Polarization analysis and applications to device technology : International Symposium on Polarization Analysis and Applications to Device Technology : 12-14 June, 1996, Yokahama, Japan </titleInfo> <name type="personal"> <namePart>International Symposium on Polarization Analysis and Applications to Device Technology</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>Yoshizawa, Tōru</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>Yokota, Hideshi</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>Society of Photo-optical Instrumentation Engineers. Japan Chapter</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>Society of Photo-optical Instrumentation Engineers</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>SPIE</publisher> <dateIssued/> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>xiii, 350 p. ; 28 cm</extent> </physicalDescription> <subject> </subject> <classification authority="udc">535.5</classification> <abstract/> <note>Includes bibliographical references and index</note> <identifier type="isbn">9780819422712</identifier> <recordInfo> <recordCreationDate>2008-09-04 01:47:34 +0900</recordCreationDate> <recordChangeDate>2025-12-15 09:28:53 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/34839</recordIdentifier> </recordInfo> </modsCollection>