Annual Book of ASTM Standards 2000 Sec.14 General Methods and Instrumentation; Volume 14.02 General Test Method; Chromatography; Forensic Science; Terminology; Conformity Assessment; Statistical Methods; Includes standards of the following committee: E-2 on Terminology, E-11 on Quality and Statistics, E-19 on Chromatography, E-27 Hazard Potential of Chemicals, E-29 Particle and Spray Characterization, E-30 on Forensic Science, E-36 on Conformity Assessment, E-37 on Thermal Measurement Vol.14.02 </titleInfo> <name type="corporate"> <namePart>American Society for Testing and Materials ; ASTM</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>American Society for Testing and Materials ; ASTM</publisher> <dateIssued>2000-01-01 00:00:00 +0900</dateIssued> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>1026p; 28cm</extent> </physicalDescription> <subject> </subject> <classification authority="udc">669</classification> <abstract/> <note/> <recordInfo> <recordCreationDate>1901-01-01 09:00:00 +0900</recordCreationDate> <recordChangeDate>2025-12-15 09:48:40 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/71253</recordIdentifier> </recordInfo> <titleInfo> <title>Annual Book of ASTM Standards 2000 Sec.14 General Methods and Instrumentation; Volume 14.03 Temperature Measurement; Includes standards of thefollowing committee: E-20 on Temperature Measurement Vol.14.03 </titleInfo> <name type="corporate"> <namePart>American Society for Testing and Materials ; ASTM</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>American Society for Testing and Materials ; ASTM</publisher> <dateIssued>2000-01-01 00:00:00 +0900</dateIssued> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>622p; 28cm</extent> </physicalDescription> <subject> </subject> <classification authority="udc">669</classification> <abstract/> <note/> <recordInfo> <recordCreationDate>1901-01-01 09:00:00 +0900</recordCreationDate> <recordChangeDate>2025-12-15 09:48:40 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/71254</recordIdentifier> </recordInfo> <titleInfo> <title>Annual Book of ASTM Standards 2000 Sec.14 General Methods and Instrumentation; Volume 14.04 Laboratory Apparatus; Degradation of Materials; Filtration; SI; Oxygen Fire Safety; Includes standards of the following committee: E-41 on Laboratory Apparatus E-43 on SI Practice F-21 on Filtration G-3 on Compatibility and Sensitivity of Materials in Oxygen Enriched Atmosphere Vol.14.04 </titleInfo> <name type="corporate"> <namePart>American Society for Testing and Materials ; ASTM</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>American Society for Testing and Materials ; ASTM</publisher> <dateIssued>2000-01-01 00:00:00 +0900</dateIssued> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>870p; 28cm</extent> </physicalDescription> <subject> </subject> <classification authority="udc">669</classification> <abstract/> <note/> <recordInfo> <recordCreationDate>1901-01-01 09:00:00 +0900</recordCreationDate> <recordChangeDate>2025-12-15 09:48:39 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/71266</recordIdentifier> </recordInfo> <titleInfo> <title>Physics of nanostructures : proceedings of the thirty-eighth Scottish Universities Summer School in Physics, St. Andrews, July-August 1991 </titleInfo> <name type="personal"> <namePart>Scottish Universities' Summer School in Physics</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>Davies, J. H. (John H.)</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>Long, A. R.</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>edited by J.H. Davies, A.R. 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xii, 312 p. ; 25 cm 53 "First edition 1930. Second edition 1935. Third edition 1947"--T.p. verso//Includes index 1901-01-01 09:00:00 +0900 2025-12-15 09:25:52 +0900 https://library.nims.go.jp/manifestations/72696 Semiconductor devices and applications </titleInfo> <name type="personal"> <namePart>Greiner, Richard Anton</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>McGraw-Hill</publisher> <dateIssued/> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>xiv, 493 p. ; 24 cm</extent> </physicalDescription> <subject> </subject> <classification authority="udc">621.38</classification> <abstract/> <note>Bibliography: p. 457-468//Includes index</note> <recordInfo> <recordCreationDate>1901-01-01 09:00:00 +0900</recordCreationDate> <recordChangeDate>2025-12-15 09:44:07 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/72725</recordIdentifier> </recordInfo> <titleInfo> <title>Finite inelastic deformations : theory and applications : IUTAM Symposium, Hannover, Germany, 1991 </titleInfo> <name type="personal"> <namePart>Besdo, D. (Dieter)</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>Stein, E.</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>Springer-Verlag</publisher> <dateIssued/> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>xvii, 556 p. ; 24 cm</extent> </physicalDescription> <subject> </subject> <classification authority="udc">539.3</classification> <abstract/> <note>At head of title: International Union of Theoretical and Applied Mechanics</note> <identifier type="isbn">9783540558491</identifier> <recordInfo> <recordCreationDate>1901-01-01 09:00:00 +0900</recordCreationDate> <recordChangeDate>2025-12-15 09:33:17 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/72497</recordIdentifier> </recordInfo> <titleInfo> <title>Thin-film diamond Nebel, Christoph E. creator text Elsevier Academic Press unknown eng
volume
1 v. ; 25 cm 537.311 Includes bibliographical references and index 9780127521855 1901-01-01 09:00:00 +0900 2025-12-15 09:29:58 +0900 https://library.nims.go.jp/manifestations/72500