Macroscopic modelling and structural engineering </titleInfo> <name type="personal"> <namePart>International RILEM/ESIS Conference on Fracture Processes in Brittle Disordered Materials: Concrete, Rock, Ceramics</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>Mier, J. G. M. van</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>Rots, J. G.</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>Bakker, A.</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>edited by J.G.M. van Mier, J.G. Rots and A. Bakker</namePart> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>E & FN Spon</publisher> <dateIssued/> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>p. 485-966 ; 24 cm</extent> </physicalDescription> <subject> </subject> <classification authority="udc">620</classification> <abstract/> <note>"Proceedings of the International RILEM/ESIS Conference 'Fracture Processes in Brittle Disordered Materials: Concrete, Rock, Ceramics', sponsored by the International Union of Testing and Research Laboratories for Materials and Structures(RILEM) and the European Structural Integrity Society(ESIS), and organized by Delft University of Technology, Delft, the Netherlands, Noordwijk, the Netherlands, June 19-21, 1991"</note> <identifier type="isbn">9780419158608</identifier> <recordInfo> <recordCreationDate>1999-05-19 08:58:52 +0900</recordCreationDate> <recordChangeDate>2025-04-21 11:32:39 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/69452</recordIdentifier> </recordInfo> <titleInfo> <title>Microscopic material studies and materials engineering </titleInfo> <name type="personal"> <namePart>International RILEM/ESIS Conference on Fracture Processes in Brittle Disordered Materials: Concrete, Rock, Ceramics</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>Mier, J. G. M. van</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>Rots, J. G.</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>Bakker, A.</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>edited by J.G.M. van Mier, J.G. Rots and A. Bakker</namePart> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>E & FN Spon</publisher> <dateIssued/> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>482 p. ; 24 cm</extent> </physicalDescription> <subject> </subject> <classification authority="udc">620</classification> <abstract/> <note>"Proceedings of the International RILEM/ESIS Conference 'Fracture Processes in Brittle Disordered Materials: Concrete, Rock, Ceramics', sponsored by The International Union of Testing and Research Laboratories for Materials and Structures(RILEM) and the European Structural Integrity Society(ESIS), and organized by Delft University of Technology, Delft, The Netherlands"//"Noordwijk, The Netherlands June 19-21, 1991"</note> <identifier type="isbn">9780419158509</identifier> <recordInfo> <recordCreationDate>1999-05-19 08:58:51 +0900</recordCreationDate> <recordChangeDate>2025-04-21 11:32:40 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/69451</recordIdentifier> </recordInfo> <titleInfo> <title>Semiconducting II-VI, IV-VI, and V-VI compounds Полупроводниковые соединения, их получение и свойства//Poluprovodnikovye soedinenii︠a︡, ikh poluchenie i svoĭstva Abrikosov, N. Kh. (Nikolaĭ Khrisanfovich) creator text Plenum Press unknown eng
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Tressler , Michael McNallan</namePart> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>American Ceramic Society</publisher> <dateIssued/> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>vii, 493 p. ; 24 cm</extent> </physicalDescription> <subject> </subject> <abstract/> <note>Includes index</note> <identifier type="isbn">9780944904268</identifier> <recordInfo> <recordCreationDate>1999-05-19 08:58:44 +0900</recordCreationDate> <recordChangeDate>2026-03-18 13:58:18 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/70061</recordIdentifier> </recordInfo> <titleInfo> <title>Modern theory of critical phenomena </titleInfo> <name type="personal"> <namePart>Ma, Shang-keng</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>W.A. 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(1982): Redwood City, Calif. : Addison-Wesley//Thirteenth printing, February 1995//Bibliography: p. 542-554//Includes index</note> <identifier type="isbn">9780805366716</identifier> <recordInfo> <recordCreationDate>1999-05-19 08:58:38 +0900</recordCreationDate> <recordChangeDate>2025-12-15 09:30:29 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/70177</recordIdentifier> </recordInfo> <titleInfo> <title>Advances in X-ray analysis </titleInfo> <name type="personal"> <namePart>Annual Conference on Applications on X-Ray Analysis/</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>Plenum Press</publisher> <dateIssued/> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>1 v. ; 26 cm</extent> </physicalDescription> <subject> </subject> <classification authority="udc">539</classification> <abstract/> <note>v. 16まで子書誌あり//v. 31からは別書誌<BA01581773>//v. 19 published by Kendall/Hunt//Proceedings of the ... Annual Conference on Applications of X-Ray Analysis//Vol. 17: edited by C. L. Grant ... [et al.]