<?xml version="1.0" encoding="UTF-8"?>
<modsCollection xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns="http://www.loc.gov/mods/v3">
<titleInfo>
  <title>Local Lattice Rotations and Dislinations in Microstructures of Distorted Crystalline Materials  Vol. 87</title>
</titleInfo>
<titleInfo type="alternative">
  <title/>
</titleInfo>
<name type="personal">
  <namePart>Editor: P. Klimanek, A.E. Romanov, M. Seefeldt</namePart>
  <role>
    <roleTerm type="text" authority="marcrelator">creator</roleTerm>
  </role>
</name>
<typeOfResource>text</typeOfResource>
<originInfo>
  <publisher>Scitec Publications Ltd</publisher>
  <dateIssued>2002-01-01 00:00:00 +0900</dateIssued>
  <frequency>unknown</frequency>
</originInfo>
<language>
  <languageTerm authority="iso639-2b" type="code">eng</languageTerm>
</language>
<physicalDescription>
  <form authority="marcform">volume</form>
  <extent>310p; 25cm</extent>
</physicalDescription>
<subject>
</subject>
<classification authority="udc">548.526</classification>
<abstract/>
<note/>
<identifier type="isbn">9783908450689</identifier>
<recordInfo>
  <recordCreationDate>2002-12-13 02:15:29 +0900</recordCreationDate>
  <recordChangeDate>2025-12-15 09:52:45 +0900</recordChangeDate>
  <recordIdentifier>https://library.nims.go.jp/manifestations/41285</recordIdentifier>
</recordInfo>
<titleInfo>
  <title>Defect Interaction and Clustering in Semiconductors  Vols.85-86</title>
</titleInfo>
<titleInfo type="alternative">
  <title/>
</titleInfo>
<name type="personal">
  <namePart>Editor: S. Pizzini</namePart>
  <role>
    <roleTerm type="text" authority="marcrelator">creator</roleTerm>
  </role>
</name>
<typeOfResource>text</typeOfResource>
<originInfo>
  <publisher>Scitec Publications Ltd</publisher>
  <dateIssued>2002-01-01 00:00:00 +0900</dateIssued>
  <frequency>unknown</frequency>
</originInfo>
<language>
  <languageTerm authority="iso639-2b" type="code">eng</languageTerm>
</language>
<physicalDescription>
  <form authority="marcform">volume</form>
  <extent>413p; 25cm</extent>
</physicalDescription>
<subject>
</subject>
<classification authority="udc">548.526</classification>
<abstract/>
<note/>
<identifier type="isbn">9783908450658</identifier>
<recordInfo>
  <recordCreationDate>2002-12-13 02:03:34 +0900</recordCreationDate>
  <recordChangeDate>2025-12-15 09:52:45 +0900</recordChangeDate>
  <recordIdentifier>https://library.nims.go.jp/manifestations/41281</recordIdentifier>
</recordInfo>
<titleInfo>
  <title>Polycrystalline semiconductors VI : materials, technologies, and large area electronics : proceedings of the sixth International Conference, Saint Malo, September 3-7, 2000</title>
</titleInfo>
<titleInfo type="alternative">
  <title/>
</titleInfo>
<name type="personal">
  <namePart>International Conference on Polycrystalline Semiconductors</namePart>
  <role>
    <roleTerm type="text" authority="marcrelator">creator</roleTerm>
  </role>
</name>
<name type="personal">
  <namePart>Bonnaud, O</namePart>
  <role>
    <roleTerm type="text" authority="marcrelator">creator</roleTerm>
  </role>
</name>
<typeOfResource>text</typeOfResource>
<originInfo>
  <publisher>Scitec Publications</publisher>
  <dateIssued/>
  <frequency>unknown</frequency>
</originInfo>
<language>
  <languageTerm authority="iso639-2b" type="code">eng</languageTerm>
</language>
<physicalDescription>
  <form authority="marcform">volume</form>
  <extent>xiv, 459 p. ; 25 cm</extent>
</physicalDescription>
<subject>
</subject>
<classification authority="udc">548.526</classification>
<abstract/>
<note>Includes bibliographical references and indexes</note>
<identifier type="isbn">9783908450634</identifier>
<recordInfo>
  <recordCreationDate>2001-09-29 00:27:29 +0900</recordCreationDate>
