Mechanical relaxation of residual stresses </titleInfo> <name type="personal"> <namePart>Mordfin, Leonard</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>International Symposium on Mechanical Relaxation of Residual Stresses</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>American Society for Testing and Materials. Committee E-28 on Mechanical Testing</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>ASTM</publisher> <dateIssued/> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>122 p. ; 23 cm</extent> </physicalDescription> <subject> </subject> <classification authority="udc">STP</classification> <abstract/> <note>Papers from the International Symposium on Mechanical Relaxation of Residual Stresses, held in Cincinnati, Ohio, Apr. 30, 1987 and sponsored by ASTM Committee E-28 on Mechanical Testing//"ASTM publication code number (PCN) 04-993000-23."//Includes bibliographies and indexes</note> <identifier type="isbn">9780803111660</identifier> <recordInfo> <recordCreationDate>1999-05-19 08:53:26 +0900</recordCreationDate> <recordChangeDate>2025-12-23 15:15:01 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/37135</recordIdentifier> </recordInfo> <titleInfo> <title>Gaseous conductors : theory and engineering applications </titleInfo> <name type="personal"> <namePart>Cobine, James Dillon</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>Dover Publications</publisher> <dateIssued/> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>xix, 606 p. ; 21 cm</extent> </physicalDescription> <subject> </subject> <classification authority="udc">537</classification> <abstract/> <note>"An unabridged republication of the first edition with corrections by the author."</note> <identifier type="isbn">9780486604428</identifier> <recordInfo> <recordCreationDate>1999-05-19 08:53:09 +0900</recordCreationDate> <recordChangeDate>2025-12-15 09:29:31 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/35740</recordIdentifier> </recordInfo> <titleInfo> <title>Fatigue mechanisms : advances in quantitative measurement of physical damage : a conference </titleInfo> <name type="personal"> <namePart>Lankford, J. (James)</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>ASTM Committee E-9 on Fatigue</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>ASTM Committee E-24 on Fracture Testing</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>ASTM</publisher> <dateIssued/> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>496 p. ; 24 cm</extent> </physicalDescription> <subject> </subject> <classification authority="udc">STP</classification> <abstract/> <note>"ASTM publication code number (PCN) 0481100030"//Includes bibliographical refereces and index</note> <recordInfo> <recordCreationDate>1999-05-19 08:50:42 +0900</recordCreationDate> <recordChangeDate>2025-12-23 15:17:28 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/36957</recordIdentifier> </recordInfo> <titleInfo> <title>Colored symmetry Симметрия и антисимметрия конечных фигур//Simmetriya i antisimmetriya konechnykh figur Shubnikov, A. V. (Alekseĭ Vasilʹevich) creator Belov, N. V. (Nikolaĭ Vasilʹevich) creator Holser, William T. creator Institut kristallografii im. A.V. Shubnikova creator text Pergamon Distributed in Western Hemisphere by Macmillan unknown eng
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xxv, 263 p., [2] folded leaves of plates, [1] leaf of plates ; 23 cm 548.1 "A series of publications from the Institute of Crystallography, Academy of Sciences of the U.S.S.R., Moscow, 1951-1958."//"The first part ... is a translation based on A.V. Shubnikov's 'Симметрия и антисимметрия конечных фигур (Simmetriya i antisimmetriya konechnykh figur) published by the USSR Academy of Sciences. The second part consists of several articles by N. V. Belov et al."//Erratum slip inserted//Bibliography: p. 249-260//Includes index 1999-05-19 08:49:55 +0900 2025-12-15 09:39:27 +0900 https://library.nims.go.jp/manifestations/66321 Diffushion and Defect Data Pt.B Vol.15-16 </titleInfo> <name type="personal"> <namePart>J.Nowotny</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>Sci-Tech Publications</publisher> <dateIssued>1991-01-01 00:00:00 +0900</dateIssued> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>430p; 25cm</extent> </physicalDescription> <subject> </subject> <classification authority="udc">548.526</classification> <abstract/> <note/> <recordInfo> <recordCreationDate>1999-05-19 08:49:47 +0900</recordCreationDate> <recordChangeDate>2025-12-15 09:52:41 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/36890</recordIdentifier> </recordInfo> <titleInfo> <title>Diffushion and Defect Data Pt.B Vol.17-18 </titleInfo> <name type="personal"> <namePart>K.Sangwal</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>Sci-Tech Publications</publisher> <dateIssued>1991-01-01 00:00:00 +0900</dateIssued> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>405p; 25cm</extent> </physicalDescription> <subject> </subject> <classification authority="udc">548.526</classification> <abstract/> <note/> <recordInfo> <recordCreationDate>1999-05-19 08:49:47 +0900</recordCreationDate> <recordChangeDate>2025-12-15 09:52:43 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/36891</recordIdentifier> </recordInfo> <titleInfo> <title>Diffushion and Defect Data Solid State Data Pt.B Vol.13-14 </titleInfo> <name type="personal"> <namePart>Jan.Przyluski</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>Sci-Tech Publications</publisher> <dateIssued>1990-01-01 00:00:00 +0900</dateIssued> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>388p; 24cm</extent> </physicalDescription> <subject> </subject> <classification authority="udc">548.526</classification> <abstract/> <note>Ｔ−１２７６，Ｔ−１２７７，Ｔ−１２８４とセット価格</note> <recordInfo> <recordCreationDate>1999-05-19 08:49:45 +0900</recordCreationDate> <recordChangeDate>2025-12-15 09:52:40 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/36889</recordIdentifier> </recordInfo> <titleInfo> <title>Non linear phenomena in materials science </titleInfo> <name type="personal"> <namePart>International C.N.R.S. Meeting</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>Kubin, L.</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>Martin, G.</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>Sci-Tech Publications</publisher> <dateIssued/> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>1 v. ; 25 cm</extent> </physicalDescription> <subject> </subject> <classification authority="udc">548.526</classification> <abstract/> <note>[1]: Proceedings of the International C.N.R.S. Meeting held in Aussois (France), September 10-18, 1987//2 published: Brookfield, Vt. : Trans Tech Publications, c1992//V.3は別書誌 <BA25275192></note> <recordInfo> <recordCreationDate>1999-05-19 08:49:42 +0900</recordCreationDate> <recordChangeDate>2025-12-15 09:52:40 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/36884</recordIdentifier> </recordInfo> <titleInfo> <title>Ion implantation in semiconductors Solid state phenomena Stievenard, D. creator Bourgoin, J. C. creator text Sci-Tech Publications unknown eng
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v, 473 p. ; 25 cm 548.526 "Focus -- Ion implantation in semiconductors"//"SSP" 1999-05-19 08:49:42 +0900 2025-12-15 09:52:40 +0900 https://library.nims.go.jp/manifestations/36885 The application of electron microscopy to materials science : proceedings of an International Workshop, held in China, Gauonzhou, August 1988 Solid state phenomena Kuo, K. H. creator text Trans tech Publications Sci-Tech Publications unknown eng
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209 p. ; 25 cm 548.526 "Focus -- electron microscopy"//"SSP"//Including bibliographical references//Author index: p. [211] 9783908044017 1999-05-19 08:49:30 +0900 2025-12-15 09:52:40 +0900 https://library.nims.go.jp/manifestations/36872