<?xml version="1.0" encoding="UTF-8"?>
<modsCollection xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns="http://www.loc.gov/mods/v3">
<titleInfo>
  <title>Transistor technology</title>
</titleInfo>
<titleInfo type="alternative">
  <title/>
</titleInfo>
<name type="personal">
  <namePart>Bell Telephone Laboratories, Inc.</namePart>
  <role>
    <roleTerm type="text" authority="marcrelator">creator</roleTerm>
  </role>
</name>
<name type="personal">
  <namePart>Bridgers, H. E.</namePart>
  <role>
    <roleTerm type="text" authority="marcrelator">creator</roleTerm>
  </role>
</name>
<name type="personal">
  <namePart>Scaff, J. H.</namePart>
  <role>
    <roleTerm type="text" authority="marcrelator">creator</roleTerm>
  </role>
</name>
<name type="personal">
  <namePart>Shive, John N. (John Northrup)</namePart>
  <role>
    <roleTerm type="text" authority="marcrelator">creator</roleTerm>
  </role>
</name>
<typeOfResource>text</typeOfResource>
<originInfo>
  <publisher>Van Nostrand</publisher>
  <dateIssued/>
  <frequency>unknown</frequency>
</originInfo>
<language>
  <languageTerm authority="iso639-2b" type="code">eng</languageTerm>
</language>
<physicalDescription>
  <form authority="marcform">volume</form>
  <extent>1 v. ; 24 cm</extent>
</physicalDescription>
<subject>
</subject>
<classification authority="udc">621.3</classification>
<abstract/>
<note>Vols. 2-3: edited by F.J. Biondi//Includes bibliographical references and index</note>
<recordInfo>
  <recordCreationDate>1999-05-19 07:48:58 +0900</recordCreationDate>
  <recordChangeDate>2025-12-15 09:43:27 +0900</recordChangeDate>
  <recordIdentifier>https://library.nims.go.jp/manifestations/38650</recordIdentifier>
</recordInfo>
<titleInfo>
  <title>Full-scale fatigue testing of aircraft structures : proceedings of the symposium held in Amsterdam, 5th-11th June 1959</title>
</titleInfo>
<titleInfo type="alternative">
  <title/>
</titleInfo>
<name type="personal">
  <namePart>Plantema, F. J.</namePart>
  <role>
    <roleTerm type="text" authority="marcrelator">creator</roleTerm>
  </role>
</name>
<name type="personal">
  <namePart>Schijve, J.</namePart>
  <role>
    <roleTerm type="text" authority="marcrelator">creator</roleTerm>
  </role>
</name>
<typeOfResource>text</typeOfResource>
<originInfo>
  <publisher>Pergamon</publisher>
  <dateIssued/>
  <frequency>unknown</frequency>
</originInfo>
<language>
  <languageTerm authority="iso639-2b" type="code">eng</languageTerm>
</language>
<physicalDescription>
  <form authority="marcform">volume</form>
  <extent>x, 426 p. ; 24 cm</extent>
</physicalDescription>
<subject>
</subject>
<classification authority="udc">620.17</classification>
<abstract/>
<note/>
<recordInfo>
  <recordCreationDate>1999-05-19 07:45:06 +0900</recordCreationDate>
  <recordChangeDate>2025-12-15 09:41:16 +0900</recordChangeDate>
  <recordIdentifier>https://library.nims.go.jp/manifestations/32694</recordIdentifier>
</recordInfo>
<titleInfo>
  <title>Recrystallization and related annealing phenomena</title>
</titleInfo>
<titleInfo type="alternative">
  <title/>
</titleInfo>
<name type="personal">
  <namePart>Humphreys, F. J.</namePart>
  <role>
    <roleTerm type="text" authority="marcrelator">creator</roleTerm>
  </role>
</name>
<name type="personal">
  <namePart>Hatherly, M.</namePart>
  <role>
    <roleTerm type="text" authority="marcrelator">creator</roleTerm>
  </role>
</name>
<typeOfResource>text</typeOfResource>
<originInfo>
  <publisher>Pergamon</publisher>
  <dateIssued/>
  <frequency>unknown</frequency>
</originInfo>
<language>
  <languageTerm authority="iso639-2b" type="code">eng</languageTerm>
</language>
<physicalDescription>
  <form authority="marcform">volume</form>
  <extent>xxi, 497 p. ; 24 cm</extent>
</physicalDescription>
<subject>
</subject>
<classification authority="udc">621.785.3</classification>
<abstract/>
<note>Includes index</note>
<identifier type="isbn">9780080418841</identifier>
<recordInfo>
