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Barrett ...[et al.] ; sponsored by University of Denver Department of Engineering and JCPDS-International Centre for Diffraction Data//Vol. 32: "Proceedings of the 37th Annual Conference on Applications of X-Ray Analysis, held August 1-5, 1988, in Steamboat Springs, Colorado"//Vol. 33: "Proceedings of the 38th Annual Conference on Applications of X-ray Analysis, held July 31-August 4, 1989, in Denver, Colorado"//Vol. 34: "Proceedings of the 39th Annual Conference on Applications of X-ray Analysis, held July 30-August 3, 1990, in Steamboat Springs, Colorado"//Vol. 35: "Proceedings of the 40th Annual Conference on Applications of X-ray Analysis, held August 7-16, 1991, in Steamboat Springs, Colorado"//Vol. 36, 37. edited by John V. Gilfrich ... [et al.] ; sponsored by University of Denver Department of Engineering and International Centre for Diffraction Data//Vol. 36: "Proceedings of the 41st Annual Conference on Applications of X-ray Analysis, held August 3-7, 1992, in Colorado Springs, Colorado"//Vol. 37: "Proceedings of the 42nd Annual Conference on Applications of X-Ray Analysis, held August 2-6, 1993, in Denver, Colorado"//Vol. 38: "Proceedings of the 43rd Annual Conference on Applications of X-Ray Analysis, held August 1-5, 1994, in Steamboat Springs, Colorado"//vol. 39: "Proceedings of the 44th Annual Conference on Applications of X-Ray Analysis, held July 31-August 4, 1995, in Colorado Springs, Colorado"//vol. 40: "Proceedings of the 45th Annual Conference on Applications of X-Ray Analysis, held August 3-8, 1996, Denver, Colorado" CD-ROM//36th, 38th, 42nd : 1987, 1989, 1993 : Denver, Colorado//37th, 39-40th, 43rd : 1988, 1990-1991, 1994 : Steamboat Spring, Colorado//41st, 44th : 1992, 1995 : Colorado Spring, Colorado</note> <identifier type="isbn">9780306429323</identifier> <recordInfo> <recordCreationDate>1999-05-19 08:51:03 +0900</recordCreationDate> <recordChangeDate>2025-12-15 09:31:15 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/37477</recordIdentifier> </recordInfo> <titleInfo> <title>Gamma- and x-ray spectrometry with semiconductor detectors </titleInfo> <name type="personal"> <namePart>Debertin, Klaus</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>Helmer, Richard G.</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>North-Holland</publisher> <publisher>Sole distibutors for the USA and Canada, Elsevier Science Pub. 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