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volume
x, 451 p., [1] leaf of plates ; 25 cm 539.319 Includes bibliographical references and indexes 1999-05-19 07:32:12 +0900 2025-12-15 09:33:27 +0900 https://library.nims.go.jp/manifestations/31712 X-ray microscopy and X-ray microanalysis : proceedings of the Second International Symposium (Stockholm, 1960) X-Ray microscopy and microanalysis International Symposium on X-ray Optics and X-ray Microanalysis creator Engström, Arne creator Cosslett, V. creator Pattee, H. creator edited by A. Engstrom, V. Cosslett, H. Pattee text Elsevier unknown eng
volume
x, 542 p. ; 25 cm 539.26 Papers in English, German, or French//Includes bibliographies 1999-05-19 07:32:07 +0900 2025-12-15 09:33:15 +0900 https://library.nims.go.jp/manifestations/73700 The electron band theory of solids </titleInfo> <name type="personal"> <namePart>Fletcher, Geoffrey Charles</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>North-Holland</publisher> <dateIssued/> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>xv, 260 p. ; 23 cm</extent> </physicalDescription> <subject> </subject> <classification authority="udc">539.2</classification> <abstract/> <note>"Sole distributors for the U.S.A. and Canada: American Elsevier Publishing Company."//Bibliography: p. [253]</note> <identifier type="isbn">9780720402070</identifier> <recordInfo> <recordCreationDate>1999-05-19 07:31:21 +0900</recordCreationDate> <recordChangeDate>2025-12-15 09:32:19 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/71933</recordIdentifier> </recordInfo> </modsCollection>