  <recordChangeDate>2025-12-15 09:52:46 +0900</recordChangeDate>
  <recordIdentifier>https://library.nims.go.jp/manifestations/40005</recordIdentifier>
</recordInfo>
<titleInfo>
  <title>Proceedings of DIMAT 2000 : the fifth International Conference on Diffusion in Materials, Paris, France, July 17-21, 2000</title>
</titleInfo>
<titleInfo type="alternative">
  <title>Diffusion in materials</title>
</titleInfo>
<name type="personal">
  <namePart>International Conference on Diffusion in Materials</namePart>
  <role>
    <roleTerm type="text" authority="marcrelator">creator</roleTerm>
  </role>
</name>
<name type="personal">
  <namePart>Limoge, Y. (Yves)</namePart>
  <role>
    <roleTerm type="text" authority="marcrelator">creator</roleTerm>
  </role>
</name>
<name type="personal">
  <namePart>Bocquet, J. L. (Jean-Louis)</namePart>
  <role>
    <roleTerm type="text" authority="marcrelator">creator</roleTerm>
  </role>
</name>
<typeOfResource>text</typeOfResource>
<originInfo>
  <publisher>Scitec Publications</publisher>
  <dateIssued/>
  <frequency>unknown</frequency>
</originInfo>
<language>
  <languageTerm authority="iso639-2b" type="code">eng</languageTerm>
</language>
<physicalDescription>
  <form authority="marcform">volume</form>
  <extent>p.897-1833 ; 25 cm</extent>
</physicalDescription>
<subject>
</subject>
<classification authority="udc">548.526</classification>
<abstract/>
<note>Pt. 1: pp.1-896. Pt. 2: pp.897-1833</note>
<identifier type="isbn">9783908450603</identifier>
<recordInfo>
  <recordCreationDate>2001-07-20 00:59:50 +0900</recordCreationDate>
  <recordChangeDate>2025-12-15 09:52:37 +0900</recordChangeDate>
  <recordIdentifier>https://library.nims.go.jp/manifestations/68963</recordIdentifier>
</recordInfo>
<titleInfo>
  <title>Beam Injection Assessment of Microstructures in Semiconductors BIAMS 2000: Proceedings of the 6th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors held in Fukuoka, Japan, November 12-16, 2000  Vols. 78-79</title>
</titleInfo>
<titleInfo type="alternative">
  <title/>
</titleInfo>
<name type="personal">
  <namePart>Editors: Hajime Tomokage, Takashi Sekiguchi</namePart>
  <role>
    <roleTerm type="text" authority="marcrelator">creator</roleTerm>
  </role>
</name>
<typeOfResource>text</typeOfResource>
<originInfo>
  <publisher>Scitec Publications Ltd</publisher>
  <dateIssued>2001-01-01 00:00:00 +0900</dateIssued>
  <frequency>unknown</frequency>
</originInfo>
<language>
  <languageTerm authority="iso639-2b" type="code">eng</languageTerm>
</language>
<physicalDescription>
  <form authority="marcform">volume</form>
  <extent>441p; 25cm</extent>
</physicalDescription>
<subject>
</subject>
<classification authority="udc">548.526</classification>
<abstract/>
<note/>
<identifier type="isbn">9783908450610</identifier>
<recordInfo>
  <recordCreationDate>2001-06-06 23:11:26 +0900</recordCreationDate>
  <recordChangeDate>2025-12-15 09:52:45 +0900</recordChangeDate>
  <recordIdentifier>https://library.nims.go.jp/manifestations/39567</recordIdentifier>
</recordInfo>
<titleInfo>
  <title>Ultra clean processing of silicon surfaces 2000 : proceedings of the Fifth International Symposium on Ultra Clean Processing of Silicon Surfaces (UCPSS 2000), held in Ostend, Belgium, September 18-20, 2000</title>
</titleInfo>
<titleInfo type="alternative">
  <title/>
</titleInfo>
<name type="personal">
  <namePart>International Symposium on Ultra Clean Processing of Silicon Surfaces (UCPSS)</namePart>
  <role>
    <roleTerm type="text" authority="marcrelator">creator</roleTerm>
  </role>
</name>
<name type="personal">
  <namePart>Heyns, Marc</namePart>
  <role>
    <roleTerm type="text" authority="marcrelator">creator</roleTerm>
  </role>
</name>
