核化学と放射化学 </titleInfo> <name type="personal"> <namePart>フリードランター｜斉藤信房，柴田長夫</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>丸善</publisher> <dateIssued>1964-01-01 00:00:00 +0900</dateIssued> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">jpn</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>507p; 21cm</extent> </physicalDescription> <subject> </subject> <classification authority="udc">541.27</classification> <abstract/> <note/> <recordInfo> <recordCreationDate>1999-05-19 08:34:10 +0900</recordCreationDate> <recordChangeDate>2025-12-23 15:18:03 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/35932</recordIdentifier> </recordInfo> <titleInfo> <title>微粒子ハンドブック 神保, 元二 creator 小沢, 英一 creator 向阪, 保雄 creator 小宮山, 宏 creator 定方, 正毅 creator 吉沢, 昭宣 creator text 朝倉書店 unknown jpn
volume
xi, 472, 13p ; 22cm 666.3 執筆: 青木隆一ほか//文献: 項末//その他の編者: 小沢英一, 向阪保雄, 小宮山宏, 定方正毅, 吉沢昭宣 9784254200492 1999-05-19 08:34:04 +0900 2025-12-15 09:24:03 +0900 https://library.nims.go.jp/manifestations/35928 電子技術総合研究所最近の十年史 </titleInfo> <name type="corporate"> <namePart>電総研創立１００周年記念事業実行委員会</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>電子技術総合研究所</publisher> <dateIssued>1991-01-01 00:00:00 +0900</dateIssued> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">jpn</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>420p; 27cm</extent> </physicalDescription> <subject> </subject> <classification authority="udc">091</classification> <abstract/> <note/> <recordInfo> <recordCreationDate>1999-05-19 08:33:51 +0900</recordCreationDate> <recordChangeDate>2025-12-23 15:14:57 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/35918</recordIdentifier> </recordInfo> <titleInfo> <title>Manual on fatigue testing </titleInfo> <name type="personal"> <namePart>American Society for Testing Materials</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>ASTM Committee E-9 on Fatigue</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>ASTM</publisher> <dateIssued/> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>82 p. ; 23 cm</extent> </physicalDescription> <subject> </subject> <classification authority="udc">STP</classification> <abstract/> <note/> <recordInfo> <recordCreationDate>1999-05-19 08:33:49 +0900</recordCreationDate> <recordChangeDate>2025-12-23 15:14:57 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/35915</recordIdentifier> </recordInfo> <titleInfo> <title>Symposium on impact testing : presented at the Fifty-eighth Annual Meeting, American Society for Testing Materials, Atlantic City, N.J., June 27, 1955 </titleInfo> <name type="corporate"> <namePart>American Society for Testing and Materials</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>ASTM</publisher> <dateIssued/> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>170 p. ; 23 cm</extent> </physicalDescription> <subject> </subject> <classification authority="udc">620.17</classification> <abstract/> <note>"sponsored by Committee E-1 on Methods of Testing "</note> <recordInfo> <recordCreationDate>1999-05-19 08:33:47 +0900</recordCreationDate> <recordChangeDate>2025-12-23 15:14:57 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/35914</recordIdentifier> </recordInfo> <titleInfo> <title>Symposium on elevated temperature strain gages </titleInfo> <name type="corporate"> <namePart>American Society for Testing and Materials</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>Aeronautical Structures Laboratory</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>American Society for Testing Materials</publisher> <dateIssued/> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>iv, 163 p. ; 23 cm</extent> </physicalDescription> <subject> </subject> <classification authority="udc">620.17</classification> <abstract/> <note/> <recordInfo> <recordCreationDate>1999-05-19 08:33:46 +0900</recordCreationDate> <recordChangeDate>2025-12-23 15:16:01 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/35913</recordIdentifier> </recordInfo> <titleInfo> <title>Symposium on statistical aspects of fatigue : presented at the Fifty-fourth Annual Meeting, American Society for Testing Materials, Atlantic City, N.J., June 19, 1951 </titleInfo> <name type="corporate"> <namePart>American Society for Testing and Materials</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>ASTM</publisher> <dateIssued/> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>64 p. ; 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