manifestation_id	original_title	title_alternative	title_transcription	statement_of_responsibility	manifestation_identifier	creator	contributor	publisher	date_of_publication	pub_date	year_of_publication	publication_place	manifestation_created_at	manifestation_updated_at	carrier_type	content_type	frequency	language	isbn	issn	doi	jpno	ncid	lccn	iss_itemno	volume_number	volume_number_string	edition	edition_string	issue_number	issue_number_string	serial_number	extent	start_page	end_page	dimensions	height	width	depth	manifestation_price	access_address	manifestation_required_role	abstract	description	identifier:unknown	identifier:nbn	identifier:isbn10	identifier:iss_itemno	identifier:online_isbn	identifier:print_isbn	identifier:print_issn	identifier:online_issn	identifier:escidoc	identifier:nims	series_statement_id	series_statement_original_title	series_statement_title_subseries	series_statement_title_subseries_transcription	series_statement_title_transcription	series_statement_creator	series_statement_volume_number	series_statement_series_master	series_statement_root_manifestation_id	series_statement_manifestation_id	series_statement_position	series_statement_note	series_statement_created_at	series_statement_updated_at	subject:ndlsh	subject:unknown	subject:bsh	classification:ndc8	classification:ndc9	classification:udc	item_id	item_identifier	binding_item_identifier	call_number	library	shelf	item_note	accepted_at	acquired_at	item_created_at	item_updated_at
105484	ORCID de Ninja Project modify 1					TANIFUJI Mikiko//Pauw, Thomas	""	""					2015-12-15 21:32:38 +0900	2021-10-05 16:51:34 +0900	online_resource	text	unknown	unknown	""	""																					https://hdl.handle.net/20.500.11932/1758245	Guest			""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	talk Research ID//talk Research ID//talk Research ID//talk Research ID	""	""	""	""
105483	ORCID de Ninja Project modify 1					TANIFUJI Mikiko//Pauw, Thomas	""	""					2015-12-15 21:32:36 +0900	2021-10-05 16:54:11 +0900	online_resource	text	unknown	unknown	""	""																					https://hdl.handle.net/20.500.11932/1758247	Guest			""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	talk Research ID//talk Research ID//talk Research ID//talk Research ID	""	""	""	""
105476	ORCID Ninja Tokyo 2014					Sanyoto, Fenny//Tanabe, Kosuke//TANIFUJI Mikiko	""	""					2015-12-15 21:32:24 +0900	2021-10-05 16:53:49 +0900	online_resource	text	unknown	unknown	""	""																					https://hdl.handle.net/20.500.11932/1758226	Guest			""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	ORCID//Ninja//Tokyo//ORCID//Ninja//Tokyo//ORCID//Ninja//Tokyo//ORCID//Ninja//Tokyo	""	""	""	""
105475	Everything SAXS: Small-angle scattering pattern collection and correction					""	""	""					2015-12-15 21:32:23 +0900	2021-10-05 16:39:40 +0900	online_resource	text	unknown	unknown	""	""																					https://hdl.handle.net/20.500.11932/1758219	Guest	"  For obtaining reliable nanostructural details of large amounts of sample ---
and if it is applicable --- Small-Angle Scattering (SAS) is a prime technique
to use. It promises to obtain bulk-scale, statistically sound information on
the morphological details of the nanostructure, and has thus led to many a
researcher investing their time in it over the last eight decades of
development. Due to pressure both from scientists requesting more details on
increasingly complex nanostructures, as well as the ever improving
instrumentation leaving less margin for ambiguity, small-angle scattering
methodologies have been evolving at a high pace over the last few decades.
  As the quality of any results can only be as good as the data that goes into
these methodologies, the improvements in data collection and all imaginable
data correction steps are reviewed here. This work is intended to provide a
comprehensive overview of all data corrections, to aid the small-angle
scatterer to decide which are relevant for their measurement and how these
corrections are performed. Clear mathematical descriptions of the corrections
are provided where feasible. Furthermore, as no quality data exists without a
decent estimate of its precision, the error estimation and propagation through
all these steps is provided alongside the corrections. With these data
corrections, the collected small-angle scattering pattern can be made of the
highest standard allowing for authoritative nanostructural characterisation
through its analysis. A brief background of small-angle scattering, the
instrumentation developments over the years, and pitfalls that may be
encountered upon data interpretations are provided as well.
