Diffushion and Defect Data Pt.B Vol.15-16 </titleInfo> <name type="personal"> <namePart>J.Nowotny</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>Sci-Tech Publications</publisher> <dateIssued>1991-01-01 00:00:00 +0900</dateIssued> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>430p; 25cm</extent> </physicalDescription> <subject> </subject> <classification authority="udc">548.526</classification> <abstract/> <note/> <recordInfo> <recordCreationDate>1999-05-19 08:49:47 +0900</recordCreationDate> <recordChangeDate>2025-12-15 09:52:41 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/36890</recordIdentifier> </recordInfo> <titleInfo> <title>Diffushion and Defect Data Pt.B Vol.17-18 </titleInfo> <name type="personal"> <namePart>K.Sangwal</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>Sci-Tech Publications</publisher> <dateIssued>1991-01-01 00:00:00 +0900</dateIssued> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>405p; 25cm</extent> </physicalDescription> <subject> </subject> <classification authority="udc">548.526</classification> <abstract/> <note/> <recordInfo> <recordCreationDate>1999-05-19 08:49:47 +0900</recordCreationDate> <recordChangeDate>2025-12-15 09:52:43 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/36891</recordIdentifier> </recordInfo> <titleInfo> <title>Diffushion and Defect Data Solid State Data Pt.B Vol.13-14 </titleInfo> <name type="personal"> <namePart>Jan.Przyluski</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>Sci-Tech Publications</publisher> <dateIssued>1990-01-01 00:00:00 +0900</dateIssued> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>388p; 24cm</extent> </physicalDescription> <subject> </subject> <classification authority="udc">548.526</classification> <abstract/> <note>Ｔ−１２７６，Ｔ−１２７７，Ｔ−１２８４とセット価格</note> <recordInfo> <recordCreationDate>1999-05-19 08:49:45 +0900</recordCreationDate> <recordChangeDate>2025-12-15 09:52:40 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/36889</recordIdentifier> </recordInfo> <titleInfo> <title>Non linear phenomena in materials science </titleInfo> <name type="personal"> <namePart>International C.N.R.S. Meeting</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>Kubin, L.</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>Martin, G.</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>Sci-Tech Publications</publisher> <dateIssued/> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>1 v. ; 25 cm</extent> </physicalDescription> <subject> </subject> <classification authority="udc">548.526</classification> <abstract/> <note>[1]: Proceedings of the International C.N.R.S. Meeting held in Aussois (France), September 10-18, 1987//2 published: Brookfield, Vt. : Trans Tech Publications, c1992//V.3は別書誌 <BA25275192></note> <recordInfo> <recordCreationDate>1999-05-19 08:49:42 +0900</recordCreationDate> <recordChangeDate>2025-12-15 09:52:40 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/36884</recordIdentifier> </recordInfo> <titleInfo> <title>Ion implantation in semiconductors Solid state phenomena Stievenard, D. creator Bourgoin, J. C. creator text Sci-Tech Publications unknown eng
volume
v, 473 p. ; 25 cm 548.526 "Focus -- Ion implantation in semiconductors"//"SSP" 1999-05-19 08:49:42 +0900 2025-12-15 09:52:40 +0900 https://library.nims.go.jp/manifestations/36885 The application of electron microscopy to materials science : proceedings of an International Workshop, held in China, Gauonzhou, August 1988 Solid state phenomena Kuo, K. H. creator text Trans tech Publications Sci-Tech Publications unknown eng
volume
209 p. ; 25 cm 548.526 "Focus -- electron microscopy"//"SSP"//Including bibliographical references//Author index: p. [211] 9783908044017 1999-05-19 08:49:30 +0900 2025-12-15 09:52:40 +0900 https://library.nims.go.jp/manifestations/36872 Gettering and deffect engineering in the semiconductor technology : GADEST '89 : proceedings of the 3rd International Autumn Meeting held in Garzau, German Democratic Republic, October 8-13, 1989 </titleInfo> <name type="personal"> <namePart>International Autumn Meeting, Gettering and Defect Engineering in Semiconductor Technology</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>Kittler, M.</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>Sci-Tech Publications</publisher> <dateIssued/> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>xi, 607 p. ; 25 cm</extent> </physicalDescription> <subject> </subject> <classification authority="udc">548.526</classification> <abstract/> <note/> <identifier type="isbn">9783908044048</identifier> <recordInfo> <recordCreationDate>1999-05-19 08:49:27 +0900</recordCreationDate> <recordChangeDate>2025-12-15 09:52:40 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/36870</recordIdentifier> </recordInfo> <titleInfo> <title>ECOSS 2 : Interdisciplinary Surface Science Ⅳ : Proceedings of The Second European Conference on Surface Science being The Fourth Interdiscipinary Surface Science Conference, Cambridge, England, 26-29 March 1979 </titleInfo> <name type="personal"> <namePart>edited by P.M. Willams, D.M. Newns, J. Pritchard</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>edited by P.M. Willams, D.M. Newns, J. Pritchard</namePart> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>North-Holland Publishing Company</publisher> <dateIssued>1979-01-01 00:00:00 +0900</dateIssued> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>745p; 25cm</extent> </physicalDescription> <subject> </subject> <abstract/> <note>Surface Science ; vol.89 (1979)</note> <recordInfo> <recordCreationDate>1999-05-19 08:49:22 +0900</recordCreationDate> <recordChangeDate>2025-12-15 09:32:58 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/72423</recordIdentifier> </recordInfo> <titleInfo> <title>Diffusion and Defect Data Pt．A Vol．113-114 </titleInfo> <typeOfResource>text</typeOfResource> <originInfo> <publisher>Scitec Publications Ltd</publisher> <dateIssued>1994-01-01 00:00:00 +0900</dateIssued> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>301p; 24cm</extent> </physicalDescription> <subject> </subject> <classification authority="udc">548.526</classification> <abstract/> <note/> <recordInfo> <recordCreationDate>1999-05-19 08:49:18 +0900</recordCreationDate> <recordChangeDate>2025-12-15 09:52:32 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/36824</recordIdentifier> </recordInfo> <titleInfo> <title>Diffusion and Defect Data Pt．A Vol．111-112 </titleInfo> <typeOfResource>text</typeOfResource> <originInfo> <publisher>Scitec Publications Ltd</publisher> <dateIssued>1994-01-01 00:00:00 +0900</dateIssued> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>347p; 24cm</extent> </physicalDescription> <subject> </subject> <classification authority="udc">548.526</classification> <abstract/> <note/> <recordInfo> <recordCreationDate>1999-05-19 08:49:16 +0900</recordCreationDate> <recordChangeDate>2025-12-15 09:52:33 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/36823</recordIdentifier> </recordInfo> </modsCollection>