<name type="personal">
  <namePart>Mertens, Paul</namePart>
  <role>
    <roleTerm type="text" authority="marcrelator">creator</roleTerm>
  </role>
</name>
<name type="personal">
  <namePart>Meuris, Marc</namePart>
  <role>
    <roleTerm type="text" authority="marcrelator">creator</roleTerm>
  </role>
</name>
<typeOfResource>text</typeOfResource>
<originInfo>
  <publisher>Scitec Publications</publisher>
  <dateIssued/>
  <frequency>unknown</frequency>
</originInfo>
<language>
  <languageTerm authority="iso639-2b" type="code">eng</languageTerm>
</language>
<physicalDescription>
  <form authority="marcform">volume</form>
  <extent>xiii, 321 p. ; 25 cm</extent>
</physicalDescription>
<subject>
</subject>
<classification authority="udc">548.526</classification>
<abstract/>
<note>Includes bibliographical references and indexes</note>
<identifier type="isbn">9783908450573</identifier>
<recordInfo>
  <recordCreationDate>2000-12-26 19:03:04 +0900</recordCreationDate>
  <recordChangeDate>2025-12-15 09:52:45 +0900</recordChangeDate>
  <recordIdentifier>https://library.nims.go.jp/manifestations/42809</recordIdentifier>
</recordInfo>
<titleInfo>
  <title>Diffusion and reactions : proceedings of the 2nd International Conference, held in Zakopane, Poland, Sept. 14-18, 1999</title>
</titleInfo>
<titleInfo type="alternative">
  <title/>
</titleInfo>
<name type="personal">
  <namePart>International Conference on Diffusion and Reactions</namePart>
  <role>
    <roleTerm type="text" authority="marcrelator">creator</roleTerm>
  </role>
</name>
<name type="personal">
  <namePart>Danielewski, M.</namePart>
  <role>
    <roleTerm type="text" authority="marcrelator">creator</roleTerm>
  </role>
</name>
<typeOfResource>text</typeOfResource>
<originInfo>
  <publisher>Scitec Publications</publisher>
  <dateIssued/>
  <frequency>unknown</frequency>
</originInfo>
<language>
  <languageTerm authority="iso639-2b" type="code">eng</languageTerm>
</language>
<physicalDescription>
  <form authority="marcform">volume</form>
  <extent>ix, 264 p. ; 25 cm</extent>
</physicalDescription>
<subject>
</subject>
<classification authority="udc">548.526</classification>
<abstract/>
<note>Includes references and index</note>
<identifier type="isbn">9783908450511</identifier>
<recordInfo>
  <recordCreationDate>2000-06-15 23:09:11 +0900</recordCreationDate>
  <recordChangeDate>2025-12-15 09:52:44 +0900</recordChangeDate>
  <recordIdentifier>https://library.nims.go.jp/manifestations/43122</recordIdentifier>
</recordInfo>
<titleInfo>
  <title>Special Defects in Semiconducting Materials  Vol.71</title>
</titleInfo>
<titleInfo type="alternative">
  <title/>
</titleInfo>
<name type="personal">
  <namePart>Editor: R. P. Agarwala</namePart>
  <role>
    <roleTerm type="text" authority="marcrelator">creator</roleTerm>
  </role>
</name>
<typeOfResource>text</typeOfResource>
<originInfo>
  <publisher>Scitec Publications Ltd</publisher>
  <dateIssued>2000-01-01 00:00:00 +0900</dateIssued>
  <frequency>unknown</frequency>
</originInfo>
<language>
  <languageTerm authority="iso639-2b" type="code">eng</languageTerm>
</language>
<physicalDescription>
  <form authority="marcform">volume</form>
  <extent>270p; 25cm</extent>
</physicalDescription>
<subject>
</subject>
<classification authority="udc">548.526</classification>
<abstract/>
<note/>
<identifier type="isbn">9783908450443</identifier>
<recordInfo>
  <recordCreationDate>2000-05-26 01:37:47 +0900</recordCreationDate>
  <recordChangeDate>2025-12-15 09:52:45 +0900</recordChangeDate>
  <recordIdentifier>https://library.nims.go.jp/manifestations/43120</recordIdentifier>
</recordInfo>
<titleInfo>
  <title>Gettering and deffect engineering in semiconductor technology : GADEST '99 : proceedings of the 8th International Autumn Meeting : Höör, Schweden, September 25-28 1999</title>
