Polarization analysis and applications to device technology : International Symposium on Polarization Analysis and Applications to Device Technology : 12-14 June, 1996, Yokahama, Japan - International Symposium on Polarization Analysis and Applications to Device Technology; Yoshizawa, Tōru; Yokota, Hideshi; Society of Photo-optical Instrumentation Engineers. Japan Chapter; Society of Photo-optical Instrumentation Engineers (SPIE)
Includes bibliographical references and index