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1 v. ; 23-24 cm 541.1 Vol. 7-26: H. Eyring, editor ; C.J. Christensen, H.S. Johnston, associate editors//Vol. 27: B. Seymour Rabinovitch, editor ; H.S. Johnston, J. Michael Schurr, associate editors//Vol. 28-36: B. Seymour Rabinovitch, editor ; J. Michael Schurr, Herbert Strauss, associate editors//Vol. 37-41: Herbert L. Strauss, editor ; Gerald T. Babcock, C. Bradley Moore, associate editors//Vol. 42-: Herbert L. Strauss, editor ; Gerald T. Babcock, Stephen R. Leone, associate editors//Vol. 52-: Stephen R. Leone, editor ; Paul Alivisatos, Ann E. Mcdermott, associate editors//Vol. 58-60: Stephen R. Leone, editor ; Jay T. Groves, Rustem F. Ismagilov, Geraldine Richmond, associate editors//Vol. 61: Stephen R. Leone, editor ; Paul S. Cremer, Jay T. Groves, Mark A. Johnson, Geraldine Richmond, associate editors//Vol. 62: Stephen R. Leone, editor ; Paul S. Cremer, Jay T. Groves, Mark A. Johnson, associate editors//Vol. 63-65: Mark A. Johnson, Todd J. Martinez, Co-editors ; Paul S. Cremer, Jay T. Groves, associate editors//Vol. 66: Mark A. Johnson, Todd J. Martinez, Co-editors ; Jay T. Groves, associate editor//Vol. 67-71: Mark A. Johnson, Todd J. Martinez, Co-editors//Erratum at first of vol. 16 9780824310257 2000-12-26 03:09:16 +0900 2025-12-15 09:34:32 +0900 https://library.nims.go.jp/manifestations/1710 Advances in optical and electron microscopy </titleInfo> <name type="personal"> <namePart>Barer, R.</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>Cosslett, V. E. (Vernon Ellis)</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>Academic Press</publisher> <dateIssued/> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>1 v. ; 24 cm</extent> </physicalDescription> <subject> </subject> <classification authority="udc">535.8</classification> <abstract/> <note>Includes bibliographies and index//Vol. 11,12,13,14 / edited by T. Mulvey and C.J.R. Sheppard</note> <identifier type="isbn">9780120299058</identifier> <recordInfo> <recordCreationDate>2000-12-26 03:09:08 +0900</recordCreationDate> <recordChangeDate>2025-12-15 09:28:57 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/1696</recordIdentifier> </recordInfo> <titleInfo> <title>Quantitative microscopy DeHoff, Robert T. creator Rhines, Frederick Nims creator University of Florida creator text McGraw-Hill unknown eng
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x, 422 p ; 23 cm 535.8 "Papers presented at a symposium ... held at the University of Florida in February of 1961"//Includes bibliographies 2000-12-26 03:08:58 +0900 2025-12-15 09:28:59 +0900 https://library.nims.go.jp/manifestations/76251 Ion implantation </titleInfo> <name type="personal"> <namePart>International Conference on Ion Implantation in Semiconductors</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>Eisen, Fred H.</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>Chadderton, Lewis T.</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>Gordon and Breach Science Publishers</publisher> <dateIssued/> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>xii, 464 p. ; 27 cm</extent> </physicalDescription> <subject> </subject> <classification authority="udc">539.2</classification> <abstract/> <note>1st International Conference on Ion Implantation in Semiconductors held in Thousand Oaks, California, May 4-9th, 1970//Includes bibliographical references</note> <identifier type="isbn">9780677150000</identifier> <recordInfo> <recordCreationDate>2000-12-26 03:08:42 +0900</recordCreationDate> <recordChangeDate>2025-12-15 09:32:19 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/1654</recordIdentifier> </recordInfo> <titleInfo> <title>Proceedings of the Sixth International Conference on X-ray optics and microanalysis </titleInfo> <name type="personal"> <namePart>International Congress on X-ray Optics and Microanalysis</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>Shinoda, G.</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>高良, 和武</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>市ノ川, 竹男</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>Tokyo Press</publisher> <dateIssued/> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>xi, 908 p. ; 26 cm</extent> </physicalDescription> <subject> </subject> <classification authority="udc">548.7</classification> <abstract/> <note>Includes bibliographies//The Conference held at Osaka, September 5-10, 1971</note> <recordInfo> <recordCreationDate>2000-12-26 03:08:40 +0900</recordCreationDate> <recordChangeDate>2025-12-15 09:40:06 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/1650</recordIdentifier> </recordInfo> <titleInfo> <title>Electron diffraction </titleInfo> <name type="personal"> <namePart>Rymer, T. B.</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>Methuen</publisher> <dateIssued/> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>x, 165 p ; 23 cm</extent> </physicalDescription> <subject> </subject> <classification authority="udc">621.833</classification> <abstract/> <note>"Distributed in the U.S.A. by Barnes & Noble."//Bibliography: p. 162-163</note> <identifier type="isbn">9780416076608</identifier> <recordInfo> <recordCreationDate>2000-12-26 03:08:37 +0900</recordCreationDate> <recordChangeDate>2025-12-15 09:45:53 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/77079</recordIdentifier> </recordInfo> <titleInfo> <title>Anharmonic lattices, structural transitions and melting </titleInfo> <name type="personal"> <namePart>NATO Advanced Study Institute</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>Riste, Tormod</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>Noordhoff</publisher> <dateIssued/> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>ix, 451 p. ; 25 cm</extent> </physicalDescription> <subject> </subject> <classification authority="udc">539.2</classification> <abstract/> <note>Papers presented at the Nato Advanced Study Institute held at Ustaoset, Høyfjellshotel, near Geilo, Norway, 24th April-1st May, 1973//Includes bibliographical references</note> <identifier type="isbn">9789028605336</identifier> <recordInfo> <recordCreationDate>2000-12-26 03:08:33 +0900</recordCreationDate> <recordChangeDate>2025-12-15 09:32:42 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/72146</recordIdentifier> </recordInfo> <titleInfo> <title>Crystallographic groups </titleInfo> <name type="personal"> <namePart>Janssen, T</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>North-Holland Pub.</publisher> <publisher>American Elsevier</publisher> <dateIssued/> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>xiii, 281 p. ; 23 cm</extent> </physicalDescription> <subject> </subject> <classification authority="udc">548.51</classification> <abstract/> <note>Bibliography: p. 272-277</note> <identifier type="isbn">9780720401943</identifier> <recordInfo> <recordCreationDate>2000-12-26 03:08:01 +0900</recordCreationDate> <recordChangeDate>2025-12-15 09:39:49 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/1577</recordIdentifier> </recordInfo> </modsCollection>