"		""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	Condensed Matter//Materials Science//cond-mat.mtrl-sci//Physics//Data Analysis//Statistics and Probability//physics.data-an//Physics//Instrumentation and Detectors//physics.ins-det//Condensed Matter//Materials Science//cond-mat.mtrl-sci//Physics//Data Analysis//Statistics and Probability//physics.data-an//Physics//Instrumentation and Detectors//physics.ins-det//Condensed Matter//Materials Science//cond-mat.mtrl-sci//Physics//Data Analysis//Statistics and Probability//physics.data-an//Physics//Instrumentation and Detectors//physics.ins-det//Condensed Matter//Materials Science//cond-mat.mtrl-sci//Physics//Data Analysis//Statistics and Probability//physics.data-an//Physics//Instrumentation and Detectors//physics.ins-det	""	""	""	""
105471	ORCID Ninja Tokyo 2014					Tanabe, Kosuke//TANIFUJI Mikiko	""	""					2015-12-15 21:32:17 +0900	2021-10-05 16:41:44 +0900	online_resource	text	unknown	English	""	""																					https://hdl.handle.net/20.500.11932/1758211	Guest			""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	ORCID//Ninja//Tokyo//ORCID//Ninja//Tokyo//ORCID//Ninja//Tokyo//ORCID//Ninja//Tokyo	""	""	""	""
105470	Everything SAXS: Small-angle scattering pattern collection and correction					""	""	""					2015-12-15 21:32:16 +0900	2021-10-05 16:51:18 +0900	online_resource	text	unknown	unknown	""	""																					https://hdl.handle.net/20.500.11932/1758203	Guest	"  For obtaining reliable nanostructural details of large amounts of sample ---
and if it is applicable --- Small-Angle Scattering (SAS) is a prime technique
to use. It promises to obtain bulk-scale, statistically sound information on
the morphological details of the nanostructure, and has thus led to many a
researcher investing their time in it over the last eight decades of
development. Due to pressure both from scientists requesting more details on
increasingly complex nanostructures, as well as the ever improving
instrumentation leaving less margin for ambiguity, small-angle scattering
methodologies have been evolving at a high pace over the last few decades.
  As the quality of any results can only be as good as the data that goes into
these methodologies, the improvements in data collection and all imaginable
data correction steps are reviewed here. This work is intended to provide a
comprehensive overview of all data corrections, to aid the small-angle
scatterer to decide which are relevant for their measurement and how these
corrections are performed. Clear mathematical descriptions of the corrections
are provided where feasible. Furthermore, as no quality data exists without a
decent estimate of its precision, the error estimation and propagation through
all these steps is provided alongside the corrections. With these data
corrections, the collected small-angle scattering pattern can be made of the
highest standard allowing for authoritative nanostructural characterisation
through its analysis. A brief background of small-angle scattering, the
instrumentation developments over the years, and pitfalls that may be
encountered upon data interpretations are provided as well.
"		""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	Condensed Matter//Materials Science//cond-mat.mtrl-sci//Physics//Data Analysis//Statistics and Probability//physics.data-an//Physics//Instrumentation and Detectors//physics.ins-det//Condensed Matter//Materials Science//cond-mat.mtrl-sci//Physics//Data Analysis//Statistics and Probability//physics.data-an//Physics//Instrumentation and Detectors//physics.ins-det//Condensed Matter//Materials Science//cond-mat.mtrl-sci//Physics//Data Analysis//Statistics and Probability//physics.data-an//Physics//Instrumentation and Detectors//physics.ins-det//Condensed Matter//Materials Science//cond-mat.mtrl-sci//Physics//Data Analysis//Statistics and Probability//physics.data-an//Physics//Instrumentation and Detectors//physics.ins-det	""	""	""	""
105469	Orcid Ninja Shibuya, Tokyo 2014					Tanabe, Kosuke//TANIFUJI Mikiko	""	""					2015-12-15 21:32:15 +0900	2021-10-05 16:51:08 +0900	online_resource	text	unknown	unknown	""	""																					https://hdl.handle.net/20.500.11932/1758205	Guest			""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	ORCID//Ninja//Tokyo//2014//ORCID//Ninja//Tokyo//2014//ORCID//Ninja//Tokyo//2014//ORCID//Ninja//Tokyo//2014	""	""	""	""
105467	Everything SAXS: Small-angle scattering pattern collection and correction					""	""	""					2015-12-15 21:32:11 +0900	2021-10-05 16:54:30 +0900	online_resource	text	unknown	unknown	""	""																					https://hdl.handle.net/20.500.11932/1758199	Guest	"  For obtaining reliable nanostructural details of large amounts of sample ---
and if it is applicable --- Small-Angle Scattering (SAS) is a prime technique
to use. It promises to obtain bulk-scale, statistically sound information on
the morphological details of the nanostructure, and has thus led to many a
researcher investing their time in it over the last eight decades of
development. Due to pressure both from scientists requesting more details on
increasingly complex nanostructures, as well as the ever improving
instrumentation leaving less margin for ambiguity, small-angle scattering
methodologies have been evolving at a high pace over the last few decades.