  <recordCreationDate>1999-05-19 06:35:00 +0900</recordCreationDate>
  <recordChangeDate>2025-12-15 09:45:09 +0900</recordChangeDate>
  <recordIdentifier>https://library.nims.go.jp/manifestations/38724</recordIdentifier>
</recordInfo>
<titleInfo>
  <title>Polarized light in metallography</title>
</titleInfo>
<titleInfo type="alternative">
  <title/>
</titleInfo>
<name type="personal">
  <namePart>Conn, G. K. T. (George Keith Thurburn)</namePart>
  <role>
    <roleTerm type="text" authority="marcrelator">creator</roleTerm>
  </role>
</name>
<name type="personal">
  <namePart>Bradshaw, F. J.</namePart>
  <role>
    <roleTerm type="text" authority="marcrelator">creator</roleTerm>
  </role>
</name>
<typeOfResource>text</typeOfResource>
<originInfo>
  <publisher>Butterworths Scientific Pub.</publisher>
  <dateIssued/>
  <frequency>unknown</frequency>
</originInfo>
<language>
  <languageTerm authority="iso639-2b" type="code">eng</languageTerm>
</language>
<physicalDescription>
  <form authority="marcform">volume</form>
  <extent>xi, 130 p. ; 22 cm</extent>
</physicalDescription>
<subject>
</subject>
<classification authority="udc">539</classification>
<abstract/>
<note/>
<recordInfo>
  <recordCreationDate>1999-05-19 03:50:00 +0900</recordCreationDate>
  <recordChangeDate>2025-12-15 09:31:21 +0900</recordChangeDate>
  <recordIdentifier>https://library.nims.go.jp/manifestations/62351</recordIdentifier>
</recordInfo>
<titleInfo>
  <title>リラックスの科学 : 毎日のストレスを効果的に解放する</title>
</titleInfo>
<titleInfo type="alternative">
  <title>Calm down</title>
</titleInfo>
<name type="personal">
  <namePart>McGuigan, F. J. (Frank J.)</namePart>
  <role>
    <roleTerm type="text" authority="marcrelator">creator</roleTerm>
  </role>
</name>
<name type="personal">
  <namePart>三谷, 恵一</namePart>
  <role>
    <roleTerm type="text" authority="marcrelator">creator</roleTerm>
  </role>
</name>
<name type="personal">
  <namePart>森, 昭胤</namePart>
  <role>
    <roleTerm type="text" authority="marcrelator">creator</roleTerm>
  </role>
</name>
<typeOfResource>text</typeOfResource>
<originInfo>
  <publisher>講談社</publisher>
  <dateIssued/>
  <frequency>unknown</frequency>
</originInfo>
<language>
  <languageTerm authority="iso639-2b" type="code">jpn</languageTerm>
</language>
<physicalDescription>
  <form authority="marcform">volume</form>
  <extent>221p ; 18cm</extent>
</physicalDescription>
<subject>
</subject>
<classification authority="udc">B</classification>
<abstract/>
<note>記述は第7刷による//初刷の頁数:219,4p//参考文献:巻末</note>
<identifier type="isbn">9784061327153</identifier>
<recordInfo>
  <recordCreationDate>1901-01-01 09:00:00 +0900</recordCreationDate>
  <recordChangeDate>2025-05-01 13:58:48 +0900</recordChangeDate>
  <recordIdentifier>https://library.nims.go.jp/manifestations/37934</recordIdentifier>
</recordInfo>
<titleInfo>
  <title>Electron beam x-ray microanalysis</title>
</titleInfo>
<titleInfo type="alternative">
  <title/>
</titleInfo>
<name type="personal">
  <namePart>Heinrich, Kurt F. J.</namePart>
  <role>
    <roleTerm type="text" authority="marcrelator">creator</roleTerm>
  </role>
</name>
<typeOfResource>text</typeOfResource>
<originInfo>
  <publisher>Van Nostrand Reinhold Co.</publisher>
  <dateIssued/>
  <frequency>unknown</frequency>
</originInfo>
<language>
  <languageTerm authority="iso639-2b" type="code">eng</languageTerm>
</language>
<physicalDescription>
  <form authority="marcform">volume</form>
  <extent>xxiii, 578 p., [4] leaves of plates ; 24 cm</extent>
</physicalDescription>
<subject>
</subject>
<classification authority="udc">621.38</classification>
<abstract/>
<note>Includes bibliographical references and indexes</note>
<identifier type="isbn">9780442232863</identifier>
<recordInfo>
  <recordCreationDate>1901-01-01 09:00:00 +0900</recordCreationDate>
  <recordChangeDate>2025-12-15 09:44:09 +0900</recordChangeDate>
  <recordIdentifier>https://library.nims.go.jp/manifestations/42077</recordIdentifier>
</recordInfo>
</modsCollection>
