Introduction to analytical electron microscopy </titleInfo> <name type="personal"> <namePart>Hren, John J.</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>Goldstein, Joseph</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>Joy, David C.</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>Electron Microscopy Society of America</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <name type="personal"> <namePart>Microbeam Analysis Society. Conference</namePart> <role> <roleTerm type="text" authority="marcrelator">creator</roleTerm> </role> </name> <typeOfResource>text</typeOfResource> <originInfo> <publisher>Plenum Press</publisher> <dateIssued/> <frequency>unknown</frequency> </originInfo> <language> <languageTerm authority="iso639-2b" type="code">eng</languageTerm> </language> <physicalDescription> <form authority="marcform">volume</form> <extent>xv, 601 p. ; 27 cm</extent> </physicalDescription> <subject> </subject> <classification authority="udc">537.533.3</classification> <abstract/> <note>"Proceedings of a workshop on analytical electron microscopy, held in San Antonio, Texas, August 13-14, 1979, as part of the joint meeting of the Electron Microscopy Society of America and the Microbeam Analysis Society."//Includes bibliographies and index</note> <identifier type="isbn">9780306402807</identifier> <recordInfo> <recordCreationDate>2000-12-26 03:14:01 +0900</recordCreationDate> <recordChangeDate>2025-12-15 09:30:14 +0900</recordChangeDate> <recordIdentifier>https://library.nims.go.jp/manifestations/45752</recordIdentifier> </recordInfo> </modsCollection>