language>
  <languageTerm authority="iso639-2b" type="code">eng</languageTerm>
</language>
<physicalDescription>
  <form authority="marcform">volume</form>
  <extent>xii, 515 p. ; 25 cm</extent>
</physicalDescription>
<subject>
</subject>
<classification authority="udc">621.385</classification>
<abstract/>
<note>Includes bibliographical references and index</note>
<identifier type="isbn">9783527294794</identifier>
<recordInfo>
  <recordCreationDate>2000-12-26 03:17:26 +0900</recordCreationDate>
  <recordChangeDate>2025-12-15 09:44:19 +0900</recordChangeDate>
  <recordIdentifier>https://library.nims.go.jp/manifestations/65755</recordIdentifier>
</recordInfo>
<titleInfo>
  <title>An introduction to X-ray crystallography</title>
</titleInfo>
<titleInfo type="alternative">
  <title/>
</titleInfo>
<name type="personal">
  <namePart>Woolfson, M. M.</namePart>
  <role>
    <roleTerm type="text" authority="marcrelator">creator</roleTerm>
  </role>
</name>
<typeOfResource>text</typeOfResource>
<originInfo>
  <publisher>Cambridge University Press</publisher>
  <dateIssued/>
  <frequency>unknown</frequency>
</originInfo>
<language>
  <languageTerm authority="iso639-2b" type="code">eng</languageTerm>
</language>
<physicalDescription>
  <form authority="marcform">volume</form>
  <extent>xii, 402 p. ; 25 cm</extent>
</physicalDescription>
<subject>
</subject>
<classification authority="udc">548.7</classification>
<abstract/>
<note>Includes bibliographical references (p. 395-398) and index</note>
<identifier type="isbn">9780521412711</identifier>
<recordInfo>
  <recordCreationDate>2000-12-26 03:17:20 +0900</recordCreationDate>
  <recordChangeDate>2025-12-15 09:40:07 +0900</recordChangeDate>
  <recordIdentifier>https://library.nims.go.jp/manifestations/77852</recordIdentifier>
</recordInfo>
<titleInfo>
  <title>Powder diffraction file</title>
</titleInfo>
<titleInfo type="alternative">
  <title>Powder diffraction file : data book//PDF</title>
</titleInfo>
<name type="personal">
  <namePart>Joint Committee on Powder Diffraction Standards</namePart>
  <role>
    <roleTerm type="text" authority="marcrelator">creator</roleTerm>
  </role>
</name>
<name type="personal">
  <namePart>JCPDS-International Centre for Diffraction Data</namePart>
  <role>
    <roleTerm type="text" authority="marcrelator">creator</roleTerm>
  </role>
</name>
<name type="corporate">
  <namePart>American Society for Testing and Materials</namePart>
  <role>
    <roleTerm type="text" authority="marcrelator">creator</roleTerm>
  </role>
</name>
<name type="personal">
  <namePart>American Ceramic Society</namePart>
  <role>
    <roleTerm type="text" authority="marcrelator">creator</roleTerm>
  </role>
</name>
<typeOfResource>text</typeOfResource>
<originInfo>
  <publisher>Joint Committee on Powder Diffraction Standards</publisher>
  <dateIssued/>
  <frequency>unknown</frequency>
</originInfo>
<language>
  <languageTerm authority="iso639-2b" type="code">eng</languageTerm>
</language>
<physicalDescription>
  <form authority="marcform">volume</form>
  <extent>1 v. ; 24 cm</extent>
</physicalDescription>
<subject>
</subject>
<classification authority="udc">(083.6)54</classification>
<abstract/>
<note>Sets 19-20-: compiled by the JCPDS - International Centre for Diffraction Data in cooperation with the American Society for Testing Materials ... [et al.]//Set 42-: compiled by the ICDD--International Centre for Diffraction Data in cooperation with : American Ceramic Society ... [et al.]</note>
<recordInfo>
  <recordCreationDate>2000-12-26 03:17:19 +0900</recordCreationDate>
  <recordChangeDate>2025-12-15 09:23:10 +0900</recordChangeDate>
  <recordIdentifier>https://library.nims.go.jp/manifestations/2546</recordIdentifier>
</recordInfo>
<titleInfo>
  <title>Stability of materials</title>
</titleInfo>
<titleInfo type="alternative">
  <title/>
</titleInfo>
<name type="personal">
  <namePart>Gonis, Antonios</namePart>
  <role>
    <roleTerm type="text" authority="marcrelator">creator</roleTerm>
  </role>
</name>
<name type="personal">
  <namePart>Turchi, Patrice E. A.</namePart>
  <role>
    <roleTerm type="text" authority="marcrelator">creator</roleTerm>
  </role>
</name>
<name type="personal">
  <namePart>Kudrnovsky, Josef</namePart>
  <role>
    <roleTerm type="text" authority="marcrelator">creator</roleTerm>
  </role>
</name>
<name type="personal">
  <namePart>North Atlantic Treaty Organization. Scientific Affairs Division</namePart>
  <role>
    <roleTerm type="text" authority="marcrelator">creator</roleTerm>
  </role>
</name>
<name type="personal">
  <namePart>NATO Advanced Study Institute on Stability of Materials</namePart>
  <role>
    <roleTerm type="text" authority="marcrelator">creator</roleTerm>
  </role>
</name>
<name type="personal">
  <namePart>edited by A. Gonis, P.E.A. Turchi, Josef Kudrnovsky</namePart>
</name>
<typeOfResource>text</typeOfResource>
<originInfo>
  <publisher>Plenum Press</publisher>