  As the quality of any results can only be as good as the data that goes into
these methodologies, the improvements in data collection and all imaginable
data correction steps are reviewed here. This work is intended to provide a
comprehensive overview of all data corrections, to aid the small-angle
scatterer to decide which are relevant for their measurement and how these
corrections are performed. Clear mathematical descriptions of the corrections
are provided where feasible. Furthermore, as no quality data exists without a
decent estimate of its precision, the error estimation and propagation through
all these steps is provided alongside the corrections. With these data
corrections, the collected small-angle scattering pattern can be made of the
highest standard allowing for authoritative nanostructural characterisation
through its analysis. A brief background of small-angle scattering, the
instrumentation developments over the years, and pitfalls that may be
encountered upon data interpretations are provided as well.
"		""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	Condensed Matter//Materials Science//cond-mat.mtrl-sci//Physics//Data Analysis//Statistics and Probability//physics.data-an//Physics//Instrumentation and Detectors//physics.ins-det//Condensed Matter//Materials Science//cond-mat.mtrl-sci//Physics//Data Analysis//Statistics and Probability//physics.data-an//Physics//Instrumentation and Detectors//physics.ins-det//Condensed Matter//Materials Science//cond-mat.mtrl-sci//Physics//Data Analysis//Statistics and Probability//physics.data-an//Physics//Instrumentation and Detectors//physics.ins-det//Condensed Matter//Materials Science//cond-mat.mtrl-sci//Physics//Data Analysis//Statistics and Probability//physics.data-an//Physics//Instrumentation and Detectors//physics.ins-det	""	""	""	""
105466	Orcid Ninja Tokyo 2014					Tanabe, Kosuke//TANIFUJI Mikiko	""	""					2015-12-15 21:32:10 +0900	2021-10-05 16:41:19 +0900	online_resource	text	unknown	unknown	""	""																					https://hdl.handle.net/20.500.11932/1758201	Guest			""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	ORCID//Samurai//Ninja//ORCID//Samurai//Ninja//ORCID//Samurai//Ninja//ORCID//Samurai//Ninja	""	""	""	""
105465	"Everything SAXS: Small-angle scattering pattern collection and
  correction"					""	""	""					2015-12-15 21:32:09 +0900	2021-10-05 16:53:28 +0900	online_resource	text	unknown	unknown	""	""																					https://hdl.handle.net/20.500.11932/1758193	Guest	"  For obtaining reliable nanostructural details of large amounts of sample ---
and if it is applicable --- Small-Angle Scattering (SAS) is a prime technique
to use. It promises to obtain bulk-scale, statistically sound information on
the morphological details of the nanostructure, and has thus led to many a
researcher investing their time in it over the last eight decades of
development. Due to pressure both from scientists requesting more details on
increasingly complex nanostructures, as well as the ever improving
instrumentation leaving less margin for ambiguity, small-angle scattering
methodologies have been evolving at a high pace over the last few decades.
  As the quality of any results can only be as good as the data that goes into
these methodologies, the improvements in data collection and all imaginable
data correction steps are reviewed here. This work is intended to provide a
comprehensive overview of all data corrections, to aid the small-angle
scatterer to decide which are relevant for their measurement and how these
corrections are performed. Clear mathematical descriptions of the corrections
are provided where feasible. Furthermore, as no quality data exists without a
decent estimate of its precision, the error estimation and propagation through
all these steps is provided alongside the corrections. With these data
corrections, the collected small-angle scattering pattern can be made of the
highest standard allowing for authoritative nanostructural characterisation
through its analysis. A brief background of small-angle scattering, the
instrumentation developments over the years, and pitfalls that may be
encountered upon data interpretations are provided as well.
"		""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	Condensed Matter//Materials Science//cond-mat.mtrl-sci//Physics//Data Analysis//Statistics and Probability//physics.data-an//Physics//Instrumentation and Detectors//physics.ins-det//Condensed Matter//Materials Science//cond-mat.mtrl-sci//Physics//Data Analysis//Statistics and Probability//physics.data-an//Physics//Instrumentation and Detectors//physics.ins-det//Condensed Matter//Materials Science//cond-mat.mtrl-sci//Physics//Data Analysis//Statistics and Probability//physics.data-an//Physics//Instrumentation and Detectors//physics.ins-det//Condensed Matter//Materials Science//cond-mat.mtrl-sci//Physics//Data Analysis//Statistics and Probability//physics.data-an//Physics//Instrumentation and Detectors//physics.ins-det	""	""	""	""