</titleInfo>
<titleInfo type="alternative">
  <title/>
</titleInfo>
<name type="personal">
  <namePart>International Autumn Meeting, Gettering and Defect Engineering in Semiconductor Technology</namePart>
  <role>
    <roleTerm type="text" authority="marcrelator">creator</roleTerm>
  </role>
</name>
<name type="personal">
  <namePart>Grimmeiss, H.G.</namePart>
  <role>
    <roleTerm type="text" authority="marcrelator">creator</roleTerm>
  </role>
</name>
<name type="personal">
  <namePart>Ask, L.</namePart>
  <role>
    <roleTerm type="text" authority="marcrelator">creator</roleTerm>
  </role>
</name>
<name type="personal">
  <namePart>Kleverman, M.</namePart>
  <role>
    <roleTerm type="text" authority="marcrelator">creator</roleTerm>
  </role>
</name>
<name type="personal">
  <namePart>Kittler, M.</namePart>
  <role>
    <roleTerm type="text" authority="marcrelator">creator</roleTerm>
  </role>
</name>
<name type="personal">
  <namePart>Richter, H.</namePart>
  <role>
    <roleTerm type="text" authority="marcrelator">creator</roleTerm>
  </role>
</name>
<typeOfResource>text</typeOfResource>
<originInfo>
  <publisher>Scitec Publications</publisher>
  <dateIssued/>
  <frequency>unknown</frequency>
</originInfo>
<language>
  <languageTerm authority="iso639-2b" type="code">eng</languageTerm>
</language>
<physicalDescription>
  <form authority="marcform">volume</form>
  <extent>610 p. ; 25 cm</extent>
</physicalDescription>
<subject>
</subject>
<classification authority="udc">548.526</classification>
<abstract/>
<note/>
<identifier type="isbn">9783908450474</identifier>
<recordInfo>
  <recordCreationDate>1999-10-05 00:46:07 +0900</recordCreationDate>
  <recordChangeDate>2025-12-15 09:52:44 +0900</recordChangeDate>
  <recordIdentifier>https://library.nims.go.jp/manifestations/38246</recordIdentifier>
</recordInfo>
<titleInfo>
  <title>Polycrystalline semiconductors V : bulk materials, thin films and devices : proceedings of the Fifth International Conference, held in Schwäbisch Gmünd, Germany, September 13-18, 1998</title>
</titleInfo>
<titleInfo type="alternative">
  <title/>
</titleInfo>
<name type="personal">
  <namePart>International Conference on Polycrystalline Semiconductors</namePart>
  <role>
    <roleTerm type="text" authority="marcrelator">creator</roleTerm>
  </role>
</name>
<name type="personal">
  <namePart>Werner, J. H. (Jürgen Heinz)</namePart>
  <role>
    <roleTerm type="text" authority="marcrelator">creator</roleTerm>
  </role>
</name>
<name type="personal">
  <namePart>Strunk, H. P. (Horst Paul)</namePart>
  <role>
    <roleTerm type="text" authority="marcrelator">creator</roleTerm>
  </role>
</name>
<name type="personal">
  <namePart>Schock, H. W.</namePart>
  <role>
    <roleTerm type="text" authority="marcrelator">creator</roleTerm>
  </role>
</name>
<typeOfResource>text</typeOfResource>
<originInfo>
  <publisher>Scitec Publications</publisher>
  <dateIssued/>
  <frequency>unknown</frequency>
</originInfo>
<language>
  <languageTerm authority="iso639-2b" type="code">eng</languageTerm>
</language>
<physicalDescription>
  <form authority="marcform">volume</form>
  <extent>xvi, 597 p. ; 25 cm</extent>
</physicalDescription>
<subject>
</subject>
<classification authority="udc">548.526</classification>
<abstract/>
<note>Includes bibliographical references and indexes</note>
<identifier type="isbn">9783908450436</identifier>
<recordInfo>
  <recordCreationDate>1999-06-04 23:52:40 +0900</recordCreationDate>
  <recordChangeDate>2025-12-15 09:52:44 +0900</recordChangeDate>
  <recordIdentifier>https://library.nims.go.jp/manifestations/35354</recordIdentifier>
</recordInfo>
</modsCollection>
