Symposium on elevated temperature strain gages </titleInfo> <name type="corporate"> <namePart>American Society for Testing and Materials</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>Aeronautical Structures Laboratory</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>American Society for Testing Materials</publisher> <dateIssued/> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>iv, 163 p. ; 23 cm</extent> </physicalDescription> <subject> </subject> <classification authority="udc">620.17</classification> <abstract/> <note/> <recordInfo> <recordCreationDate>1999-05-19 08:33:46 +0900</recordCreationDate> <recordChangeDate>2025-12-23 15:16:01 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/35913</recordIdentifier> </recordInfo> <titleInfo> <title>Symposium on statistical aspects of fatigue : presented at the Fifty-fourth Annual Meeting, American Society for Testing Materials, Atlantic City, N.J., June 19, 1951 </titleInfo> <name type="corporate"> <namePart>American Society for Testing and Materials</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>ASTM</publisher> <dateIssued/> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>64 p. ; 23 cm</extent> </physicalDescription> <subject> </subject> <classification authority="udc">STP</classification> <abstract/> <note/> <recordInfo> <recordCreationDate>1999-05-19 08:33:45 +0900</recordCreationDate> <recordChangeDate>2025-12-23 15:16:01 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/35912</recordIdentifier> </recordInfo> <titleInfo> <title>Symposium on non-destructive testing : presented at the Fifty-fifth Annual Meeting (Fiftieth Anniversary Meeting), American Society for Testing Materials, New York, N.Y. June 26, 1952 </titleInfo> <name type="personal"> <namePart>American Society for Testing Materials. Meeting</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>American Society for Testing Materials. 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Committee E-1 on Methods of Testing</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>ASTM</publisher> <dateIssued/> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>v, 120 p. ; 24 cm</extent> </physicalDescription> <subject> </subject> <classification authority="udc">620.17</classification> <abstract/> <note/> <recordInfo> <recordCreationDate>1999-05-19 08:33:36 +0900</recordCreationDate> <recordChangeDate>2025-12-23 15:16:01 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/35903</recordIdentifier> </recordInfo> <titleInfo> <title>Hydrogen embrittlement testing : a symposium presented at the seventy-fifth annual meeting, American Society for Testing and Materials, Los Angeles, Calif., 25-30 June 1972 Raymond, Louis creator American Society for Testing and Materials. Committee F-7 on Aerospace Industry Methods creator Symposium on Hydrogen Embrittlement Testing creator text American Society for Testing and Materials unknown eng
volume
274 p. ; 24 cm 620.17 Sponsored by ASTM Committee F-7 on Aerospace Industry Methods//"The symposium on Hydrogen Embrittlement Testing was given at the Seventy-fifth Annual Meeting of the American Society for Testing and Materials held in Los Angeles, Calif., 25-30 June 1972."--Foreword//Includes bibliographical references 1999-05-19 08:33:35 +0900 2025-12-15 09:48:24 +0900 https://library.nims.go.jp/manifestations/35902 Micro-indentation hardness testing </titleInfo> <name type="personal"> <namePart>Mott, Bernard William</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>Butterworth's Scientific Publications</publisher> <dateIssued/> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>viii, 272 p. ; 26 cm</extent> </physicalDescription> <subject> </subject> <classification authority="udc">620.17</classification> <abstract/> <note/> <recordInfo> <recordCreationDate>1999-05-19 08:33:25 +0900</recordCreationDate> <recordChangeDate>2025-12-15 09:41:12 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/65112</recordIdentifier> </recordInfo> <titleInfo> <title>Symposium on Spectrochemical Analysis for Trace Elements : presented at the Sixtieth Annual Meeting, American Society for Testing Materials, Atlantic City, N.J., June 18, 1957 </titleInfo> <name type="personal"> <namePart>American Society for Testing Materials</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>American Society for Testing Materials</publisher> <dateIssued/> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>v, 79 p. ; 24 cm</extent> </physicalDescription> <subject> </subject> <classification authority="udc">669.9</classification> <abstract/> <note>Includes bibliographical references</note> <recordInfo> <recordCreationDate>1999-05-19 08:32:49 +0900</recordCreationDate> <recordChangeDate>2025-12-23 15:14:56 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/35854</recordIdentifier> </recordInfo> <titleInfo> <title>Creep analysis </titleInfo> <name type="personal"> <namePart>Kraus, Harry P.</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>Wiley</publisher> <dateIssued/> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>xvii, 250 p. ; 24 cm</extent> </physicalDescription> <subject> </subject> <classification authority="udc">621.017</classification> <abstract/> <note>"A Wiley-Interscience publication."//Includes bibliographical references and index</note> <identifier type="isbn">9780471062554</identifier> <recordInfo> <recordCreationDate>1999-05-19 08:31:51 +0900</recordCreationDate> <recordChangeDate>2025-12-15 09:42:27 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/68909</recordIdentifier> </recordInfo> </modsCollection>