Quantitative surface analysis of materials : a symposium sponsored by ASTM Committee E-42 on Surface Analysis, American Society for Testing and Materials, Cleveland, Ohio, 2-3 March 1977 </titleInfo> <name type="personal"> <namePart>Symposium on Progress in Quantitative Surface Analysis</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>McIntyre, N. 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Subcommittee 15 on Scanning Microscopy and Microprobe Analysis</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>American Society for Testing and Materials</publisher> <dateIssued/> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>182 p. ; 24 cm</extent> </physicalDescription> <subject> </subject> <classification authority="udc">STP</classification> <abstract/> <note>Sponsored by Subcommittee 11 on Electron Microscopy and Diffraction, Subcommittee 14 on Quantitative Metallography, and Subcommittee 15 on Scanning Microscopy and Microprobe Analysis of the American Society for Testing and Materials//Includes bibliographical references</note> <recordInfo> <recordCreationDate>1999-05-19 07:35:09 +0900</recordCreationDate> <recordChangeDate>2025-12-23 15:13:41 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/31914</recordIdentifier> </recordInfo> <titleInfo> <title>Irreversible effects of high pressure and temperature on materials : a symposium presented at the International Conference on Materials, American Society for Testing and Materials, Philadelphia, Pa., February 3-6, 1964 </titleInfo> <name type="personal"> <namePart>ASTM International Conference on Materials</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>ASTM. 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