  <dateIssued/>
  <frequency>unknown</frequency>
</originInfo>
<language>
  <languageTerm authority="iso639-2b" type="code">eng</languageTerm>
</language>
<physicalDescription>
  <form authority="marcform">volume</form>
  <extent>xiii, 746 p. ; 26 cm</extent>
</physicalDescription>
<subject>
</subject>
<classification authority="udc">539</classification>
<abstract/>
<note>"Published in cooperation with NATO Scientific Affairs Division."//"Proceedings of a NATO Advanced Study Institute on Stability of Materials, held June 25-July 7, 1994, in Corfu, Greece"--T.p. verso//Includes bibliographical references and index</note>
<identifier type="isbn">9780306453113</identifier>
<recordInfo>
  <recordCreationDate>2000-12-26 03:17:18 +0900</recordCreationDate>
  <recordChangeDate>2025-12-15 09:31:22 +0900</recordChangeDate>
  <recordIdentifier>https://library.nims.go.jp/manifestations/76151</recordIdentifier>
</recordInfo>
<titleInfo>
  <title>Transmission electron microscopy : a textbook for materials science</title>
</titleInfo>
<titleInfo type="alternative">
  <title/>
</titleInfo>
<name type="personal">
  <namePart>Williams, David B. (David Bernard)</namePart>
  <role>
    <roleTerm type="text" authority="marcrelator">creator</roleTerm>
  </role>
</name>
<name type="personal">
  <namePart>Carter, C. Barry</namePart>
  <role>
    <roleTerm type="text" authority="marcrelator">creator</roleTerm>
  </role>
</name>
<typeOfResource>text</typeOfResource>
<originInfo>
  <publisher>Plenum Press</publisher>
  <dateIssued/>
  <frequency>unknown</frequency>
</originInfo>
<language>
  <languageTerm authority="iso639-2b" type="code">eng</languageTerm>
</language>
<physicalDescription>
  <form authority="marcform">volume</form>
  <extent>xxvii, 729 p. ; 29 cm</extent>
</physicalDescription>
<subject>
</subject>
<classification authority="udc">681.723.21</classification>
<abstract/>
<note>Includes bibliographical references and index</note>
<identifier type="isbn">9780306452475</identifier>
<recordInfo>
  <recordCreationDate>2000-12-26 03:17:16 +0900</recordCreationDate>
  <recordChangeDate>2025-12-15 09:49:31 +0900</recordChangeDate>
  <recordIdentifier>https://library.nims.go.jp/manifestations/77113</recordIdentifier>
</recordInfo>
<titleInfo>
  <title>Atomic calculation of photoionization cross-sections and asymmetry parameters</title>
</titleInfo>
<titleInfo type="alternative">
  <title/>
</titleInfo>
<name type="personal">
  <namePart>Yeh, J.-J</namePart>
  <role>
    <roleTerm type="text" authority="marcrelator">creator</roleTerm>
  </role>
</name>
<typeOfResource>text</typeOfResource>
<originInfo>
  <publisher>Gordon &amp; Breach Science, Publishers</publisher>
  <dateIssued/>
  <frequency>unknown</frequency>
</originInfo>
<language>
  <languageTerm authority="iso639-2b" type="code">eng</languageTerm>
</language>
<physicalDescription>
  <form authority="marcform">volume</form>
  <extent>223 p. ; 23 x 29 cm</extent>
</physicalDescription>
<subject>
</subject>
<classification authority="udc">543.428</classification>
<abstract/>
<note>Accompanied by 2 diskettes//Includes bibliographical references (p. 11)</note>
<identifier type="isbn">9782881245855</identifier>
<recordInfo>
  <recordCreationDate>2000-12-26 03:17:14 +0900</recordCreationDate>
  <recordChangeDate>2025-12-15 09:36:27 +0900</recordChangeDate>
  <recordIdentifier>https://library.nims.go.jp/manifestations/2543</recordIdentifier>
</recordInfo>
<titleInfo>
  <title>Inorganic chemistry : principles of structure and reactivity</title>
</titleInfo>
<titleInfo type="alternative">
  <title/>
</titleInfo>
<name type="personal">
  <namePart>Huheey, James E.</namePart>
  <role>
    <roleTerm type="text" authority="marcrelator">creator</roleTerm>
  </role>
</name>
<name type="personal">
  <namePart>Keiter, Ellen A.</namePart>
  <role>
    <roleTerm type="text" authority="marcrelator">creator</roleTerm>
  </role>
</name>
<name type="personal">
  <namePart>Keiter, Richard L.</namePart>
  <role>
    <roleTerm type="text" authority="marcrelator">creator</roleTerm>
  </role>
</name>
<typeOfResource>text</typeOfResource>
<originInfo>
  <publisher>HarperCollins College Publishers</publisher>
  <dateIssued/>
  <frequency>unknown</frequency>
</originInfo>
<language>
  <languageTerm authority="iso639-2b" type="code">eng</languageTerm>
</language>
<physicalDescription>
  <form authority="marcform">volume</form>
  <extent>xvii, 964, 88 p. ; 27 cm</extent>
</physicalDescription>
<subject>
</subject>
<classification authority="udc">546</classification>
<abstract/>
<note>Includes bibliographical references and index</note>
<identifier type="isbn">9780060429959</identifier>
<recordInfo>
  <recordCreationDate>2000-12-26 03:17:11 +0900</recordCreationDate>
  <recordChangeDate>2025-12-15 09:37:31 +0900</recordChangeDate>
  <recordIdentifier>https://library.nims.go.jp/manifestations/2538</recordIdentifier>
</recordInfo>
</modsCollection>
