Vth International Congress on X-ray Optics and Microanalysis V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse = Ve Congrès International sur l'Optique des Rayons X et al Microanalyse, Tübingen, September 9th-14th, 1968 International Congress on X-ray Optics and Microanalysis creator Gaukler, K. H. creator Möllenstedt, G. creator text Springer-Verlag unknown eng
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xii, 612 p. ; 28 cm 548.7 English, French or German//Includes bibliographies 2000-12-26 03:23:58 +0900 2025-12-15 09:40:01 +0900 https://library.nims.go.jp/manifestations/3266 Physikalisch-technischer Teil </titleInfo> <name type="personal"> <namePart>Niehar, H.</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>Ruska, Ernst</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>Möllenstedt, G.</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>International Congress on Electron Microscopy</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>Springer</publisher> <dateIssued/> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>xvi, 851 p. ; 28 cm</extent> </physicalDescription> <subject> </subject> <classification authority="udc">621.38</classification> <abstract/> <note/> <recordInfo> <recordCreationDate>1901-01-01 09:00:00 +0900</recordCreationDate> <recordChangeDate>2025-12-15 09:44:12 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/41150</recordIdentifier> </recordInfo> </modsCollection>