manifestation_id	original_title	title_alternative	title_transcription	statement_of_responsibility	serial	manifestation_identifier	creator	contributor	publisher	date_of_publication	year_of_publication	publication_place	manifestation_created_at	manifestation_updated_at	carrier_type	content_type	frequency	language	isbn	issn	ncid	volume_number	volume_number_string	edition	edition_string	issue_number	issue_number_string	serial_number	extent	start_page	end_page	dimensions	height	width	depth	manifestation_price	access_address	manifestation_required_role	abstract	description	identifier:unknown	identifier:nbn	identifier:isbn10	identifier:iss_itemno	identifier:online_isbn	identifier:print_isbn	identifier:print_issn	identifier:online_issn	identifier:escidoc	identifier:nims	series_statement_id	series_statement_original_title	series_statement_title_subseries	series_statement_title_subseries_transcription	series_statement_title_transcription	series_statement_creator	series_statement_volume_number	series_statement_series_master	series_statement_root_manifestation_id	series_statement_manifestation_id	series_statement_position	series_statement_note	series_statement_created_at	series_statement_updated_at	subject:ndlsh	subject:unknown	subject:bsh	classification:ndc8	classification:ndc9	classification:udc	doi	jpno	ncid	lccn	iss_itemno	item_id	item_identifier	binding_item_identifier	call_number	library	shelf	item_note	accepted_at	acquired_at	item_created_at	item_updated_at
42080	Scanning Electron Microscopy/ 1976/ 1 : Proceedings of the Part 1 9th Annual Scanning Electron Microscope Symposium / Part 2 Physical Applications of the Scanning Transmission Electron Miroscope / Part 3 Techniques for ParticulateMatter Studies in the Scanning Electron Microscope / Part 4 Microelectronic Device Fabrication and Quality Control with the Scanning Electron Microscope April 5-9, 1976		  			25830	edited by Om Johari	edited by Om Johari	IIT Research Institute	1976-01-01 00:00:00 +0900	1976		1901-01-01 09:00:00 +0900	2012-06-12 15:52:38 +0900	volume	text	unknown	English	9780915802098	05865581									782p; 29cm	1	782		29.0					Guest			""	""	""	""	""	""	""	""	""	""	22296	Scanning electron microscopy	""	""	""	""	""	""	""	42080	1886	""	2012-02-02 10:20:33 +0900	2023-06-26 17:35:48 +0900	""	""	""	""	""	621.385.833						43684	205652		621.385.|Ｊ|5851	sengen	S00110404			1977-02-10 00:00:00 +0900	2010-12-15 23:52:10 +0900	2010-12-15 23:52:10 +0900
42081	Scanning Electron Microscopy/ 1977/ 1 : Proceedings of the 10th Annual Scanning Electron Microscope Symposium and Workshop on Materials and Component Characterization / Quality Control with the SEM/STEM SEM Applications to Semiconductors Analytical Electron Microscopy Biological Specimen Preparation for Sem March 28-April 1, 1977		  			25832	edited by Om Johari	edited by Om Johari	IIT Research Institute				1901-01-01 09:00:00 +0900	2010-12-27 05:19:18 +0900	volume	text	unknown	English	9780915802111	""									784p; 28cm	1	784		28.0					Guest			""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	621.385.833						43685	205654		621.385.|J|6184	sengen	S00110404			1978-05-29 00:00:00 +0900	2010-12-15 23:52:11 +0900	2010-12-15 23:52:11 +0900
42083	Scanning Electron Microscopy/ 1968 : Proceedings of the Symposium on The Scanning Electron Microscope -- The Instrument and Its Applications April 30-May1, 1968 Chicago, Illinois		  			25829	edited by Om Johari	edited by Om Johari	IIT Research Institute	1968-01-01 00:00:00 +0900			1901-01-01 09:00:00 +0900	2011-04-03 02:47:20 +0900	volume	text	unknown	English	""	""									185p; 28cm	1	185		28.0					Guest			""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	""	621.385.833						43687	205651		621.385.|J|3865	sengen	S00110404			1970-05-25 00:00:00 +0900	2010-12-15 23:52:11 +0900	2010-12-15 23:52:11 +0900