Metrology and Standardization for Nanotechnology : Protocols and Industrial Innovations
Mansfield, Elisabeth
L. Kaiser, Debra
Fujita, Daisuke
Van de Voorde, Marcel
text
Wiley-VCH
2017-01-01 00:00:00 +0900
unknown
eng
626p ; 25cm
539.24
9783527340392
2021-03-04 15:34:24 +0900
2026-03-13 15:02:21 +0900
https://library.nims.go.jp/manifestations/124414