Symmetry principles in solid state and molecular physics </titleInfo> <name type="personal"> <namePart>Lax, Melvin J.</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>Wiley</publisher> <dateIssued/> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>xi, 499 p. ; 23 cm</extent> </physicalDescription> <subject> </subject> <classification authority="udc">539.2</classification> <abstract/> <note>"A Wiley-Interscience publication."//Bibliography: p. 469-480//Includes index</note> <identifier type="isbn">9780471519034</identifier> <recordInfo> <recordCreationDate>1901-01-01 09:00:00 +0900</recordCreationDate> <recordChangeDate>2025-12-15 09:32:33 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/65851</recordIdentifier> </recordInfo> <titleInfo> <title>Atom probe field ion microscopy </titleInfo> <name type="personal"> <namePart>Miller, M. K. (Michael Kenneth)</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>Clarendon Press</publisher> <dateIssued/> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>xi, 509 p. ; 24 cm</extent> </physicalDescription> <subject> </subject> <classification authority="udc">539.24</classification> <abstract/> <note>Includes references</note> <identifier type="isbn">9780198513872</identifier> <recordInfo> <recordCreationDate>1901-01-01 09:00:00 +0900</recordCreationDate> <recordChangeDate>2025-12-15 09:33:12 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/66332</recordIdentifier> </recordInfo> <titleInfo> <title>Nuclear Engineering International Vol.24 No.280-293 Vol.24 No.280-293 </titleInfo> <typeOfResource>text</typeOfResource> <originInfo> <publisher>Heywood-Temple Industrial Publications</publisher> <dateIssued>1979-01-01 00:00:00 +0900</dateIssued> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>29</extent> </physicalDescription> <subject> </subject> <abstract/> <note/> <recordInfo> <recordCreationDate>1901-01-01 09:00:00 +0900</recordCreationDate> <recordChangeDate>2025-04-21 11:52:36 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/66068</recordIdentifier> </recordInfo> <titleInfo> <title>Proceedings of The 1st National Conference on Defects in Semiconductors NCDS-1 Bagraev, Nickolay T. creator National Conference on Defects in Semiconductor creator text Scitec Publications unknown eng
volume
678 p. ; 25 cm 537.311 Includes bibliographical references and indexes 9780878496662 1901-01-01 09:00:00 +0900 2025-12-15 09:29:52 +0900 https://library.nims.go.jp/manifestations/72003