Proceedings of The 1st National Conference on Defects in Semiconductors NCDS-1 Bagraev, Nickolay T. creator National Conference on Defects in Semiconductor creator text Scitec Publications unknown eng
volume
678 p. ; 25 cm 537.311 Includes bibliographical references and indexes 9780878496662 1901-01-01 09:00:00 +0900 2025-12-15 09:29:52 +0900 https://library.nims.go.jp/manifestations/72003 Modern electroplating </titleInfo> <name type="personal"> <namePart>Schlesinger, Mordechay</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>Paunovic, Milan</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>edited by Mordechay Schlesinger, Milan Paunovic.</namePart> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>John Wiley</publisher> <dateIssued/> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>xiv, 868 p. ; 26 cm</extent> </physicalDescription> <subject> </subject> <classification authority="udc">621.35</classification> <abstract/> <note>"Sponsored by the Electrochemical Society, Inc."//"A Wiley-Interscience publication."//Includes bibliographical references and index</note> <identifier type="isbn">9780471168249</identifier> <recordInfo> <recordCreationDate>1901-01-01 09:00:00 +0900</recordCreationDate> <recordChangeDate>2025-12-15 09:43:53 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/77876</recordIdentifier> </recordInfo> <titleInfo> <title>Diffusion and Defect Data Pt.A Defect and Diffusion Forum Vol.131-132 Vol.131-132 </titleInfo> <name type="personal"> <namePart>D.L.Beke I.A.Szabo</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>Scitec Publications</publisher> <dateIssued>1996-01-01 00:00:00 +0900</dateIssued> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>456p; 25cm</extent> </physicalDescription> <subject> </subject> <classification authority="udc">548.526</classification> <abstract/> <note/> <recordInfo> <recordCreationDate>1901-01-01 09:00:00 +0900</recordCreationDate> <recordChangeDate>2025-12-15 09:52:34 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/37680</recordIdentifier> </recordInfo> <titleInfo> <title>Band tailings and deep defects in semiconductors </titleInfo> <name type="personal"> <namePart>Teate, A. 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