Symposium on basic effects of environment on the strength, scaling, and embrittlement of metals at high temperatures : presented at the Cincinnati Meeting, American Society for Testing Materials, February 2, 1955 </titleInfo> <name type="corporate"> <namePart>American Society for Testing and Materials</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>ASTM</publisher> <dateIssued/> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>114 p. ; 23 cm</extent> </physicalDescription> <subject> </subject> <classification authority="udc">STP</classification> <abstract/> <note>"sponsored by the General Research Laboratories, Westinghouse Electric Corp., East Pittsburgh, Pa."</note> <recordInfo> <recordCreationDate>1999-05-19 07:15:23 +0900</recordCreationDate> <recordChangeDate>2025-12-23 15:16:45 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/30516</recordIdentifier> </recordInfo> <titleInfo> <title>Techniques of electron microscopy, diffraction, and microprobe analysis : presented at the sixty-sixth annual meeting, American Society for Testing and Materials, Atlantic City, N.J., June 26, 1963 </titleInfo> <name type="personal"> <namePart>Symposium on Advances in electron Metallography</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>American Society for Testing and Materials. Committee E-4 on Metallography</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>ASTM</publisher> <dateIssued/> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>vi, 89 p. ; 23 cm</extent> </physicalDescription> <subject> </subject> <classification authority="udc">STP</classification> <abstract/> <note>"Sponsored by Subcommittee XI on Electron Microstructure of Metals of ASTM Committee E-4 on Metallography."//This is v.5 of "ASTM advances in electron metallography series" (data based on Advances in electron metallography, v.6, 1966)</note> <recordInfo> <recordCreationDate>1999-05-19 07:15:22 +0900</recordCreationDate> <recordChangeDate>2025-12-23 15:15:39 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/30515</recordIdentifier> </recordInfo> <titleInfo> <title>Electric conduction in semiconductors and metals </titleInfo> <name type="personal"> <namePart>Ehrenberg, W. (Werner)</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>At the Clarendon Press</publisher> <dateIssued/> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>x, 389 p. ; 25 cm</extent> </physicalDescription> <subject> </subject> <classification authority="udc">537.3</classification> <abstract/> <note>Bibliography: p. [377]-381//Includes index</note> <recordInfo> <recordCreationDate>1999-05-19 03:52:00 +0900</recordCreationDate> <recordChangeDate>2025-12-15 09:29:39 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/66387</recordIdentifier> </recordInfo> <titleInfo> <title>Organische Kation-Radikale und Polyradikale, Substanzenverzeichnis für die Bände II/1 und II/9 Organic cation radicals and polyradicals, index of substances for volumes II/1 and II/9//Magnetic properties of free radicals//Atomic and molecular physics Forrester, A. R. creator Fischer, Hanns creator Hellwege, K. H. creator text Springer unknown eng
volume
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