Service fatigue loads monitoring, simulation, and analysis : a symposium </titleInfo> <name type="personal"> <namePart>Abelkis, P. R.</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>Potter, J. 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T.</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>ASTM Committee E-24 on Fracture Testing</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>ASTM</publisher> <dateIssued/> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>674 p. ; 24 cm</extent> </physicalDescription> <subject> </subject> <classification authority="udc">STP</classification> <abstract/> <note>Includes bibliographical references and index//"ASTM publication code number (PCN) 04-868000-30."</note> <identifier type="isbn">9780803102255</identifier> <recordInfo> <recordCreationDate>1999-05-19 07:37:28 +0900</recordCreationDate> <recordChangeDate>2025-12-23 15:16:54 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/32068</recordIdentifier> </recordInfo> <titleInfo> <title>Modern aspects of electrochemistry </titleInfo> <name type="personal"> <namePart>Bockris, J. 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330 p. ; 28 cm 620.17 Spine title: Evaluations of the elevated tensile and creep rupture properties of 12 to 27 percent chromium steels//"05-059000-40."//Includes bibliographical references 1999-05-19 07:36:01 +0900 2025-12-15 09:41:18 +0900 https://library.nims.go.jp/manifestations/31969 Quantitative surface analysis of materials : a symposium sponsored by ASTM Committee E-42 on Surface Analysis, American Society for Testing and Materials, Cleveland, Ohio, 2-3 March 1977 </titleInfo> <name type="personal"> <namePart>Symposium on Progress in Quantitative Surface Analysis</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>McIntyre, N. S.</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>ASTM Committee E-42 on Surface Analysis</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>American Society for Testing and Materials</publisher> <dateIssued/> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>214 p. ; 24 cm</extent> </physicalDescription> <subject> </subject> <classification authority="udc">STP</classification> <abstract/> <note>Includes bibliographical references and index</note> <recordInfo> <recordCreationDate>1999-05-19 07:35:25 +0900</recordCreationDate> <recordChangeDate>2025-12-23 15:14:44 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/31933</recordIdentifier> </recordInfo> <titleInfo> <title>Stereology and quantitative metallography : a symposium presented at the seventy-fourth annual meeting, American Society for Testing and Materials, Atlantic City, N.J., 27 June-2 July, 1971 </titleInfo> <name type="personal"> <namePart>Symposium on Stereology and Quantitative Metallography</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>American Society for Testing and Materials. Subcommittee 11 on Electron Microscopy and Diffraction</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>American Society for Testing and Materials. Subcommittee 14 on Quantitative Metallography</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>American Society for Testing and Materials. Subcommittee 15 on Scanning Microscopy and Microprobe Analysis</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>American Society for Testing and Materials</publisher> <dateIssued/> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>182 p. ; 24 cm</extent> </physicalDescription> <subject> </subject> <classification authority="udc">STP</classification> <abstract/> <note>Sponsored by Subcommittee 11 on Electron Microscopy and Diffraction, Subcommittee 14 on Quantitative Metallography, and Subcommittee 15 on Scanning Microscopy and Microprobe Analysis of the American Society for Testing and Materials//Includes bibliographical references</note> <recordInfo> <recordCreationDate>1999-05-19 07:35:09 +0900</recordCreationDate> <recordChangeDate>2025-12-23 15:13:41 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/31914</recordIdentifier> </recordInfo> </modsCollection>