. -- Vol. 18: edited by William L. Pickles ... [et al.]. -- Vol. 19: edited by R. W. Gould ... [et al.]. -- Vol. 20: Howard F. McMurdie ... [et al.]. -- Vol. 21: edited by Charles S. Barrett ... [et al.]. -- Vol. 22: edited by Gregory J. McCarthy ... [et al.]. -- Vol. 23: edited by John R. Rhodes ... [et al.]. -- Vol. 24: edited by Deane K. Smith ... [et al.]. -- Vol. 26: edited by Camden R. Hubbard ... [et al.]. -- Vol. 27: edited by Jerome B. Cohen ... [et al.]. -- Vol. 28: edited by Charles S. Barrett, Paul K. Predecki, Donald E. Leyden. -- Vol. 29, 30: edited by Charles S. Barrett ... [et al.]//22nd-33rd, 35th : 1973-1984, 1986 : Denver, Colorado//34th : 1985 : Snowmass, Colorado</note> <identifier type="isbn">9780306422874</identifier> <recordInfo> <recordCreationDate>1999-05-19 08:58:37 +0900</recordCreationDate> <recordChangeDate>2025-12-15 09:31:16 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/72295</recordIdentifier> </recordInfo> <titleInfo> <title>Optical properties of low-dimensional materials </titleInfo> <name type="personal"> <namePart>小川, 哲生</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>金光, 義彦</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>World Scientific</publisher> <dateIssued/> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>1 v. ; 23 cm</extent> </physicalDescription> <subject> </subject> <classification authority="udc">537.311</classification> <abstract/> <note>Includes bibliographical references</note> <identifier type="isbn">9789810222314</identifier> <recordInfo> <recordCreationDate>1999-05-19 08:58:37 +0900</recordCreationDate> <recordChangeDate>2025-12-15 09:29:54 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/74791</recordIdentifier> </recordInfo> <titleInfo> <title>Ion implantation in semiconductors and other materials : [proceedings] </titleInfo> <name type="personal"> <namePart>International Conference on Ion Implantation in Semiconductors and Other Materials, 3d, Yorktown Heights, N.Y., 1972</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>Crowder, Billy L.</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>edited by B.L. Crowder</namePart> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>Plenum Press</publisher> <dateIssued/> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>xii, 657 p. ; 26 cm</extent> </physicalDescription> <subject> </subject> <classification authority="udc">537.311</classification> <abstract/> <note>Includes bibliographical references</note> <identifier type="isbn">9780306307560</identifier> <recordInfo> <recordCreationDate>1999-05-19 08:58:35 +0900</recordCreationDate> <recordChangeDate>2025-12-15 09:29:34 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/35732</recordIdentifier> </recordInfo> <titleInfo> <title>Heavy metal pollution in soils of Japan </titleInfo> <name type="personal"> <namePart>北岸, 確三</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>山根, 一郎</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>Japan Scientific Societies Press</publisher> <dateIssued/> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>xxvi, 302 p. ; 24 cm</extent> </physicalDescription> <subject> </subject> <classification authority="udc">63</classification> <abstract/> <note>Includes bibliographical references and indexes</note> <identifier type="isbn">9784762202575</identifier> <recordInfo> <recordCreationDate>1999-05-19 08:58:29 +0900</recordCreationDate> <recordChangeDate>2025-12-15 09:46:15 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/37481</recordIdentifier> </recordInfo> <titleInfo> <title>Electron-beam, X-ray, EUV, and ion-beam submicrometer lithographies for manufacturing V : 20-21 February 1995, Santa Clara, California Electron-beam, X-ray, EUV, and ion-beam submicrometer lithographies for manufacturing 5 Electron-beam, X-ray, EUV, and ion-beam submicrometer lithographies for manufacturing Symposium creator Warlaumont, John M. creator Society of Photo-optical Instrumentation Engineers creator Semiconductor Equipment and Materials International creator text SPIE unknown eng
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vii, 450 p. ; 28 cm 621.385 Includes bibliographical references and index 9780819417855 1999-05-19 08:58:27 +0900 2025-12-15 09:44:30 +0900 https://library.nims.go.jp/manifestations/73730