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1 v. ; 29 cm 621.385.833 Vol. 1 : part I Proceedings of the 9th annual scanning electron microscope symposium[ほか] edited by Om Johari//Vol. 2 : Proceedings of the workshops on biological applications of the scanning & scanning transmission electron microscope edited by Om Johari and Robert P. Becker//April 5-9, 1976//Sponsored by IIT Research Institute//Session held at Four Seasons Sheraton Hotel Toronto, Canada 9780915802098 1901-01-01 09:00:00 +0900 2025-12-15 09:44:27 +0900 https://library.nims.go.jp/manifestations/42080 Scanning electron microscopy/1977/I : Proceedings of the 10th Annual Scanning Electron Microscope Symposium and workshops on materials and component characterization/quality control with the SEM/STEM, SEM applications to semiconductors, analytical electron microscopy, biological specimen preparation for SEM, March 28 - April 1, 1977 : Sessions held at McCormick INN, Chicago, Illinois SEM Scanning Electron Microscope Symposium creator Johari, Om creator IIT Research Institute creator edited by Om Johari text IIT Research Institute unknown eng
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xvi, 783 p. ; 29 cm 621.385.833 9780915802111 1901-01-01 09:00:00 +0900 2025-12-15 09:44:28 +0900 https://library.nims.go.jp/manifestations/42081 Vacancies and interstitials in metals : proceedings of the International Conference held at Jülich, Germany, 23-28 September 1968 </titleInfo> <name type="personal"> <namePart>International Conference on Vacancies and Interstitials in Metals</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>Seeger, Alfred</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>North Holland</publisher> <publisher>Sole distributors for the Western Hemisphere, Wiley Interscience Division, John Wiley</publisher> <dateIssued/> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>xi, 1073 p. ; 25 cm</extent> </physicalDescription> <subject> </subject> <classification authority="udc">669.09</classification> <abstract/> <note>Includes bibliographical references and indexes</note> <identifier type="isbn">9780720401547</identifier> <recordInfo> <recordCreationDate>1901-01-01 09:00:00 +0900</recordCreationDate> <recordChangeDate>2025-04-21 15:27:01 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/42082</recordIdentifier> </recordInfo> <titleInfo> <title>Scanning electron microscopy 1968 : proceedings of the Symposium on the Scanning Electron Microscope -- the instrument and its applications, held at IIT Research Institute, Chicago, Illnois, USA, April 30-May 1, 1968 </titleInfo> <name type="personal"> <namePart>Scanning Electron Microscope Symposium</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>IIT Research Institute</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>edited by Om Johari</namePart> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>IIT Research Institute</publisher> <dateIssued/> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>viii, 185 p. ; 29 cm</extent> </physicalDescription> <subject> </subject> <classification authority="udc">621.385.833</classification> <abstract/> <note>Includes bibliographical references and index</note> <recordInfo> <recordCreationDate>1901-01-01 09:00:00 +0900</recordCreationDate> <recordChangeDate>2025-12-15 09:44:27 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/42083</recordIdentifier> </recordInfo> </modsCollection>